KR101637408B1 - 표시 디바이스의 표시 불균일 검출 방법 및 그 장치 - Google Patents

표시 디바이스의 표시 불균일 검출 방법 및 그 장치 Download PDF

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Publication number
KR101637408B1
KR101637408B1 KR1020147026917A KR20147026917A KR101637408B1 KR 101637408 B1 KR101637408 B1 KR 101637408B1 KR 1020147026917 A KR1020147026917 A KR 1020147026917A KR 20147026917 A KR20147026917 A KR 20147026917A KR 101637408 B1 KR101637408 B1 KR 101637408B1
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KR
South Korea
Prior art keywords
pixel
pixel value
display
display device
value
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KR1020147026917A
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English (en)
Korean (ko)
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KR20140133881A (ko
Inventor
쿠니히로 미즈노
케이이치 쿠라쇼
Original Assignee
가부시키가이샤 니혼 마이크로닉스
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Publication of KR20140133881A publication Critical patent/KR20140133881A/ko
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Publication of KR101637408B1 publication Critical patent/KR101637408B1/ko

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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00—Diagnosis, testing or measuring for television systems or their details
    • H04N17/04—Diagnosis, testing or measuring for television systems or their details for receivers
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/66—Transforming electric information into light information
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/02—Improving the quality of display appearance
    • G09G2320/0233—Improving the luminance or brightness uniformity across the screen
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/02—Improving the quality of display appearance
    • G09G2320/0285—Improving the quality of display appearance using tables for spatial correction of display data
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/02—Improving the quality of display appearance
    • G09G2320/029—Improving the quality of display appearance by monitoring one or more pixels in the display panel, e.g. by monitoring a fixed reference pixel
    • G09G2320/0295—Improving the quality of display appearance by monitoring one or more pixels in the display panel, e.g. by monitoring a fixed reference pixel by monitoring each display pixel
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/06—Adjustment of display parameters
    • G09G2320/0693—Calibration of display systems
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2360/00—Aspects of the architecture of display systems
    • G09G2360/14—Detecting light within display terminals, e.g. using a single or a plurality of photosensors
    • G09G2360/145—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen
    • G09G2360/147—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen the originated light output being determined for each pixel

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Biomedical Technology (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Control Of El Displays (AREA)
KR1020147026917A 2012-03-01 2012-03-01 표시 디바이스의 표시 불균일 검출 방법 및 그 장치 KR101637408B1 (ko)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2012/055271 WO2013128616A1 (ja) 2012-03-01 2012-03-01 表示デバイスの表示むら検出方法及びその装置

Publications (2)

Publication Number Publication Date
KR20140133881A KR20140133881A (ko) 2014-11-20
KR101637408B1 true KR101637408B1 (ko) 2016-07-07

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Family Applications (1)

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KR1020147026917A KR101637408B1 (ko) 2012-03-01 2012-03-01 표시 디바이스의 표시 불균일 검출 방법 및 그 장치

Country Status (5)

Country Link
JP (1) JP5919370B2 (zh)
KR (1) KR101637408B1 (zh)
CN (1) CN104137171B (zh)
TW (1) TWI501627B (zh)
WO (1) WO2013128616A1 (zh)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013128617A1 (ja) * 2012-03-01 2013-09-06 株式会社日本マイクロニクス 表示デバイスの表示むら検出方法及びその装置
CN105244001B (zh) * 2015-11-09 2018-01-09 深圳市华星光电技术有限公司 一种确定mura补偿值的方法以及装置
CN105628344B (zh) * 2016-01-29 2019-02-01 深圳英伦科技股份有限公司 背光模组及其透光均匀性检测系统及其led混珠搭配方法
CN106500969B (zh) * 2016-11-17 2019-07-26 深圳Tcl新技术有限公司 显示屏均匀性测试方法及显示屏均匀性测试系统
CN106448524B (zh) * 2016-12-14 2020-10-02 深圳Tcl数字技术有限公司 显示屏亮度均匀性的测试方法及装置
KR102454986B1 (ko) * 2017-05-23 2022-10-17 삼성디스플레이 주식회사 얼룩 검출 장치 및 이를 이용한 얼룩 검출 방법
CN108281120B (zh) * 2018-01-27 2020-04-10 深圳市华星光电半导体显示技术有限公司 显示面板的Mura修补方法
JP2020086419A (ja) * 2018-11-28 2020-06-04 雄二 橋本 複数の制御対象のユニフォーミティを得るための調整方法、調整システムおよびコンベア装置、並びに調整された機器。
JP2020086409A (ja) * 2018-11-30 2020-06-04 株式会社イクス ムラ補正データ生成方法及びムラ補正データ生成システム
CN109493825B (zh) * 2019-01-16 2020-11-24 合肥鑫晟光电科技有限公司 一种画面参数计算方法、装置及存储介质
CN110299114A (zh) * 2019-06-25 2019-10-01 深圳Tcl新技术有限公司 显示均匀性的判断方法、装置及存储介质
CN111652865B (zh) 2020-05-29 2022-04-08 惠州市华星光电技术有限公司 Mura检测方法、装置及可读存储介质

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JP2005121724A (ja) * 2003-10-14 2005-05-12 Sankyo Kk 平面型表示装置の調整方法
JP2005165387A (ja) * 2003-11-28 2005-06-23 Seiko Epson Corp 画面のスジ欠陥検出方法及び装置並びに表示装置
JP2005331929A (ja) * 2004-04-19 2005-12-02 Semiconductor Energy Lab Co Ltd 画像解析方法、画像解析プログラム、及びそれらを有する画素評価システム
JP2011209639A (ja) 2010-03-30 2011-10-20 Sharp Corp 表示装置、輝度ムラ補正方法、補正データ作成装置、および補正データ作成方法

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JP2005150349A (ja) 2003-11-14 2005-06-09 Tdk Corp 積層型電子部品の製造方法
US8184923B2 (en) * 2004-04-19 2012-05-22 Semiconductor Energy Laboratory Co., Ltd. Image analysis method, image analysis program, pixel evaluation system having the image analysis method, and pixel evaluation system having the image analysis program
JP2006135381A (ja) * 2004-11-02 2006-05-25 Olympus Corp キャリブレーション方法およびキャリブレーション装置
TWI289704B (en) * 2005-08-03 2007-11-11 Chi-Cheng Ye Detecting method of preventing the liquid crystal molecule of the LCD screen from generating gravity mura
US20080018630A1 (en) * 2006-07-18 2008-01-24 Yusuke Fujino Liquid crystal display device, liquid crystal display and method of driving liquid crystal display device
TWI334928B (en) * 2007-04-19 2010-12-21 Au Optronics Corp Mura detection method and system
JP4681033B2 (ja) 2008-07-31 2011-05-11 株式会社イクス 画像補正データ生成システム、画像データ生成方法及び画像補正回路
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WO2013128617A1 (ja) * 2012-03-01 2013-09-06 株式会社日本マイクロニクス 表示デバイスの表示むら検出方法及びその装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005121724A (ja) * 2003-10-14 2005-05-12 Sankyo Kk 平面型表示装置の調整方法
JP2005165387A (ja) * 2003-11-28 2005-06-23 Seiko Epson Corp 画面のスジ欠陥検出方法及び装置並びに表示装置
JP2005331929A (ja) * 2004-04-19 2005-12-02 Semiconductor Energy Lab Co Ltd 画像解析方法、画像解析プログラム、及びそれらを有する画素評価システム
JP2011209639A (ja) 2010-03-30 2011-10-20 Sharp Corp 表示装置、輝度ムラ補正方法、補正データ作成装置、および補正データ作成方法

Also Published As

Publication number Publication date
CN104137171B (zh) 2017-03-29
TW201338502A (zh) 2013-09-16
CN104137171A (zh) 2014-11-05
TWI501627B (zh) 2015-09-21
WO2013128616A1 (ja) 2013-09-06
KR20140133881A (ko) 2014-11-20
JPWO2013128616A1 (ja) 2015-07-30
JP5919370B2 (ja) 2016-05-18

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