KR101509867B1 - 검사 방법 및 검사 시스템 - Google Patents
검사 방법 및 검사 시스템 Download PDFInfo
- Publication number
- KR101509867B1 KR101509867B1 KR20120151944A KR20120151944A KR101509867B1 KR 101509867 B1 KR101509867 B1 KR 101509867B1 KR 20120151944 A KR20120151944 A KR 20120151944A KR 20120151944 A KR20120151944 A KR 20120151944A KR 101509867 B1 KR101509867 B1 KR 101509867B1
- Authority
- KR
- South Korea
- Prior art keywords
- laminated film
- insulating layer
- metal layer
- liquid
- electrodes
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 50
- 230000007547 defect Effects 0.000 claims abstract description 95
- 229910052751 metal Inorganic materials 0.000 claims abstract description 62
- 239000002184 metal Substances 0.000 claims abstract description 62
- 238000007689 inspection Methods 0.000 claims abstract description 56
- 239000007788 liquid Substances 0.000 claims abstract description 37
- 238000001514 detection method Methods 0.000 claims abstract description 10
- 244000145845 chattering Species 0.000 claims description 35
- 230000000149 penetrating effect Effects 0.000 claims description 4
- 239000004065 semiconductor Substances 0.000 claims 3
- 239000010410 layer Substances 0.000 description 103
- 239000000523 sample Substances 0.000 description 73
- 230000008569 process Effects 0.000 description 21
- HBBGRARXTFLTSG-UHFFFAOYSA-N Lithium ion Chemical compound [Li+] HBBGRARXTFLTSG-UHFFFAOYSA-N 0.000 description 20
- 229910001416 lithium ion Inorganic materials 0.000 description 20
- 239000000243 solution Substances 0.000 description 18
- 238000010586 diagram Methods 0.000 description 9
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 8
- 230000008439 repair process Effects 0.000 description 7
- 239000000463 material Substances 0.000 description 6
- 230000035515 penetration Effects 0.000 description 5
- 230000002950 deficient Effects 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 239000011241 protective layer Substances 0.000 description 3
- 238000011179 visual inspection Methods 0.000 description 3
- 239000004677 Nylon Substances 0.000 description 2
- 239000004743 Polypropylene Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 239000003792 electrolyte Substances 0.000 description 2
- 239000008151 electrolyte solution Substances 0.000 description 2
- 229920001778 nylon Polymers 0.000 description 2
- 229920000139 polyethylene terephthalate Polymers 0.000 description 2
- 239000005020 polyethylene terephthalate Substances 0.000 description 2
- -1 polypropylene Polymers 0.000 description 2
- 229920001155 polypropylene Polymers 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 238000010248 power generation Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 229910000859 α-Fe Inorganic materials 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/20—Investigating the presence of flaws
- G01N27/205—Investigating the presence of flaws in insulating materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/04—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
- B32B15/043—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of metal
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0096—Testing material properties on thin layers or coatings
Landscapes
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Electrochemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011284185A JP5839986B2 (ja) | 2011-12-26 | 2011-12-26 | 検査方法および検査システム |
JPJP-P-2011-284185 | 2011-12-26 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20130074761A KR20130074761A (ko) | 2013-07-04 |
KR101509867B1 true KR101509867B1 (ko) | 2015-04-07 |
Family
ID=48635869
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR20120151944A KR101509867B1 (ko) | 2011-12-26 | 2012-12-24 | 검사 방법 및 검사 시스템 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP5839986B2 (zh) |
KR (1) | KR101509867B1 (zh) |
CN (2) | CN103175867A (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2023140473A1 (ko) * | 2022-01-19 | 2023-07-27 | 엘지전자 주식회사 | 손상 감지 장치 및 손상 감지 방법 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6088145B2 (ja) * | 2012-02-13 | 2017-03-01 | オートモーティブエナジーサプライ株式会社 | 電池の製造方法および導電性検査装置 |
EP3026450A4 (en) * | 2013-07-24 | 2016-07-20 | Automotive Energy Supply Corp | TEST PROCEDURE FOR SECONDARY BATTERY |
CN108020633B (zh) * | 2017-12-04 | 2021-01-05 | 奇瑞汽车股份有限公司 | 一种涂装涂层缺陷快速鉴别方法 |
CN113401752A (zh) * | 2020-03-16 | 2021-09-17 | 奥的斯电梯公司 | 用于电梯曳引带的表面绝缘层的状态检测方法和装置 |
Citations (4)
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JPH05157723A (ja) * | 1991-12-06 | 1993-06-25 | Fujitsu Ltd | 絶縁皮膜の欠陥検査方法 |
JP2799360B2 (ja) | 1989-11-06 | 1998-09-17 | 出光石油化学株式会社 | 密封容器の検査方法 |
JP2006275816A (ja) | 2005-03-29 | 2006-10-12 | Seiko Epson Corp | 絶縁性部材の検査方法及び検査装置 |
KR20100062118A (ko) * | 2008-12-01 | 2010-06-10 | 삼성전자주식회사 | 전기집진장치 및 그 전극 |
Family Cites Families (19)
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JPS58127346U (ja) * | 1982-02-22 | 1983-08-29 | 大日本印刷株式会社 | 紙製液体容器の検査装置 |
JPS62229056A (ja) * | 1986-03-31 | 1987-10-07 | Nippon Steel Corp | 塗装金属の塗膜劣化程度定量診断方法およびその装置 |
JPH0786757A (ja) * | 1993-09-13 | 1995-03-31 | Fujitsu Ltd | 絶縁膜のピンホール検査方法及びその検査装置 |
JP3569072B2 (ja) * | 1996-05-09 | 2004-09-22 | セイコーエプソン株式会社 | セラミック基板のクラック検査方法 |
JPH10132776A (ja) * | 1996-10-30 | 1998-05-22 | Toyo Seikan Kaisha Ltd | 積層蓋体の金属露出の検出方法 |
JP2987119B2 (ja) * | 1997-02-13 | 1999-12-06 | ショーボンド建設株式会社 | 導電性繊維布の積層数の計測装置及び計測方法 |
KR100445489B1 (ko) * | 1999-11-15 | 2004-08-21 | 마츠시타 덴끼 산교 가부시키가이샤 | 바이오 센서, 박막 전극 형성 방법, 정량 장치, 및 정량방법 |
JP2003004244A (ja) * | 2001-06-22 | 2003-01-08 | Izena:Kk | 床冷暖房構造用水容器の水漏れ検知装置及び水漏れ検知方法 |
JP4054272B2 (ja) * | 2003-03-25 | 2008-02-27 | 富士通株式会社 | 電解液接触用電極及びその製造方法、並びに、遺伝子検出用チップ |
US20050057258A1 (en) * | 2003-09-16 | 2005-03-17 | Colahan Jerry J. | Hand mounted holiday tester |
JP4659479B2 (ja) * | 2005-02-14 | 2011-03-30 | 日本メクトロン株式会社 | 可撓性プリント基板の電気検査装置 |
JP4795090B2 (ja) * | 2006-04-19 | 2011-10-19 | 日本テトラパック株式会社 | 包材検査装置 |
CN101595381B (zh) * | 2007-07-20 | 2012-11-14 | 松下电器产业株式会社 | 电化学测定用电极板、具有该电极板的电化学测定装置、和使用该电极板对目标物质进行定量的方法 |
JP5196900B2 (ja) * | 2007-07-30 | 2013-05-15 | 三洋電機株式会社 | ラミネート外装電池 |
EP2214007B1 (en) * | 2007-10-31 | 2019-05-01 | ARKRAY, Inc. | Analytical tool |
JP4974936B2 (ja) * | 2008-03-05 | 2012-07-11 | 日本特殊陶業株式会社 | ガスセンサ素子の検査方法 |
CN201242582Y (zh) * | 2008-05-09 | 2009-05-20 | 上海华碧检测技术有限公司 | 一种集成电路缺陷定位测试系统 |
CN102230914B (zh) * | 2011-03-31 | 2012-11-21 | 厦门安锐捷电子科技有限公司 | 一种基于电磁谐振的金属材料的无损检测方法 |
CN202522537U (zh) * | 2011-12-31 | 2012-11-07 | 国网电力科学研究院 | 绝缘工具沿面缺陷现场检测装置 |
-
2011
- 2011-12-26 JP JP2011284185A patent/JP5839986B2/ja active Active
-
2012
- 2012-12-24 KR KR20120151944A patent/KR101509867B1/ko active IP Right Grant
- 2012-12-26 CN CN2012105764968A patent/CN103175867A/zh active Pending
- 2012-12-26 CN CN201610185921.9A patent/CN105866181B/zh active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2799360B2 (ja) | 1989-11-06 | 1998-09-17 | 出光石油化学株式会社 | 密封容器の検査方法 |
JPH05157723A (ja) * | 1991-12-06 | 1993-06-25 | Fujitsu Ltd | 絶縁皮膜の欠陥検査方法 |
JP2006275816A (ja) | 2005-03-29 | 2006-10-12 | Seiko Epson Corp | 絶縁性部材の検査方法及び検査装置 |
KR20100062118A (ko) * | 2008-12-01 | 2010-06-10 | 삼성전자주식회사 | 전기집진장치 및 그 전극 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2023140473A1 (ko) * | 2022-01-19 | 2023-07-27 | 엘지전자 주식회사 | 손상 감지 장치 및 손상 감지 방법 |
Also Published As
Publication number | Publication date |
---|---|
CN105866181B (zh) | 2021-04-02 |
JP2013134131A (ja) | 2013-07-08 |
JP5839986B2 (ja) | 2016-01-06 |
CN105866181A (zh) | 2016-08-17 |
KR20130074761A (ko) | 2013-07-04 |
CN103175867A (zh) | 2013-06-26 |
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