KR101993047B1 - 기판 세정 장치, 기판 처리 장치 및 기판 세정 방법 - Google Patents

기판 세정 장치, 기판 처리 장치 및 기판 세정 방법 Download PDF

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Publication number
KR101993047B1
KR101993047B1 KR1020170115952A KR20170115952A KR101993047B1 KR 101993047 B1 KR101993047 B1 KR 101993047B1 KR 1020170115952 A KR1020170115952 A KR 1020170115952A KR 20170115952 A KR20170115952 A KR 20170115952A KR 101993047 B1 KR101993047 B1 KR 101993047B1
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South Korea
Prior art keywords
substrate
cleaning
cleaning tool
center
moving
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KR1020170115952A
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English (en)
Korean (ko)
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KR20180029913A (ko
Inventor
히로미 무라치
류이치 요시다
고지 니시야마
도루 몸마
지카라 사가에
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가부시키가이샤 스크린 홀딩스
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Publication of KR20180029913A publication Critical patent/KR20180029913A/ko
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    • H01L21/67046—
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B29/00—Machines or devices for polishing surfaces on work by means of tools made of soft or flexible material with or without the application of solid or liquid polishing agents
    • B24B29/02—Machines or devices for polishing surfaces on work by means of tools made of soft or flexible material with or without the application of solid or liquid polishing agents designed for particular workpieces
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04—Apparatus for manufacture or treatment
    • H10P72/0402—Apparatus for fluid treatment
    • H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H10P72/0412—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly scrubbing means, e.g. brushes
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B1/00—Cleaning by methods involving the use of tools
    • B08B1/10—Cleaning by methods involving the use of tools characterised by the type of cleaning tool
    • B08B1/12—Brushes
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B1/00—Cleaning by methods involving the use of tools
    • B08B1/20—Cleaning of moving articles, e.g. of moving webs or of objects on a conveyor
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B11/00—Cleaning flexible or delicate articles by methods or apparatus specially adapted thereto
    • B08B11/02—Devices for holding articles during cleaning
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/02—Cleaning by the force of jets or sprays
    • B08B3/022—Cleaning travelling work
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
    • B08B7/04—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by a combination of operations
    • H01L21/02096—
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P70/00—Cleaning of wafers, substrates or parts of devices
    • H10P70/20—Cleaning during device manufacture
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P70/00—Cleaning of wafers, substrates or parts of devices
    • H10P70/60—Cleaning only by mechanical processes

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
KR1020170115952A 2016-09-13 2017-09-11 기판 세정 장치, 기판 처리 장치 및 기판 세정 방법 Active KR101993047B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016178818A JP6740066B2 (ja) 2016-09-13 2016-09-13 基板洗浄装置、基板処理装置および基板洗浄方法
JPJP-P-2016-178818 2016-09-13

Publications (2)

Publication Number Publication Date
KR20180029913A KR20180029913A (ko) 2018-03-21
KR101993047B1 true KR101993047B1 (ko) 2019-09-30

Family

ID=61559572

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020170115952A Active KR101993047B1 (ko) 2016-09-13 2017-09-11 기판 세정 장치, 기판 처리 장치 및 기판 세정 방법

Country Status (5)

Country Link
US (1) US10668591B2 (https=)
JP (1) JP6740066B2 (https=)
KR (1) KR101993047B1 (https=)
CN (1) CN107818929B (https=)
TW (1) TWI653680B (https=)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10269555B2 (en) 2015-09-30 2019-04-23 Taiwan Semiconductor Manufacturing Company, Ltd. Post-CMP cleaning and apparatus
CN109623658B (zh) * 2018-12-26 2024-07-23 浙江杰奈尔新材料有限公司 一种研磨机用清洗装置
JP7446073B2 (ja) * 2019-09-27 2024-03-08 株式会社Ｓｃｒｅｅｎホールディングス 基板処理装置
CN110639878B (zh) * 2019-10-16 2021-05-28 郑美花 一种废弃锂电池石墨棒清洁方法
CN111261553B (zh) * 2020-01-19 2024-03-26 北京北方华创微电子装备有限公司 晶圆清洗装置
US11417512B2 (en) 2020-02-10 2022-08-16 Taiwan Semiconductor Manufacturing Co., Ltd. Method for cleaning semiconductor wafer backside surface by hybrid brush assembly
JP7635572B2 (ja) * 2021-02-22 2025-02-26 東京エレクトロン株式会社 基板洗浄方法及び基板洗浄装置
CN114639601B (zh) * 2022-02-17 2023-04-28 中环领先半导体材料有限公司 一种提升减薄机稼动率的新型工艺
JP7778616B2 (ja) * 2022-03-18 2025-12-02 株式会社Ｓｃｒｅｅｎホールディングス 基板処理方法および基板処理装置
CN115338718B (zh) * 2022-10-18 2023-03-24 杭州众硅电子科技有限公司 一种晶圆抛光系统
EP4404248A3 (en) * 2022-12-23 2024-08-21 SCREEN Holdings Co., Ltd. Substrate processing device and substrate processing method
JP7598919B2 (ja) * 2022-12-27 2024-12-12 株式会社Ｓｃｒｅｅｎホールディングス 基板処理装置および基板処理方法
JP7648664B2 (ja) * 2023-01-27 2025-03-18 株式会社Ｓｃｒｅｅｎホールディングス 基板処理方法及び基板処理装置
JP2024148301A (ja) * 2023-04-05 2024-10-18 株式会社Ｓｃｒｅｅｎホールディングス 基板処理装置及び基板処理方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100237761B1 (ko) * 1996-04-15 2000-01-15 이시다 아키라 기판세정장치 및 방법
JP2002361155A (ja) 2001-06-01 2002-12-17 Tokyo Electron Ltd 塗布処理装置及びその方法
JP2008016781A (ja) * 2006-07-10 2008-01-24 Dainippon Screen Mfg Co Ltd 基板処理方法および基板処理装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5518542A (en) * 1993-11-05 1996-05-21 Tokyo Electron Limited Double-sided substrate cleaning apparatus
JPH0936070A (ja) * 1995-07-21 1997-02-07 Nippon Steel Corp 半導体ウエハの研磨装置
JP3372760B2 (ja) * 1996-07-02 2003-02-04 大日本スクリーン製造株式会社 基板洗浄装置および基板洗浄方法
JP2005228961A (ja) 2004-02-13 2005-08-25 Dainippon Screen Mfg Co Ltd 基板洗浄装置
US8578953B2 (en) 2006-12-20 2013-11-12 Tokyo Electron Limited Substrate cleaning apparatus, substrate cleaning method, and computer-readable storage medium
JP4983565B2 (ja) * 2006-12-20 2012-07-25 東京エレクトロン株式会社 基板洗浄装置、基板洗浄方法及び記憶媒体
JP5039468B2 (ja) 2007-07-26 2012-10-03 株式会社Ｓｏｋｕｄｏ 基板洗浄装置およびそれを備えた基板処理装置
JP4939376B2 (ja) 2007-11-13 2012-05-23 株式会社Ｓｏｋｕｄｏ 基板処理装置
JP5173517B2 (ja) * 2008-03-26 2013-04-03 大日本スクリーン製造株式会社 基板処理装置および基板処理方法
JP6228508B2 (ja) 2014-05-01 2017-11-08 東京エレクトロン株式会社 洗浄装置、剥離システム、洗浄方法、プログラム及びコンピュータ記憶媒体
JP6503194B2 (ja) 2015-02-16 2019-04-17 株式会社Ｓｃｒｅｅｎホールディングス 基板処理装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100237761B1 (ko) * 1996-04-15 2000-01-15 이시다 아키라 기판세정장치 및 방법
JP2002361155A (ja) 2001-06-01 2002-12-17 Tokyo Electron Ltd 塗布処理装置及びその方法
JP2008016781A (ja) * 2006-07-10 2008-01-24 Dainippon Screen Mfg Co Ltd 基板処理方法および基板処理装置

Also Published As

Publication number Publication date
CN107818929A (zh) 2018-03-20
TW201816870A (zh) 2018-05-01
KR20180029913A (ko) 2018-03-21
TWI653680B (zh) 2019-03-11
CN107818929B (zh) 2021-07-09
JP6740066B2 (ja) 2020-08-12
JP2018046109A (ja) 2018-03-22
US20180071884A1 (en) 2018-03-15
US10668591B2 (en) 2020-06-02

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