KR102260905B1 - 자기장을 결정하는 장치 및 방법 - Google Patents

자기장을 결정하는 장치 및 방법 Download PDF

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KR102260905B1
KR102260905B1 KR1020167029092A KR20167029092A KR102260905B1 KR 102260905 B1 KR102260905 B1 KR 102260905B1 KR 1020167029092 A KR1020167029092 A KR 1020167029092A KR 20167029092 A KR20167029092 A KR 20167029092A KR 102260905 B1 KR102260905 B1 KR 102260905B1
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magnetic field
region
determining
distribution data
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KR20160142318A (ko
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코엔 베르바에케
리벤 필립스
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마흐캄 엔브이
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/10—Plotting field distribution ; Measuring field distribution
    • G—PHYSICS
    • G16—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS
    • G16Z—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS, NOT OTHERWISE PROVIDED FOR
    • G16Z99/00—Subject matter not provided for in other main groups of this subclass

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Magnetic Variables (AREA)
KR1020167029092A 2014-04-09 2015-04-02 자기장을 결정하는 장치 및 방법 Active KR102260905B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP14164069.8A EP2930649B1 (en) 2014-04-09 2014-04-09 Devices and methods for determining a magnetic field
EP14164069.8 2014-04-09
PCT/EP2015/057299 WO2015155111A1 (en) 2014-04-09 2015-04-02 Devices and methods for determining a magnetic field

Publications (2)

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KR20160142318A KR20160142318A (ko) 2016-12-12
KR102260905B1 true KR102260905B1 (ko) 2021-06-07

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US (1) US10241159B2 (https=)
EP (1) EP2930649B1 (https=)
JP (1) JP6612772B2 (https=)
KR (1) KR102260905B1 (https=)
CN (1) CN106233300B (https=)
BR (1) BR112016022975B1 (https=)
ES (1) ES2597779T3 (https=)
PL (1) PL2930649T3 (https=)
WO (1) WO2015155111A1 (https=)

Families Citing this family (6)

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Publication number Priority date Publication date Assignee Title
EP3336566B1 (en) * 2016-12-16 2020-08-05 Melexis Technologies SA Magnetic sensor
US10969435B2 (en) 2018-02-12 2021-04-06 Brandon & Clark, Inc. System and method for induction motor rotor bar surface magnetic field analysis
JP7209176B2 (ja) * 2018-10-26 2023-01-20 スミダコーポレーション株式会社 磁場発生源検出装置および磁場発生源検出方法
US20200408633A1 (en) * 2019-06-25 2020-12-31 Machinesense, Llc Systems and methods for measuring structural element deflections
CN112730994B (zh) * 2020-12-22 2022-10-04 国网天津市电力公司电力科学研究院 基于matlab获取高压交流线路电场的方法及系统
CN115795231B (zh) * 2022-10-09 2023-08-04 中南大学 一种空间波数混合域三维强磁场迭代方法及系统

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004521520A (ja) 2001-08-24 2004-07-15 ベルリン ハート アクチェンゲゼルシャフト 硬磁性物体、および磁気ベクトルの方向と位置を調節する方法
US20070046287A1 (en) 2005-05-03 2007-03-01 Koen Vervaeke Method and apparatus for detecting spatially varying and time-dependent magnetic fields
JP2012185155A (ja) * 2011-02-14 2012-09-27 Magcam Nv 磁性システムを特徴付けるための装置および方法

Family Cites Families (8)

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Publication number Priority date Publication date Assignee Title
US20040189123A1 (en) * 2001-08-24 2004-09-30 Peter Nusser Magnetically hard object and method for adjusting the direction and position of a magnetic vector
JP2004320885A (ja) * 2003-04-16 2004-11-11 Hitachi Ltd 回転機の磁界解析方法及びプログラム
JP2008165874A (ja) * 2006-12-27 2008-07-17 Funai Electric Co Ltd 磁界分布測定装置、温度分布測定装置、磁界分布測定方法及び温度分布測定方法
JP5626678B2 (ja) * 2010-11-24 2014-11-19 国立大学法人神戸大学 磁場分布取得装置
EP2720059B1 (en) * 2012-10-15 2015-03-11 MagCam NV Devices and methods for determining a magnetic field distribution of a magnet along a main surface of said magnet.
CN103473589B (zh) * 2013-09-10 2016-09-14 江苏多维科技有限公司 一种磁条形码芯片及其读取方法
CN103472416B (zh) * 2013-09-22 2015-07-08 中国工程物理研究院总体工程研究所 一种便携式空间磁分布测量系统
ES2597780T3 (es) * 2014-04-09 2017-01-23 Magcam Nv Dispositivos y métodos para determinar un campo magnético

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004521520A (ja) 2001-08-24 2004-07-15 ベルリン ハート アクチェンゲゼルシャフト 硬磁性物体、および磁気ベクトルの方向と位置を調節する方法
US20070046287A1 (en) 2005-05-03 2007-03-01 Koen Vervaeke Method and apparatus for detecting spatially varying and time-dependent magnetic fields
JP2012185155A (ja) * 2011-02-14 2012-09-27 Magcam Nv 磁性システムを特徴付けるための装置および方法

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
Eduardo A. Lima 외 4인, 'Fast inversion of magnetic field maps of unidirectional planar geological magnetization', Journal of Geophysical Research: Solid Earth, Vol.118, pp.2723-2752, 2013*
Jiseong Hwang 외 2인, 'The application of a differential-type Hall sensors array to the nondestructive testing of express train wheels', NDT&E International, Vol.42, pp.34-41, 2009*

Also Published As

Publication number Publication date
WO2015155111A1 (en) 2015-10-15
KR20160142318A (ko) 2016-12-12
ES2597779T3 (es) 2017-01-23
US10241159B2 (en) 2019-03-26
BR112016022975A2 (https=) 2017-08-15
EP2930649A1 (en) 2015-10-14
PL2930649T3 (pl) 2017-01-31
BR112016022975B1 (pt) 2022-08-02
EP2930649B1 (en) 2016-07-13
JP6612772B2 (ja) 2019-11-27
US20170123019A1 (en) 2017-05-04
CN106233300A (zh) 2016-12-14
CN106233300B (zh) 2019-01-04
JP2017513008A (ja) 2017-05-25

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