KR102359802B1 - 노광 장치 및 물품의 제조 방법 - Google Patents
노광 장치 및 물품의 제조 방법 Download PDFInfo
- Publication number
- KR102359802B1 KR102359802B1 KR1020180069506A KR20180069506A KR102359802B1 KR 102359802 B1 KR102359802 B1 KR 102359802B1 KR 1020180069506 A KR1020180069506 A KR 1020180069506A KR 20180069506 A KR20180069506 A KR 20180069506A KR 102359802 B1 KR102359802 B1 KR 102359802B1
- Authority
- KR
- South Korea
- Prior art keywords
- shutter member
- light
- exposure
- substrate
- intensity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 11
- 239000000758 substrate Substances 0.000 claims abstract description 86
- 238000001514 detection method Methods 0.000 claims abstract description 46
- 230000000903 blocking effect Effects 0.000 claims abstract description 43
- 230000008859 change Effects 0.000 claims description 43
- 238000000034 method Methods 0.000 claims description 43
- 238000012545 processing Methods 0.000 claims description 7
- 230000001133 acceleration Effects 0.000 claims description 5
- 238000003754 machining Methods 0.000 claims 1
- 230000008569 process Effects 0.000 description 26
- 230000003287 optical effect Effects 0.000 description 9
- 238000010586 diagram Methods 0.000 description 6
- 239000011347 resin Substances 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- 230000003111 delayed effect Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000008901 benefit Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70758—Drive means, e.g. actuators, motors for long- or short-stroke modules or fine or coarse driving
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2017-119884 | 2017-06-19 | ||
JP2017119884A JP6929142B2 (ja) | 2017-06-19 | 2017-06-19 | 露光装置、および物品の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20180138167A KR20180138167A (ko) | 2018-12-28 |
KR102359802B1 true KR102359802B1 (ko) | 2022-02-09 |
Family
ID=65006119
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020180069506A Active KR102359802B1 (ko) | 2017-06-19 | 2018-06-18 | 노광 장치 및 물품의 제조 방법 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP6929142B2 (enrdf_load_stackoverflow) |
KR (1) | KR102359802B1 (enrdf_load_stackoverflow) |
TW (1) | TWI694313B (enrdf_load_stackoverflow) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7241564B2 (ja) * | 2019-02-22 | 2023-03-17 | キヤノン株式会社 | 露光装置、および物品の製造方法 |
JP7286365B2 (ja) * | 2019-03-25 | 2023-06-05 | キヤノン株式会社 | シャッタ装置、露光装置および物品製造方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5952246A (ja) * | 1982-09-20 | 1984-03-26 | Nippon Kogaku Kk <Nikon> | 露光制御装置 |
JPS60144745A (ja) * | 1984-01-05 | 1985-07-31 | Nippon Kogaku Kk <Nikon> | 露光装置 |
JPH04229843A (ja) * | 1990-12-27 | 1992-08-19 | Canon Inc | 露光装置用シャッタ |
JPH04361522A (ja) * | 1991-06-10 | 1992-12-15 | Hitachi Ltd | シャッタ制御装置 |
JPH0555106A (ja) * | 1991-08-28 | 1993-03-05 | Canon Inc | 露光量制御装置 |
JPH06120103A (ja) * | 1992-10-07 | 1994-04-28 | Canon Inc | 露光装置 |
JP4346320B2 (ja) * | 2003-02-05 | 2009-10-21 | 大日本印刷株式会社 | 露光方法及び露光装置 |
JP5025250B2 (ja) * | 2006-12-15 | 2012-09-12 | キヤノン株式会社 | 露光装置及びデバイス製造方法 |
JP6415057B2 (ja) * | 2014-02-07 | 2018-10-31 | キヤノン株式会社 | 露光装置、および物品の製造方法 |
JP6861463B2 (ja) * | 2015-06-16 | 2021-04-21 | キヤノン株式会社 | 露光装置及び物品の製造方法 |
-
2017
- 2017-06-19 JP JP2017119884A patent/JP6929142B2/ja active Active
-
2018
- 2018-06-04 TW TW107119099A patent/TWI694313B/zh active
- 2018-06-18 KR KR1020180069506A patent/KR102359802B1/ko active Active
Also Published As
Publication number | Publication date |
---|---|
TWI694313B (zh) | 2020-05-21 |
JP2019003145A (ja) | 2019-01-10 |
TW201905601A (zh) | 2019-02-01 |
JP6929142B2 (ja) | 2021-09-01 |
KR20180138167A (ko) | 2018-12-28 |
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