KR101890439B1 - 주행 스트립 상의 코팅 층의 두께를 측정하기 위한 방법 및 장치 - Google Patents
주행 스트립 상의 코팅 층의 두께를 측정하기 위한 방법 및 장치 Download PDFInfo
- Publication number
- KR101890439B1 KR101890439B1 KR1020127033894A KR20127033894A KR101890439B1 KR 101890439 B1 KR101890439 B1 KR 101890439B1 KR 1020127033894 A KR1020127033894 A KR 1020127033894A KR 20127033894 A KR20127033894 A KR 20127033894A KR 101890439 B1 KR101890439 B1 KR 101890439B1
- Authority
- KR
- South Korea
- Prior art keywords
- strip
- thickness
- eddy current
- coating
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
- G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
- G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
- G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
- G01B7/107—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring objects while moving
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Coating With Molten Metal (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FRPCT/FR2010/051046 | 2010-05-31 | ||
| PCT/FR2010/051046 WO2011151530A1 (fr) | 2010-05-31 | 2010-05-31 | Procede et dispositif de mesure de l'epaisseur d'une couche de revetement sur une bande en defilement |
| PCT/FR2011/051232 WO2011151585A2 (fr) | 2010-05-31 | 2011-05-30 | Procédé et dispositif de mesure de l'épaisseur d'une couche de revêtement sur une bande en défilement. |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20140008997A KR20140008997A (ko) | 2014-01-22 |
| KR101890439B1 true KR101890439B1 (ko) | 2018-08-21 |
Family
ID=42983645
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020127033894A Active KR101890439B1 (ko) | 2010-05-31 | 2011-05-30 | 주행 스트립 상의 코팅 층의 두께를 측정하기 위한 방법 및 장치 |
Country Status (10)
| Country | Link |
|---|---|
| US (1) | US10203194B2 (enExample) |
| EP (1) | EP2577226B1 (enExample) |
| JP (2) | JP6212388B2 (enExample) |
| KR (1) | KR101890439B1 (enExample) |
| CN (1) | CN103080695B (enExample) |
| BR (1) | BR112012030475B1 (enExample) |
| ES (1) | ES2666211T3 (enExample) |
| HU (1) | HUE038881T2 (enExample) |
| PL (1) | PL2577226T3 (enExample) |
| WO (2) | WO2011151530A1 (enExample) |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9631919B2 (en) | 2013-06-12 | 2017-04-25 | Applied Materials, Inc. | Non-contact sheet resistance measurement of barrier and/or seed layers prior to electroplating |
| CN104677852A (zh) * | 2013-11-27 | 2015-06-03 | 上海宝钢工业技术服务有限公司 | 带钢氧化镁涂层质量在线检测系统 |
| CN104266619B (zh) * | 2014-09-12 | 2017-05-17 | 首钢总公司 | 一种测定热镀锌钢板表面锌渣位置及密度分布的方法 |
| CN104502446B (zh) * | 2014-11-27 | 2018-10-16 | 北京华清燃气轮机与煤气化联合循环工程技术有限公司 | 基于无损检测技术预测高温合金涂层服役状况的方法 |
| USD766930S1 (en) | 2014-12-31 | 2016-09-20 | Samsung Electronics Co., Ltd. | Display screen or portion thereof with animated graphical user interface |
| ITUB20153041A1 (it) * | 2015-08-10 | 2017-02-10 | Danieli Automation Spa | Dispositivo per la misura a caldo, durante la laminazione, di una dimensione di profili metallici |
| CN105506548B (zh) * | 2016-03-01 | 2018-05-25 | 京东方科技集团股份有限公司 | 一种掩膜板修复装置、修复方法及蒸镀系统 |
| US10641842B2 (en) | 2017-05-26 | 2020-05-05 | Allegro Microsystems, Llc | Targets for coil actuated position sensors |
| CN107504925A (zh) * | 2017-09-30 | 2017-12-22 | 江苏瑞腾涂装科技有限公司 | 一种管道内壁涂层厚度及其光滑度检测系统 |
| JPWO2019102578A1 (ja) * | 2017-11-24 | 2020-11-19 | Primetals Technologies Japan株式会社 | 金属板の形状計測装置、板反り矯正装置及び連続めっき処理設備並びに金属板の板反り矯正方法 |
| CN111565625B (zh) * | 2017-12-26 | 2024-03-26 | 罗伯特·博世有限公司 | 用于检测层的厚度的系统和方法 |
| CN108680127B (zh) * | 2018-05-21 | 2020-11-27 | 北京核夕菁科技有限公司 | 镀层测量方法和装置 |
| CN109084719A (zh) * | 2018-08-24 | 2018-12-25 | 南通亿能彩钢板有限公司 | 一种彩钢板涂层厚度在线检测系统及其使用方法 |
| DE102018122391A1 (de) * | 2018-09-13 | 2020-03-19 | Sikora Ag | Vorrichtung und Verfahren zum Detektieren eines Gegenstandes |
| CN109580722B (zh) * | 2018-12-25 | 2021-07-06 | 国网陕西省电力公司电力科学研究院 | 一种基于交流导纳法的接地网腐蚀监测方法和装置 |
| EP4022406B1 (en) * | 2019-08-29 | 2024-09-25 | ArcelorMittal | Edge build-up measurement |
| CN110823151B (zh) * | 2019-10-15 | 2021-05-28 | 武汉船用机械有限责任公司 | 水下拉绳传感器的测试工装 |
| CN111060020A (zh) * | 2019-12-19 | 2020-04-24 | 天津危伏智能装备有限公司 | 在线自动检测工件熔覆前尺寸和熔覆层厚度的激光熔覆设备及方法 |
| EP4298438A4 (en) * | 2021-02-24 | 2025-01-22 | BWXT Nuclear Operations Group, Inc. | DEVICE AND METHOD FOR MATERIAL INSPECTION |
| WO2026089037A1 (ja) * | 2024-10-24 | 2026-04-30 | 東レ株式会社 | 測定方法、測定システムおよびシートの製造方法 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004513509A (ja) * | 2000-09-20 | 2004-04-30 | ケーエルエー・テンコール・テクノロジーズ・コーポレーション | 半導体製造プロセスのための方法とシステム |
| JP2008304471A (ja) * | 2000-03-28 | 2008-12-18 | Toshiba Corp | 膜厚測定装置、膜厚測定方法および記録媒体 |
Family Cites Families (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| AU582340B2 (en) * | 1981-08-13 | 1989-03-23 | John Lysaght (Australia) Limited | Coating thickness gauge |
| US4641092A (en) | 1982-07-08 | 1987-02-03 | Sumitomo Metal Industries, Ltd. | Rotary probe apparatus for detecting flaws in a test object |
| JPS599552A (ja) * | 1982-07-08 | 1984-01-18 | Sumitomo Metal Ind Ltd | 電磁誘導試験装置 |
| NZ205098A (en) * | 1982-08-06 | 1997-01-29 | Australian Wire Ind Pty | Wire, conductive coating on magnetic substrate: thickness determination |
| FR2572175A1 (fr) * | 1984-10-24 | 1986-04-25 | Stein Heurtey | Procede et dispositif pour mesurer l'epaisseur de couches metalliques minces deposees sur un support conducteur |
| JPS61120961A (ja) * | 1984-11-19 | 1986-06-09 | Teijin Ltd | 導電性フイルムの検査装置 |
| CA2043347A1 (en) * | 1990-05-30 | 1991-12-01 | Yukio Kohmura | Method and system for inspection of electroconductive film using eddy current and process and system for production of optical fibres using method and system |
| DE4119903C5 (de) * | 1991-06-17 | 2005-06-30 | Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg | Verfahren und Vorrichtung zur Messung dünner Schichten |
| DE4128882C2 (de) * | 1991-08-30 | 1994-07-14 | Nix Steingroeve Elektro Physik | Rollsonde für die kontinuierliche Messung der Dicke von Schichten oder Bändern |
| DE69425023T2 (de) * | 1993-05-07 | 2001-02-22 | Nordson Corp., Westlake | Pulverbeschichtungssystem und Pulverbeschichtungsdicke-Sensor |
| JPH0732510U (ja) | 1993-11-16 | 1995-06-16 | 功 山邊 | 巻取式距離検出器 |
| FR2752294B1 (fr) * | 1996-08-12 | 1998-11-27 | Lorraine Laminage | Procede et dispositif de mesure en continu d'epaisseur de revetement isolant |
| AU1405199A (en) * | 1997-11-14 | 1999-06-07 | Jentek Sensors, Inc. | Multiple frequency quantitative coating characterization |
| JP2000227422A (ja) * | 1999-02-08 | 2000-08-15 | Nkk Corp | 渦流探傷法 |
| US6366083B1 (en) | 1999-09-17 | 2002-04-02 | Framatome Anp Inc. | Method for measuring the thickness of oxide layer underlying crud layer containing ferromagnetic material on nuclear fuel rods |
| JP4874465B2 (ja) * | 2000-03-28 | 2012-02-15 | 株式会社東芝 | 渦電流損失測定センサ |
| JP2001318080A (ja) | 2000-05-09 | 2001-11-16 | Kaisei Engineer Kk | 検出コイルとこの検出コイルを用いた検査装置 |
| US6802946B2 (en) | 2000-12-21 | 2004-10-12 | Nutool Inc. | Apparatus for controlling thickness uniformity of electroplated and electroetched layers |
| JP3587822B2 (ja) | 2001-07-23 | 2004-11-10 | 株式会社荏原製作所 | 渦電流センサ |
| US20040050323A1 (en) * | 2001-08-24 | 2004-03-18 | Hong-Kook Chae | Apparatus for controlling coating weight on strip in continuous galvanizing process |
| JP4812203B2 (ja) | 2001-09-25 | 2011-11-09 | トヨタ自動車株式会社 | アレイ型センサ |
| JP2004334977A (ja) | 2003-05-07 | 2004-11-25 | Sony Corp | 原盤露光装置および光学系衝突回避露光方法 |
| JP4617677B2 (ja) | 2004-02-04 | 2011-01-26 | Jfeスチール株式会社 | 層厚測定方法、システム及び層厚測定方法のプログラム |
| JP4598425B2 (ja) | 2004-03-30 | 2010-12-15 | 新日本製鐵株式会社 | 渦流式センサの補正方法、溶融メッキの目付け量制御装置及び制御方法 |
| DE102004034081A1 (de) * | 2004-07-15 | 2006-02-09 | Robert Bosch Gmbh | Verfahren zur berührungsfreien Bestimmung einer Dicke einer Schicht aus elektrisch leitendem Material |
| US7877888B2 (en) * | 2007-10-25 | 2011-02-01 | General Electric Company | System and method for measuring installation dimensions for flow measurement system |
| JP5200513B2 (ja) | 2007-11-30 | 2013-06-05 | 新日鐵住金株式会社 | 溶接部の非破壊検査装置、及び溶接部の非破壊検査方法 |
| US8284560B2 (en) | 2008-11-14 | 2012-10-09 | Applied Materials, Inc. | Eddy current sensor with enhanced edge resolution |
-
2010
- 2010-05-31 WO PCT/FR2010/051046 patent/WO2011151530A1/fr not_active Ceased
-
2011
- 2011-05-30 US US13/701,305 patent/US10203194B2/en active Active
- 2011-05-30 PL PL11728326T patent/PL2577226T3/pl unknown
- 2011-05-30 ES ES11728326.7T patent/ES2666211T3/es active Active
- 2011-05-30 BR BR112012030475A patent/BR112012030475B1/pt active IP Right Grant
- 2011-05-30 CN CN201180037838.2A patent/CN103080695B/zh active Active
- 2011-05-30 WO PCT/FR2011/051232 patent/WO2011151585A2/fr not_active Ceased
- 2011-05-30 JP JP2013512977A patent/JP6212388B2/ja active Active
- 2011-05-30 EP EP11728326.7A patent/EP2577226B1/fr active Active
- 2011-05-30 KR KR1020127033894A patent/KR101890439B1/ko active Active
- 2011-05-30 HU HUE11728326A patent/HUE038881T2/hu unknown
-
2015
- 2015-12-24 JP JP2015251590A patent/JP2016106217A/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008304471A (ja) * | 2000-03-28 | 2008-12-18 | Toshiba Corp | 膜厚測定装置、膜厚測定方法および記録媒体 |
| JP2004513509A (ja) * | 2000-09-20 | 2004-04-30 | ケーエルエー・テンコール・テクノロジーズ・コーポレーション | 半導体製造プロセスのための方法とシステム |
Also Published As
| Publication number | Publication date |
|---|---|
| BR112012030475A2 (pt) | 2016-08-09 |
| HUE038881T2 (hu) | 2018-12-28 |
| ES2666211T3 (es) | 2018-05-03 |
| EP2577226A2 (fr) | 2013-04-10 |
| EP2577226B1 (fr) | 2018-02-21 |
| JP2016106217A (ja) | 2016-06-16 |
| WO2011151530A1 (fr) | 2011-12-08 |
| PL2577226T3 (pl) | 2018-08-31 |
| WO2011151585A3 (fr) | 2012-03-29 |
| BR112012030475B1 (pt) | 2020-02-04 |
| CN103080695A (zh) | 2013-05-01 |
| KR20140008997A (ko) | 2014-01-22 |
| JP2013527466A (ja) | 2013-06-27 |
| JP6212388B2 (ja) | 2017-10-11 |
| US10203194B2 (en) | 2019-02-12 |
| US20130133575A1 (en) | 2013-05-30 |
| WO2011151585A2 (fr) | 2011-12-08 |
| CN103080695B (zh) | 2016-08-03 |
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