KR101739537B1 - 검사용 소켓 및 도전성 입자 - Google Patents

검사용 소켓 및 도전성 입자 Download PDF

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Publication number
KR101739537B1
KR101739537B1 KR1020160057823A KR20160057823A KR101739537B1 KR 101739537 B1 KR101739537 B1 KR 101739537B1 KR 1020160057823 A KR1020160057823 A KR 1020160057823A KR 20160057823 A KR20160057823 A KR 20160057823A KR 101739537 B1 KR101739537 B1 KR 101739537B1
Authority
KR
South Korea
Prior art keywords
conductive
conductive particles
body portion
protrusions
inspected
Prior art date
Application number
KR1020160057823A
Other languages
English (en)
Korean (ko)
Inventor
정영배
Original Assignee
주식회사 아이에스시
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 아이에스시 filed Critical 주식회사 아이에스시
Priority to KR1020160057823A priority Critical patent/KR101739537B1/ko
Priority to TW106115629A priority patent/TWI645422B/zh
Priority to PCT/KR2017/004872 priority patent/WO2017196094A1/fr
Priority to CN201780014904.1A priority patent/CN108780115B/zh
Application granted granted Critical
Publication of KR101739537B1 publication Critical patent/KR101739537B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B5/00—Non-insulated conductors or conductive bodies characterised by their form
    • H01B5/14—Non-insulated conductors or conductive bodies characterised by their form comprising conductive layers or films on insulating-supports
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B5/00—Non-insulated conductors or conductive bodies characterised by their form
    • H01B5/16—Non-insulated conductors or conductive bodies characterised by their form comprising conductive material in insulating or poorly conductive material, e.g. conductive rubber

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)
  • Measuring Leads Or Probes (AREA)
KR1020160057823A 2016-05-11 2016-05-11 검사용 소켓 및 도전성 입자 KR101739537B1 (ko)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR1020160057823A KR101739537B1 (ko) 2016-05-11 2016-05-11 검사용 소켓 및 도전성 입자
TW106115629A TWI645422B (zh) 2016-05-11 2017-05-11 測試插座以及導電顆粒
PCT/KR2017/004872 WO2017196094A1 (fr) 2016-05-11 2017-05-11 Fiche d'essai et particules conductrices
CN201780014904.1A CN108780115B (zh) 2016-05-11 2017-05-11 测试插座以及导电颗粒

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020160057823A KR101739537B1 (ko) 2016-05-11 2016-05-11 검사용 소켓 및 도전성 입자

Publications (1)

Publication Number Publication Date
KR101739537B1 true KR101739537B1 (ko) 2017-05-25

Family

ID=59050977

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020160057823A KR101739537B1 (ko) 2016-05-11 2016-05-11 검사용 소켓 및 도전성 입자

Country Status (4)

Country Link
KR (1) KR101739537B1 (fr)
CN (1) CN108780115B (fr)
TW (1) TWI645422B (fr)
WO (1) WO2017196094A1 (fr)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101901982B1 (ko) 2017-07-19 2018-09-27 주식회사 아이에스시 검사용 소켓 및 도전성 입자
KR102195339B1 (ko) * 2019-11-26 2020-12-24 김규선 도전성 입자
KR102204910B1 (ko) * 2019-11-26 2021-01-19 김규선 검사용 소켓
KR20220023438A (ko) * 2020-08-21 2022-03-02 주식회사 스노우 도전성 입자 및 이를 포함하는 검사용 소켓
US11373779B2 (en) 2019-11-26 2022-06-28 Snow Co., Ltd. Conductive particles and test socket having the same

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102113732B1 (ko) * 2019-03-21 2020-05-21 주식회사 아이에스시 도전성 분말 및 이를 포함하는 검사용 커넥터
KR102211358B1 (ko) * 2020-03-19 2021-02-03 (주)티에스이 테스트 소켓 및 이를 포함하는 테스트 장치와, 테스트 소켓의 제조방법
KR102179457B1 (ko) * 2020-03-25 2020-11-16 (주)티에스이 테스트 소켓 및 이를 포함하는 테스트 장치와, 테스트 소켓의 제조방법

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011150837A (ja) 2010-01-20 2011-08-04 Jsr Corp 回路接続部材、導電性粒子および導電性粒子の製造方法
KR101471116B1 (ko) 2014-02-13 2014-12-12 주식회사 아이에스시 고밀도 도전부를 가지는 테스트용 소켓

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI239684B (en) * 2003-04-16 2005-09-11 Jsr Corp Anisotropic conductive connector and electric inspection device for circuit device
CN100539061C (zh) * 2004-03-31 2009-09-09 Jsr株式会社 探针设备，配备有该探针设备的晶片检测设备，以及晶片检测方法
KR100929645B1 (ko) * 2008-03-31 2009-12-03 리노공업주식회사 반도체 칩 검사용 소켓
KR101019721B1 (ko) * 2008-11-11 2011-03-07 주식회사 아이에스시테크놀러지 기둥형 입자를 가지는 테스트 소켓
JP2011112552A (ja) * 2009-11-27 2011-06-09 Renesas Electronics Corp 半導体パッケージのソケット装置、及び半導体パッケージのテスト装置
KR101378505B1 (ko) * 2009-12-02 2014-03-31 주식회사 오킨스전자 반도체칩 패키지 테스트용 콘택트
KR101246301B1 (ko) * 2012-01-18 2013-03-22 이재학 미세선형체가 마련된 테스트용 소켓
KR101266124B1 (ko) * 2012-04-03 2013-05-27 주식회사 아이에스시 고밀도 도전부를 가지는 테스트용 소켓 및 그 제조방법
KR101339166B1 (ko) * 2012-06-18 2013-12-09 주식회사 아이에스시 관통공이 형성된 도전성 입자를 가지는 검사용 소켓 및 그 제조방법
KR101492242B1 (ko) * 2014-07-17 2015-02-13 주식회사 아이에스시 검사용 접촉장치 및 전기적 검사소켓
CN105527472B (zh) * 2014-10-17 2018-10-02 株式会社Isc 测试座
KR20160046621A (ko) * 2014-10-21 2016-04-29 삼성전자주식회사 반도체 칩 패키지 테스트용 테스트 소켓 및 이의 제조 방법
KR101606284B1 (ko) * 2014-10-29 2016-03-25 주식회사 아이에스시 관통 홀이 형성된 다공성 절연시트를 갖는 전기적 접속체 및 테스트 소켓
KR101586340B1 (ko) * 2014-12-26 2016-01-18 주식회사 아이에스시 전기적 검사 소켓 및 전기적 검사 소켓용 도전성 입자의 제조방법
KR101525520B1 (ko) * 2015-02-03 2015-06-03 (주)티에스이 결합 형상의 도전성 입자를 가지는 검사용 소켓

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011150837A (ja) 2010-01-20 2011-08-04 Jsr Corp 回路接続部材、導電性粒子および導電性粒子の製造方法
KR101471116B1 (ko) 2014-02-13 2014-12-12 주식회사 아이에스시 고밀도 도전부를 가지는 테스트용 소켓

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101901982B1 (ko) 2017-07-19 2018-09-27 주식회사 아이에스시 검사용 소켓 및 도전성 입자
KR102195339B1 (ko) * 2019-11-26 2020-12-24 김규선 도전성 입자
KR102204910B1 (ko) * 2019-11-26 2021-01-19 김규선 검사용 소켓
US11373779B2 (en) 2019-11-26 2022-06-28 Snow Co., Ltd. Conductive particles and test socket having the same
KR20220023438A (ko) * 2020-08-21 2022-03-02 주식회사 스노우 도전성 입자 및 이를 포함하는 검사용 소켓
KR102393083B1 (ko) 2020-08-21 2022-05-03 주식회사 스노우 도전성 입자 및 이를 포함하는 검사용 소켓
US11693027B2 (en) 2020-08-21 2023-07-04 Snow Co., Ltd. Conductive particle and testing socket comprising the same

Also Published As

Publication number Publication date
TWI645422B (zh) 2018-12-21
CN108780115A (zh) 2018-11-09
WO2017196094A1 (fr) 2017-11-16
TW201743341A (zh) 2017-12-16
CN108780115B (zh) 2020-12-15

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