KR101509867B1 - 검사 방법 및 검사 시스템 - Google Patents

검사 방법 및 검사 시스템 Download PDF

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Publication number
KR101509867B1
KR101509867B1 KR20120151944A KR20120151944A KR101509867B1 KR 101509867 B1 KR101509867 B1 KR 101509867B1 KR 20120151944 A KR20120151944 A KR 20120151944A KR 20120151944 A KR20120151944 A KR 20120151944A KR 101509867 B1 KR101509867 B1 KR 101509867B1
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KR
South Korea
Prior art keywords
laminated film
insulating layer
metal layer
liquid
electrodes
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KR20120151944A
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English (en)
Korean (ko)
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KR20130074761A (ko
Inventor
다케시 기리아케
기요시 요시다
아키노리 미우라
아이카 기무라
마사토모 미즈타
Original Assignee
닛산 지도우샤 가부시키가이샤
오토모티브 에너지 서플라이 가부시키가이샤
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Publication of KR20130074761A publication Critical patent/KR20130074761A/ko
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Publication of KR101509867B1 publication Critical patent/KR101509867B1/ko

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/20Investigating the presence of flaws
    • G01N27/205Investigating the presence of flaws in insulating materials
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/04Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
    • B32B15/043Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of metal
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0096Testing material properties on thin layers or coatings

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  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
KR20120151944A 2011-12-26 2012-12-24 검사 방법 및 검사 시스템 KR101509867B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2011284185A JP5839986B2 (ja) 2011-12-26 2011-12-26 検査方法および検査システム
JPJP-P-2011-284185 2011-12-26

Publications (2)

Publication Number Publication Date
KR20130074761A KR20130074761A (ko) 2013-07-04
KR101509867B1 true KR101509867B1 (ko) 2015-04-07

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KR20120151944A KR101509867B1 (ko) 2011-12-26 2012-12-24 검사 방법 및 검사 시스템

Country Status (3)

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JP (1) JP5839986B2 (zh)
KR (1) KR101509867B1 (zh)
CN (2) CN103175867A (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
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WO2023140473A1 (ko) * 2022-01-19 2023-07-27 엘지전자 주식회사 손상 감지 장치 및 손상 감지 방법

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* Cited by examiner, † Cited by third party
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JP6088145B2 (ja) * 2012-02-13 2017-03-01 オートモーティブエナジーサプライ株式会社 電池の製造方法および導電性検査装置
EP3026450A4 (en) * 2013-07-24 2016-07-20 Automotive Energy Supply Corp TEST PROCEDURE FOR SECONDARY BATTERY
CN108020633B (zh) * 2017-12-04 2021-01-05 奇瑞汽车股份有限公司 一种涂装涂层缺陷快速鉴别方法
CN113401752A (zh) * 2020-03-16 2021-09-17 奥的斯电梯公司 用于电梯曳引带的表面绝缘层的状态检测方法和装置

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JP2799360B2 (ja) 1989-11-06 1998-09-17 出光石油化学株式会社 密封容器の検査方法
JP2006275816A (ja) 2005-03-29 2006-10-12 Seiko Epson Corp 絶縁性部材の検査方法及び検査装置
KR20100062118A (ko) * 2008-12-01 2010-06-10 삼성전자주식회사 전기집진장치 및 그 전극

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JPH0786757A (ja) * 1993-09-13 1995-03-31 Fujitsu Ltd 絶縁膜のピンホール検査方法及びその検査装置
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JPH10132776A (ja) * 1996-10-30 1998-05-22 Toyo Seikan Kaisha Ltd 積層蓋体の金属露出の検出方法
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JP2003004244A (ja) * 2001-06-22 2003-01-08 Izena:Kk 床冷暖房構造用水容器の水漏れ検知装置及び水漏れ検知方法
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CN202522537U (zh) * 2011-12-31 2012-11-07 国网电力科学研究院 绝缘工具沿面缺陷现场检测装置

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2799360B2 (ja) 1989-11-06 1998-09-17 出光石油化学株式会社 密封容器の検査方法
JPH05157723A (ja) * 1991-12-06 1993-06-25 Fujitsu Ltd 絶縁皮膜の欠陥検査方法
JP2006275816A (ja) 2005-03-29 2006-10-12 Seiko Epson Corp 絶縁性部材の検査方法及び検査装置
KR20100062118A (ko) * 2008-12-01 2010-06-10 삼성전자주식회사 전기집진장치 및 그 전극

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023140473A1 (ko) * 2022-01-19 2023-07-27 엘지전자 주식회사 손상 감지 장치 및 손상 감지 방법

Also Published As

Publication number Publication date
CN105866181B (zh) 2021-04-02
JP2013134131A (ja) 2013-07-08
JP5839986B2 (ja) 2016-01-06
CN105866181A (zh) 2016-08-17
KR20130074761A (ko) 2013-07-04
CN103175867A (zh) 2013-06-26

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