KR101874133B1 - 투과 x선 분석 장치 - Google Patents

투과 x선 분석 장치 Download PDF

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KR101874133B1
KR101874133B1 KR1020130013755A KR20130013755A KR101874133B1 KR 101874133 B1 KR101874133 B1 KR 101874133B1 KR 1020130013755 A KR1020130013755 A KR 1020130013755A KR 20130013755 A KR20130013755 A KR 20130013755A KR 101874133 B1 KR101874133 B1 KR 101874133B1
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tdi sensor
sample
sensor
rolls
ray
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Korean (ko)
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KR20130096180A (ko
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요시키 마토바
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가부시키가이샤 히타치 하이테크 사이언스
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
KR1020130013755A 2012-02-21 2013-02-07 투과 x선 분석 장치 Active KR101874133B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2012-034792 2012-02-21
JP2012034792A JP5875403B2 (ja) 2012-02-21 2012-02-21 透過ｘ線分析装置

Publications (2)

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KR20130096180A KR20130096180A (ko) 2013-08-29
KR101874133B1 true KR101874133B1 (ko) 2018-07-03

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ID=48982262

Family Applications (1)

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KR1020130013755A Active KR101874133B1 (ko) 2012-02-21 2013-02-07 투과 x선 분석 장치

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US (1) US9001966B2 (https=)
JP (1) JP5875403B2 (https=)
KR (1) KR101874133B1 (https=)
CN (1) CN103499592B (https=)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6397690B2 (ja) * 2014-08-11 2018-09-26 株式会社日立ハイテクノロジーズ Ｘ線透過検査装置及び異物検出方法
JP6512980B2 (ja) * 2015-07-29 2019-05-15 株式会社日立ハイテクサイエンス Ｘ線透過検査装置及びｘ線透過検査方法
US20180284037A1 (en) * 2017-03-30 2018-10-04 Sumitomo Chemical Company, Limited Inspection device, inspection method, and method of producing film roll
WO2020115876A1 (ja) * 2018-12-06 2020-06-11 株式会社日立ハイテク 荷電粒子線装置
JP7201481B2 (ja) * 2019-03-04 2023-01-10 株式会社日立ハイテクサイエンス Ｘ線検査装置及びｘ線検査方法
CN110231345B (zh) * 2019-07-17 2023-11-14 佛山市清极能源科技有限公司 一种膜电极缺陷在线检测方法及设备
US12584869B2 (en) * 2021-02-26 2026-03-24 Honeywell Limited Boehmite detection and warning system, and concentration indicator for LiB separator sheet manufacturing
EP4358505A4 (en) * 2021-07-13 2025-02-26 Hamamatsu Photonics K.K. X-ray image acquisition device and x-ray image acquisition system
CN114088742B (zh) * 2021-11-18 2022-09-06 吉林大学 一种变矩器的铸造叶片塌陷位置检测装置
JP7846885B2 (ja) * 2022-02-02 2026-04-16 株式会社イシダ Ｘ線検査装置
WO2024044968A1 (zh) * 2022-08-30 2024-03-07 宁德时代新能源科技股份有限公司 极片检测的方法和装置
JP2025072964A (ja) 2023-10-25 2025-05-12 株式会社日立ハイテクサイエンス Ｘ線分析装置
KR20260001375A (ko) * 2024-06-27 2026-01-05 삼성에스디아이 주식회사 건식 전극 제조 장치 및 건식 전극 제조 방법

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000298102A (ja) 1999-02-08 2000-10-24 Nkk Corp 表面検査装置
JP2004061479A (ja) 2002-07-27 2004-02-26 Elco:Kk Ｘ線異物検出装置
JP2008051584A (ja) 2006-08-23 2008-03-06 Kokusai Gijutsu Kaihatsu Co Ltd 検査装置
JP2011069641A (ja) 2009-09-24 2011-04-07 Yokogawa Electric Corp 放射線検査装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2570288A (en) * 1949-05-03 1951-10-09 Howard Paper Mills Inc Photoelectric inspection of sheet materials
US3317736A (en) * 1963-11-12 1967-05-02 Gen Electric Apparatus for measuring the probability of the presence of optical blemishes
JPS60154181A (ja) * 1984-01-25 1985-08-13 Nippon Steel Corp 帯状金属板の介在物検出装置
US6324249B1 (en) * 2001-03-21 2001-11-27 Agilent Technologies, Inc. Electronic planar laminography system and method
JP3908048B2 (ja) * 2002-02-05 2007-04-25 株式会社イシダ Ｘ線検査装置
JP3971238B2 (ja) * 2002-05-16 2007-09-05 住友ゴム工業株式会社 Ｘ線検査装置
JP3678730B2 (ja) * 2003-02-26 2005-08-03 株式会社日鉄エレックス Ｘ線異物検査方法及び装置
JP2006267067A (ja) * 2005-03-25 2006-10-05 Nippon Petroleum Refining Co Ltd 異物検出装置及び検出方法、並びに異物除去装置及び除去方法
JP2009128090A (ja) * 2007-11-21 2009-06-11 Core Staff Inc テーピングｉｃ対応自動ｘ線検査装置
JP5443033B2 (ja) * 2009-03-27 2014-03-19 トヨタ自動車株式会社 欠陥検査装置および方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000298102A (ja) 1999-02-08 2000-10-24 Nkk Corp 表面検査装置
JP2004061479A (ja) 2002-07-27 2004-02-26 Elco:Kk Ｘ線異物検出装置
JP2008051584A (ja) 2006-08-23 2008-03-06 Kokusai Gijutsu Kaihatsu Co Ltd 検査装置
JP2011069641A (ja) 2009-09-24 2011-04-07 Yokogawa Electric Corp 放射線検査装置

Also Published As

Publication number Publication date
JP5875403B2 (ja) 2016-03-02
US9001966B2 (en) 2015-04-07
KR20130096180A (ko) 2013-08-29
CN103499592B (zh) 2017-04-12
US20130216024A1 (en) 2013-08-22
CN103499592A (zh) 2014-01-08
JP2013170924A (ja) 2013-09-02

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