KR102333514B1 - 레이저 광선의 검사 방법 - Google Patents
레이저 광선의 검사 방법 Download PDFInfo
- Publication number
- KR102333514B1 KR102333514B1 KR1020160000517A KR20160000517A KR102333514B1 KR 102333514 B1 KR102333514 B1 KR 102333514B1 KR 1020160000517 A KR1020160000517 A KR 1020160000517A KR 20160000517 A KR20160000517 A KR 20160000517A KR 102333514 B1 KR102333514 B1 KR 102333514B1
- Authority
- KR
- South Korea
- Prior art keywords
- inspection
- laser beam
- shaped object
- plate
- film
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 17
- 238000012360 testing method Methods 0.000 title description 2
- 238000007689 inspection Methods 0.000 claims abstract description 129
- 230000004927 fusion Effects 0.000 claims abstract description 27
- 230000001678 irradiating effect Effects 0.000 claims abstract description 9
- 230000003287 optical effect Effects 0.000 claims description 12
- 239000000155 melt Substances 0.000 abstract description 5
- 238000002844 melting Methods 0.000 abstract description 5
- 230000008018 melting Effects 0.000 abstract description 5
- 239000010410 layer Substances 0.000 description 27
- 238000003672 processing method Methods 0.000 description 4
- 230000001681 protective effect Effects 0.000 description 4
- 239000010936 titanium Substances 0.000 description 4
- 229910052719 titanium Inorganic materials 0.000 description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 1
- 238000002407 reforming Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 150000003608 titanium Chemical class 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/50—Working by transmitting the laser beam through or within the workpiece
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/0014—Monitoring arrangements not otherwise provided for
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Chemical & Material Sciences (AREA)
- Laser Beam Processing (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2015-007521 | 2015-01-19 | ||
JP2015007521A JP6370227B2 (ja) | 2015-01-19 | 2015-01-19 | レーザー光線の検査方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20160089277A KR20160089277A (ko) | 2016-07-27 |
KR102333514B1 true KR102333514B1 (ko) | 2021-12-01 |
Family
ID=56437920
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020160000517A KR102333514B1 (ko) | 2015-01-19 | 2016-01-04 | 레이저 광선의 검사 방법 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP6370227B2 (zh) |
KR (1) | KR102333514B1 (zh) |
CN (1) | CN105798453B (zh) |
TW (1) | TWI670479B (zh) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101716369B1 (ko) * | 2015-10-19 | 2017-03-27 | 주식회사 이오테크닉스 | 레이저 가공 장비의 자동 검사 장치 및 방법 |
JP7488684B2 (ja) * | 2020-04-08 | 2024-05-22 | 浜松ホトニクス株式会社 | レーザ加工装置及びレーザ加工方法 |
JP7465425B2 (ja) | 2020-07-14 | 2024-04-11 | 株式会社東京精密 | 検査用ウェーハの検査方法及び検査装置並びに検査用ウェーハ |
KR102535231B1 (ko) * | 2021-05-12 | 2023-05-26 | 한국전기안전공사 | 용융흔의 경계선 선정 및 선명도 결정 방법과 그 시스템 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001133324A (ja) | 1999-11-08 | 2001-05-18 | Ibiden Co Ltd | レーザ加工のテストクーポンおよびテスト方法 |
JP2002192370A (ja) | 2000-09-13 | 2002-07-10 | Hamamatsu Photonics Kk | レーザ加工方法 |
CN202734962U (zh) | 2012-05-30 | 2013-02-13 | 上海奥通激光技术有限公司 | 一种激光光斑检测试纸及其检测套件 |
JP2014104484A (ja) | 2012-11-27 | 2014-06-09 | Disco Abrasive Syst Ltd | レーザー加工装置 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63100336A (ja) * | 1986-10-17 | 1988-05-02 | Sony Corp | レ−ザ光の特性測定基体及びこれを使用したレ−ザ光の特性測定方法 |
WO2009150733A1 (ja) * | 2008-06-12 | 2009-12-17 | 株式会社Ihi | レーザアニール方法及びレーザアニール装置 |
TW201029781A (en) * | 2008-12-18 | 2010-08-16 | Hitachi High Tech Corp | Laser working state examination method and apparatus, and solar panel fabricating method |
JP5902529B2 (ja) * | 2012-03-28 | 2016-04-13 | 株式会社ディスコ | レーザ加工方法 |
CN102658431B (zh) * | 2012-05-18 | 2014-09-03 | 中国科学院光电技术研究所 | 一种自动诊断并校正激光光束发散角及光束质量的装置 |
JP2014190870A (ja) * | 2013-03-27 | 2014-10-06 | Tokyo Seimitsu Co Ltd | 被加工材内部の収差測定方法及びレーザ加工方法 |
JP5849985B2 (ja) * | 2013-04-15 | 2016-02-03 | トヨタ自動車株式会社 | 溶接部の検査装置とその検査方法 |
-
2015
- 2015-01-19 JP JP2015007521A patent/JP6370227B2/ja active Active
- 2015-12-10 TW TW104141530A patent/TWI670479B/zh active
-
2016
- 2016-01-04 KR KR1020160000517A patent/KR102333514B1/ko active IP Right Grant
- 2016-01-13 CN CN201610020628.7A patent/CN105798453B/zh active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001133324A (ja) | 1999-11-08 | 2001-05-18 | Ibiden Co Ltd | レーザ加工のテストクーポンおよびテスト方法 |
JP2002192370A (ja) | 2000-09-13 | 2002-07-10 | Hamamatsu Photonics Kk | レーザ加工方法 |
CN202734962U (zh) | 2012-05-30 | 2013-02-13 | 上海奥通激光技术有限公司 | 一种激光光斑检测试纸及其检测套件 |
JP2014104484A (ja) | 2012-11-27 | 2014-06-09 | Disco Abrasive Syst Ltd | レーザー加工装置 |
Also Published As
Publication number | Publication date |
---|---|
KR20160089277A (ko) | 2016-07-27 |
TW201636588A (zh) | 2016-10-16 |
TWI670479B (zh) | 2019-09-01 |
JP2016133370A (ja) | 2016-07-25 |
CN105798453B (zh) | 2019-04-19 |
JP6370227B2 (ja) | 2018-08-08 |
CN105798453A (zh) | 2016-07-27 |
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