KR102040329B1 - 기억 소자 및 그 제조 방법 및 기억 장치 - Google Patents

기억 소자 및 그 제조 방법 및 기억 장치 Download PDF

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KR102040329B1
KR102040329B1 KR1020120063035A KR20120063035A KR102040329B1 KR 102040329 B1 KR102040329 B1 KR 102040329B1 KR 1020120063035 A KR1020120063035 A KR 1020120063035A KR 20120063035 A KR20120063035 A KR 20120063035A KR 102040329 B1 KR102040329 B1 KR 102040329B1
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South Korea
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layer
ion source
source layer
memory
electrode
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KR1020120063035A
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English (en)
Korean (ko)
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KR20130007427A (ko
Inventor
마사유키 시무타
슈이치로 야스다
테츠야 미즈구치
카즈히로 오바
카츠히사 아라타니
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소니 주식회사
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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/20—Multistable switching devices, e.g. memristors
    • H10N70/24—Multistable switching devices, e.g. memristors based on migration or redistribution of ionic species, e.g. anions, vacancies
    • H10N70/245—Multistable switching devices, e.g. memristors based on migration or redistribution of ionic species, e.g. anions, vacancies the species being metal cations, e.g. programmable metallization cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0007—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements comprising metal oxide memory material, e.g. perovskites
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0009—RRAM elements whose operation depends upon chemical change
    • G11C13/0011—RRAM elements whose operation depends upon chemical change comprising conductive bridging RAM [CBRAM] or programming metallization cells [PMCs]
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B63/00—Resistance change memory devices, e.g. resistive RAM [ReRAM] devices
    • H10B63/30—Resistance change memory devices, e.g. resistive RAM [ReRAM] devices comprising selection components having three or more electrodes, e.g. transistors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B63/00—Resistance change memory devices, e.g. resistive RAM [ReRAM] devices
    • H10B63/80—Arrangements comprising multiple bistable or multi-stable switching components of the same type on a plane parallel to the substrate, e.g. cross-point arrays
    • H10B63/82—Arrangements comprising multiple bistable or multi-stable switching components of the same type on a plane parallel to the substrate, e.g. cross-point arrays the switching components having a common active material layer
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/20—Multistable switching devices, e.g. memristors
    • H10N70/231—Multistable switching devices, e.g. memristors based on solid-state phase change, e.g. between amorphous and crystalline phases, Ovshinsky effect
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/801—Constructional details of multistable switching devices
    • H10N70/821—Device geometry
    • H10N70/826—Device geometry adapted for essentially vertical current flow, e.g. sandwich or pillar type devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/801—Constructional details of multistable switching devices
    • H10N70/841—Electrodes
    • H10N70/8416—Electrodes adapted for supplying ionic species
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/801—Constructional details of multistable switching devices
    • H10N70/881—Switching materials
    • H10N70/882—Compounds of sulfur, selenium or tellurium, e.g. chalcogenides
    • H10N70/8828—Tellurides, e.g. GeSbTe
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/801—Constructional details of multistable switching devices
    • H10N70/881—Switching materials
    • H10N70/883—Oxides or nitrides
    • H10N70/8833—Binary metal oxides, e.g. TaOx
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2213/00—Indexing scheme relating to G11C13/00 for features not covered by this group
    • G11C2213/50—Resistive cell structure aspects
    • G11C2213/55—Structure including two electrodes, a memory active layer and at least two other layers which can be a passive or source or reservoir layer or a less doped memory active layer

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Semiconductor Memories (AREA)
KR1020120063035A 2011-06-30 2012-06-13 기억 소자 및 그 제조 방법 및 기억 장치 Expired - Fee Related KR102040329B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2011-146113 2011-06-30
JP2011146113A JP5708930B2 (ja) 2011-06-30 2011-06-30 記憶素子およびその製造方法ならびに記憶装置

Publications (2)

Publication Number Publication Date
KR20130007427A KR20130007427A (ko) 2013-01-18
KR102040329B1 true KR102040329B1 (ko) 2019-11-27

Family

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KR1020120063035A Expired - Fee Related KR102040329B1 (ko) 2011-06-30 2012-06-13 기억 소자 및 그 제조 방법 및 기억 장치

Country Status (6)

Country Link
US (1) US9058873B2 (enExample)
EP (1) EP2541555A3 (enExample)
JP (1) JP5708930B2 (enExample)
KR (1) KR102040329B1 (enExample)
CN (1) CN102855929B (enExample)
TW (1) TWI542054B (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2993388B1 (fr) * 2012-07-11 2015-04-03 Altis Semiconductor Snc Dispositif microelectronique a memoire programmable
US8921821B2 (en) * 2013-01-10 2014-12-30 Micron Technology, Inc. Memory cells
US20140264224A1 (en) * 2013-03-14 2014-09-18 Intermolecular, Inc. Performance Enhancement of Forming-Free ReRAM Devices Using 3D Nanoparticles
JP2014216553A (ja) * 2013-04-26 2014-11-17 株式会社東芝 抵抗変化型記憶装置
US8981334B1 (en) * 2013-11-01 2015-03-17 Micron Technology, Inc. Memory cells having regions containing one or both of carbon and boron
US9431606B1 (en) * 2015-08-12 2016-08-30 Micron Technology, Inc. Memory cells
US10381075B2 (en) * 2017-12-14 2019-08-13 Micron Technology, Inc. Techniques to access a self-selecting memory device
JP2019129239A (ja) * 2018-01-25 2019-08-01 ソニーセミコンダクタソリューションズ株式会社 記憶素子および記憶装置
US10825867B2 (en) 2018-04-24 2020-11-03 Micron Technology, Inc. Cross-point memory array and related fabrication techniques
US10729012B2 (en) * 2018-04-24 2020-07-28 Micron Technology, Inc. Buried lines and related fabrication techniques
CN116963582A (zh) 2018-10-29 2023-10-27 联华电子股份有限公司 半导体元件及其制作方法
US11594678B2 (en) 2020-03-03 2023-02-28 Taiwan Semiconductor Manufacturing Company, Ltd. Diffusion barrier layer in programmable metallization cell

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007189087A (ja) * 2006-01-13 2007-07-26 Sony Corp 記憶素子及びその製造方法、記憶装置
JP2009049322A (ja) * 2007-08-22 2009-03-05 Sony Corp 記憶素子および記憶装置
US20100259967A1 (en) 2007-11-29 2010-10-14 Sony Corporation Memory cell
US20110194329A1 (en) 2010-02-09 2011-08-11 Sony Corporation Memory component, memory device, and method of operating memory device
US20110278530A1 (en) 2004-08-12 2011-11-17 Campbell Kristy A Memory device incorporating a resistance variable chalcogenide element

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR970010685B1 (ko) * 1993-10-30 1997-06-30 삼성전자 주식회사 누설전류가 감소된 박막 트랜지스터 및 그 제조방법
US6813178B2 (en) * 2003-03-12 2004-11-02 Micron Technology, Inc. Chalcogenide glass constant current device, and its method of fabrication and operation
US7061004B2 (en) * 2003-07-21 2006-06-13 Micron Technology, Inc. Resistance variable memory elements and methods of formation
DE102004052645A1 (de) * 2004-10-29 2006-05-04 Infineon Technologies Ag Speicherzelle und Verfahren zu deren Herstellung
JP4577086B2 (ja) 2005-05-18 2010-11-10 横浜ゴム株式会社 難燃性床材
US20070252127A1 (en) * 2006-03-30 2007-11-01 Arnold John C Phase change memory element with a peripheral connection to a thin film electrode and method of manufacture thereof
JP2008135659A (ja) 2006-11-29 2008-06-12 Sony Corp 記憶素子、記憶装置
JP5103932B2 (ja) * 2007-02-16 2012-12-19 ソニー株式会社 記憶素子及び記憶装置
JP5088036B2 (ja) * 2007-08-06 2012-12-05 ソニー株式会社 記憶素子および記憶装置
JP2009043873A (ja) 2007-08-08 2009-02-26 Sony Corp 記憶素子および記憶装置
JP4466738B2 (ja) * 2008-01-09 2010-05-26 ソニー株式会社 記憶素子および記憶装置
JP5397668B2 (ja) * 2008-09-02 2014-01-22 ソニー株式会社 記憶素子および記憶装置
JP2011124511A (ja) * 2009-12-14 2011-06-23 Sony Corp 記憶素子および記憶装置
JP5426409B2 (ja) 2010-01-18 2014-02-26 富士電機株式会社 垂直磁気記録媒体の製造方法
JP2012028468A (ja) * 2010-07-21 2012-02-09 Toshiba Corp 半導体記憶装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110278530A1 (en) 2004-08-12 2011-11-17 Campbell Kristy A Memory device incorporating a resistance variable chalcogenide element
JP2007189087A (ja) * 2006-01-13 2007-07-26 Sony Corp 記憶素子及びその製造方法、記憶装置
JP2009049322A (ja) * 2007-08-22 2009-03-05 Sony Corp 記憶素子および記憶装置
US20100259967A1 (en) 2007-11-29 2010-10-14 Sony Corporation Memory cell
US20110194329A1 (en) 2010-02-09 2011-08-11 Sony Corporation Memory component, memory device, and method of operating memory device

Also Published As

Publication number Publication date
CN102855929B (zh) 2017-03-01
US20130001496A1 (en) 2013-01-03
US9058873B2 (en) 2015-06-16
JP2013016529A (ja) 2013-01-24
TW201301592A (zh) 2013-01-01
TWI542054B (zh) 2016-07-11
CN102855929A (zh) 2013-01-02
EP2541555A2 (en) 2013-01-02
KR20130007427A (ko) 2013-01-18
EP2541555A3 (en) 2013-05-08
JP5708930B2 (ja) 2015-04-30

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