KR101538612B1 - 타깃 보유 지지 지그 및 측정 장치 - Google Patents

타깃 보유 지지 지그 및 측정 장치 Download PDF

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Publication number
KR101538612B1
KR101538612B1 KR1020157012509A KR20157012509A KR101538612B1 KR 101538612 B1 KR101538612 B1 KR 101538612B1 KR 1020157012509 A KR1020157012509 A KR 1020157012509A KR 20157012509 A KR20157012509 A KR 20157012509A KR 101538612 B1 KR101538612 B1 KR 101538612B1
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KR
South Korea
Prior art keywords
target
measurement object
measurement
holding jig
light
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KR1020157012509A
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English (en)
Korean (ko)
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KR20150056882A (ko
Inventor
고스케 고타니
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미츠비시 히타치 파워 시스템즈 가부시키가이샤
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/481—Constructional features, e.g. arrangements of optical elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
    • G01B5/0004—Supports
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
    • G01C15/02—Means for marking measuring points
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
    • G01C15/02—Means for marking measuring points
    • G01C15/06—Surveyors' staffs; Movable markers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/08—Systems determining position data of a target for measuring distance only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Electromagnetism (AREA)
KR1020157012509A 2013-01-16 2014-01-10 타깃 보유 지지 지그 및 측정 장치 Active KR101538612B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2013005667A JP5627719B2 (ja) 2013-01-16 2013-01-16 ターゲット保持冶具及び測定装置
JPJP-P-2013-005667 2013-01-16
PCT/JP2014/050361 WO2014112443A1 (ja) 2013-01-16 2014-01-10 ターゲット保持冶具及び測定装置

Publications (2)

Publication Number Publication Date
KR20150056882A KR20150056882A (ko) 2015-05-27
KR101538612B1 true KR101538612B1 (ko) 2015-07-21

Family

ID=51209533

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020157012509A Active KR101538612B1 (ko) 2013-01-16 2014-01-10 타깃 보유 지지 지그 및 측정 장치

Country Status (6)

Country Link
US (1) US9778347B2 (enExample)
EP (1) EP2908090B1 (enExample)
JP (1) JP5627719B2 (enExample)
KR (1) KR101538612B1 (enExample)
CN (1) CN104254756B (enExample)
WO (1) WO2014112443A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5908147B1 (ja) * 2015-06-22 2016-04-26 三菱日立パワーシステムズ株式会社 ターゲット保持冶具及び測定装置並びにターゲット保持方法
CN111215887B (zh) * 2019-12-04 2021-12-14 上海航天控制技术研究所 一种用于敏感包快速装配对准的防错式组合装置
JP7445496B2 (ja) 2020-03-31 2024-03-07 三菱重工業株式会社 フィン先端位置の計測方法、フィン先端位置の計測システム、及びフィン先端位置の計測用冶具
CN111709500B (zh) * 2020-06-01 2022-05-24 国网天津市电力公司电力科学研究院 一种输电铁塔紧固件服役异常的快速检测装置及方法
CN112180335B (zh) * 2020-09-29 2023-08-15 北京富奥星电子技术有限公司 一种多普勒雷达模组验证装置及验证方法
CN114043402B (zh) * 2021-11-08 2023-05-23 陕西飞机工业有限责任公司 数控调姿定位组件在飞机装配平台上的安装方法
CN119826710B (zh) * 2025-01-13 2025-10-10 芜湖映日科技股份有限公司 一种圆靶材检测设备

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08219790A (ja) * 1995-02-20 1996-08-30 Hitachi Plant Eng & Constr Co Ltd 反射板保持治具

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4090652T (enExample) 1989-04-14 1992-01-30
JPH10246635A (ja) * 1997-02-28 1998-09-14 Hitachi Kiden Kogyo Ltd 三次元計測におけるレール測定用ターゲット
JP3687316B2 (ja) * 1997-11-21 2005-08-24 日立プラント建設株式会社 芯出治具及びそれを用いた測定装置
US6219931B1 (en) * 1998-03-10 2001-04-24 Northrop Grumman Corporation Target base for a measuring system
WO2001009642A1 (de) * 1999-07-28 2001-02-08 Leica Geosystems Ag Verfahren und anordnung zur bestimmung von räumlichen positionen und orientierungen
DE102008043977A1 (de) * 2008-11-21 2010-06-10 Airbus Deutschland Gmbh Strukturelement für eine Rumpfzellenstruktur eines Flugzeugs
US8659749B2 (en) 2009-08-07 2014-02-25 Faro Technologies, Inc. Absolute distance meter with optical switch
JP5522402B2 (ja) 2010-12-27 2014-06-18 株式会社Ｉｈｉ 三次元計測治具及びこれを用いた三次元計測方法
JP2012237661A (ja) * 2011-05-12 2012-12-06 Ntn Corp 測定補助器具およびそれを用いた直径測定方法
CN202281855U (zh) 2011-10-08 2012-06-20 江阴香江光电仪器有限公司 金属单框棱镜组
DE102011089837A1 (de) * 2011-12-23 2013-06-27 Hilti Aktiengesellschaft Optisches System
JP5816706B2 (ja) * 2013-09-19 2015-11-18 株式会社小松製作所 測定治具

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08219790A (ja) * 1995-02-20 1996-08-30 Hitachi Plant Eng & Constr Co Ltd 反射板保持治具

Also Published As

Publication number Publication date
US20160291133A1 (en) 2016-10-06
JP2014137273A (ja) 2014-07-28
EP2908090A1 (en) 2015-08-19
CN104254756A (zh) 2014-12-31
CN104254756B (zh) 2015-11-25
KR20150056882A (ko) 2015-05-27
EP2908090A4 (en) 2015-11-18
JP5627719B2 (ja) 2014-11-19
WO2014112443A1 (ja) 2014-07-24
US9778347B2 (en) 2017-10-03
EP2908090B1 (en) 2017-03-08

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