KR101484833B1 - n 형 확산층 형성 조성물, n 형 확산층의 제조 방법, 및 태양 전지 소자의 제조 방법 - Google Patents
n 형 확산층 형성 조성물, n 형 확산층의 제조 방법, 및 태양 전지 소자의 제조 방법 Download PDFInfo
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- KR101484833B1 KR101484833B1 KR20127030147A KR20127030147A KR101484833B1 KR 101484833 B1 KR101484833 B1 KR 101484833B1 KR 20127030147 A KR20127030147 A KR 20127030147A KR 20127030147 A KR20127030147 A KR 20127030147A KR 101484833 B1 KR101484833 B1 KR 101484833B1
- Authority
- KR
- South Korea
- Prior art keywords
- diffusion layer
- type diffusion
- forming composition
- glass
- glass powder
- Prior art date
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- 238000009792 diffusion process Methods 0.000 title claims abstract description 223
- 239000010410 layer Substances 0.000 title claims abstract description 149
- 239000011254 layer-forming composition Substances 0.000 title claims abstract description 68
- 238000004519 manufacturing process Methods 0.000 title claims description 30
- 210000003850 cellular structure Anatomy 0.000 title 1
- 239000011521 glass Substances 0.000 claims abstract description 110
- 239000000843 powder Substances 0.000 claims abstract description 70
- 239000000126 substance Substances 0.000 claims abstract description 25
- 238000000034 method Methods 0.000 claims description 56
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- 229910052710 silicon Inorganic materials 0.000 claims description 29
- 239000010703 silicon Substances 0.000 claims description 27
- 239000004065 semiconductor Substances 0.000 claims description 20
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- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 18
- 239000011574 phosphorus Substances 0.000 claims description 18
- 239000000463 material Substances 0.000 claims description 17
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 16
- 229910052751 metal Inorganic materials 0.000 claims description 13
- 239000002184 metal Substances 0.000 claims description 13
- 229910052709 silver Inorganic materials 0.000 claims description 11
- 239000010949 copper Substances 0.000 claims description 9
- 239000004332 silver Substances 0.000 claims description 9
- XEEYBQQBJWHFJM-UHFFFAOYSA-N iron Substances [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 8
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- 239000011701 zinc Substances 0.000 claims description 7
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- 229910018068 Li 2 O Inorganic materials 0.000 claims description 5
- 229910052725 zinc Inorganic materials 0.000 claims description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 4
- 229910052787 antimony Inorganic materials 0.000 claims description 4
- 229910052742 iron Inorganic materials 0.000 claims description 4
- 229910052708 sodium Inorganic materials 0.000 claims description 4
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 claims description 3
- 239000011572 manganese Substances 0.000 claims description 3
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 2
- 238000010438 heat treatment Methods 0.000 claims description 2
- 229910052748 manganese Inorganic materials 0.000 claims description 2
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 claims 1
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- LZDKZFUFMNSQCJ-UHFFFAOYSA-N 1,2-diethoxyethane Chemical compound CCOCCOCC LZDKZFUFMNSQCJ-UHFFFAOYSA-N 0.000 description 6
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 6
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- 239000002253 acid Substances 0.000 description 5
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- XMGQYMWWDOXHJM-UHFFFAOYSA-N limonene Chemical compound CC(=C)C1CCC(C)=CC1 XMGQYMWWDOXHJM-UHFFFAOYSA-N 0.000 description 4
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- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 4
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- ZIKLJUUTSQYGQI-UHFFFAOYSA-N 1-ethoxy-2-(2-ethoxypropoxy)propane Chemical compound CCOCC(C)OCC(C)OCC ZIKLJUUTSQYGQI-UHFFFAOYSA-N 0.000 description 3
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- 239000001856 Ethyl cellulose Substances 0.000 description 3
- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical compound CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 description 3
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- 239000000654 additive Substances 0.000 description 3
- LFVGISIMTYGQHF-UHFFFAOYSA-N ammonium dihydrogen phosphate Chemical compound [NH4+].OP(O)([O-])=O LFVGISIMTYGQHF-UHFFFAOYSA-N 0.000 description 3
- 229910000387 ammonium dihydrogen phosphate Inorganic materials 0.000 description 3
- 229910052796 boron Inorganic materials 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 238000004455 differential thermal analysis Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- XYIBRDXRRQCHLP-UHFFFAOYSA-N ethyl acetoacetate Chemical compound CCOC(=O)CC(C)=O XYIBRDXRRQCHLP-UHFFFAOYSA-N 0.000 description 3
- 229920001249 ethyl cellulose Polymers 0.000 description 3
- 235000019325 ethyl cellulose Nutrition 0.000 description 3
- 230000009477 glass transition Effects 0.000 description 3
- 239000001257 hydrogen Substances 0.000 description 3
- 229910052739 hydrogen Inorganic materials 0.000 description 3
- 235000019837 monoammonium phosphate Nutrition 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 description 3
- 239000010452 phosphate Substances 0.000 description 3
- XHXFXVLFKHQFAL-UHFFFAOYSA-N phosphoryl trichloride Chemical compound ClP(Cl)(Cl)=O XHXFXVLFKHQFAL-UHFFFAOYSA-N 0.000 description 3
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- 235000011121 sodium hydroxide Nutrition 0.000 description 3
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- YZWVMKLQNYGKLJ-UHFFFAOYSA-N 1-[2-[2-(2-ethoxyethoxy)ethoxy]ethoxy]-2-methoxyethane Chemical compound CCOCCOCCOCCOCCOC YZWVMKLQNYGKLJ-UHFFFAOYSA-N 0.000 description 1
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- WECDVJWNQLMVAZ-UHFFFAOYSA-N 1-[2-[2-(2-methoxyethoxy)ethoxy]ethoxy]hexane Chemical compound CCCCCCOCCOCCOCCOC WECDVJWNQLMVAZ-UHFFFAOYSA-N 0.000 description 1
- JVMKCHOJVQIXQN-UHFFFAOYSA-N 1-[2-[2-[2-(2-butoxypropoxy)propoxy]propoxy]propoxy]butane Chemical compound CCCCOCC(C)OCC(C)OCC(C)OCC(C)OCCCC JVMKCHOJVQIXQN-UHFFFAOYSA-N 0.000 description 1
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Images
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C8/00—Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
- C03C8/14—Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions
- C03C8/18—Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions containing free metals
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/22—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
- H01L21/2225—Diffusion sources
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/22—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
- H01L21/225—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities using diffusion into or out of a solid from or into a solid phase, e.g. a doped oxide layer
- H01L21/2251—Diffusion into or out of group IV semiconductors
- H01L21/2254—Diffusion into or out of group IV semiconductors from or through or into an applied layer, e.g. photoresist, nitrides
- H01L21/2255—Diffusion into or out of group IV semiconductors from or through or into an applied layer, e.g. photoresist, nitrides the applied layer comprising oxides only, e.g. P2O5, PSG, H3BO3, doped oxides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0216—Coatings
- H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/02167—Coatings for devices characterised by at least one potential jump barrier or surface barrier for solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/022425—Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1804—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic Table
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
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- Physics & Mathematics (AREA)
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- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Electromagnetism (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Sustainable Development (AREA)
- Organic Chemistry (AREA)
- Geochemistry & Mineralogy (AREA)
- General Chemical & Material Sciences (AREA)
- Sustainable Energy (AREA)
- Photovoltaic Devices (AREA)
- Glass Compositions (AREA)
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JPJP-P-2010-100224 | 2010-04-23 | ||
PCT/JP2011/059971 WO2011132779A1 (ja) | 2010-04-23 | 2011-04-22 | n型拡散層形成組成物、n型拡散層の製造方法、及び太陽電池素子の製造方法 |
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KR20130066614A KR20130066614A (ko) | 2013-06-20 |
KR101484833B1 true KR101484833B1 (ko) | 2015-01-21 |
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KR20127030147A KR101484833B1 (ko) | 2010-04-23 | 2011-04-22 | n 형 확산층 형성 조성물, n 형 확산층의 제조 방법, 및 태양 전지 소자의 제조 방법 |
KR1020147028552A KR20140129375A (ko) | 2010-04-23 | 2011-04-22 | n 형 확산층 형성 조성물, n 형 확산층의 제조 방법, 및 태양 전지 소자의 제조 방법 |
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KR1020147028552A KR20140129375A (ko) | 2010-04-23 | 2011-04-22 | n 형 확산층 형성 조성물, n 형 확산층의 제조 방법, 및 태양 전지 소자의 제조 방법 |
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JP (2) | JP5626339B2 (ja) |
KR (2) | KR101484833B1 (ja) |
CN (1) | CN102844841B (ja) |
TW (2) | TW201508821A (ja) |
WO (1) | WO2011132779A1 (ja) |
Families Citing this family (6)
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CN103839787A (zh) * | 2011-07-05 | 2014-06-04 | 日立化成株式会社 | n型扩散层形成用组合物、n型扩散层的制造方法以及太阳能电池元件的制造方法 |
JP5610100B2 (ja) * | 2012-02-29 | 2014-10-22 | 日立化成株式会社 | n型拡散層形成組成物、n型拡散層の製造方法、及び太陽電池セルの製造方法 |
KR20140092489A (ko) * | 2012-12-29 | 2014-07-24 | 제일모직주식회사 | 태양전지 전극 형성용 조성물 및 이로부터 제조된 전극 |
JP2014179360A (ja) * | 2013-03-13 | 2014-09-25 | Hitachi Chemical Co Ltd | n型拡散層形成組成物、n型拡散層を有する半導体基板の製造方法、及び太陽電池素子の製造方法 |
JP6379461B2 (ja) * | 2013-09-02 | 2018-08-29 | 日立化成株式会社 | p型拡散層を有するシリコン基板の製造方法、太陽電池素子の製造方法及び太陽電池素子 |
CN107146757A (zh) * | 2016-08-26 | 2017-09-08 | 扬州杰盈汽车芯片有限公司 | 一种喷雾式晶圆附磷工艺 |
Citations (3)
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JPH02162720A (ja) * | 1988-12-15 | 1990-06-22 | Sharp Corp | 半導体装置の製造方法 |
JPH04158514A (ja) * | 1990-10-22 | 1992-06-01 | Sumitomo Chem Co Ltd | 半導体基板への不純物拡散方法 |
JPH04174517A (ja) * | 1990-11-07 | 1992-06-22 | Canon Inc | ダイヤモンド半導体の製造方法 |
Family Cites Families (14)
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NL207969A (ja) * | 1955-06-28 | |||
US4800175A (en) * | 1987-05-29 | 1989-01-24 | Owens-Illinois Television Products Inc. | Phosphorous planar dopant source for low temperature applications |
US4891331A (en) * | 1988-01-21 | 1990-01-02 | Oi-Neg Tv Products, Inc. | Method for doping silicon wafers using Al2 O3 /P2 O5 composition |
JPH02177569A (ja) * | 1988-12-28 | 1990-07-10 | Sharp Corp | 太陽電池の製造方法 |
JP3380516B2 (ja) * | 1991-08-26 | 2003-02-24 | 株式会社半導体エネルギー研究所 | 半導体装置及びその作製方法 |
DE19910816A1 (de) * | 1999-03-11 | 2000-10-05 | Merck Patent Gmbh | Dotierpasten zur Erzeugung von p,p+ und n,n+ Bereichen in Halbleitern |
JP4726354B2 (ja) * | 2001-08-22 | 2011-07-20 | 東洋アルミニウム株式会社 | ペースト組成物およびそれを用いた太陽電池 |
JP4481869B2 (ja) * | 2005-04-26 | 2010-06-16 | 信越半導体株式会社 | 太陽電池の製造方法及び太陽電池並びに半導体装置の製造方法 |
US8575474B2 (en) * | 2006-03-20 | 2013-11-05 | Heracus Precious Metals North America Conshohocken LLC | Solar cell contacts containing aluminum and at least one of boron, titanium, nickel, tin, silver, gallium, zinc, indium and copper |
JP5710879B2 (ja) * | 2007-01-03 | 2015-04-30 | ナノグラム・コーポレイションNanoGram Corporation | シリコン/ゲルマニウムによるナノ粒子インク、ドーピングされた粒子、印刷法、及び半導体用途のためのプロセス |
US20090092745A1 (en) * | 2007-10-05 | 2009-04-09 | Luca Pavani | Dopant material for manufacturing solar cells |
JP2009117729A (ja) * | 2007-11-09 | 2009-05-28 | Nippon Electric Glass Co Ltd | ドーパントホストおよびその製造方法 |
WO2009060761A1 (ja) * | 2007-11-09 | 2009-05-14 | Nippon Electric Glass Co., Ltd. | ドーパントホストおよびその製造方法 |
JP5522900B2 (ja) * | 2008-02-22 | 2014-06-18 | 東京応化工業株式会社 | 電極形成用導電性組成物及び太陽電池の形成方法 |
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2011
- 2011-04-22 TW TW103135127A patent/TW201508821A/zh unknown
- 2011-04-22 KR KR20127030147A patent/KR101484833B1/ko not_active IP Right Cessation
- 2011-04-22 CN CN201180018421.1A patent/CN102844841B/zh not_active Expired - Fee Related
- 2011-04-22 KR KR1020147028552A patent/KR20140129375A/ko not_active Application Discontinuation
- 2011-04-22 JP JP2012511721A patent/JP5626339B2/ja not_active Expired - Fee Related
- 2011-04-22 TW TW100114097A patent/TWI499070B/zh not_active IP Right Cessation
- 2011-04-22 WO PCT/JP2011/059971 patent/WO2011132779A1/ja active Application Filing
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02162720A (ja) * | 1988-12-15 | 1990-06-22 | Sharp Corp | 半導体装置の製造方法 |
JPH04158514A (ja) * | 1990-10-22 | 1992-06-01 | Sumitomo Chem Co Ltd | 半導体基板への不純物拡散方法 |
JPH04174517A (ja) * | 1990-11-07 | 1992-06-22 | Canon Inc | ダイヤモンド半導体の製造方法 |
Also Published As
Publication number | Publication date |
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JPWO2011132779A1 (ja) | 2013-07-18 |
KR20130066614A (ko) | 2013-06-20 |
TW201201400A (en) | 2012-01-01 |
JP2014170939A (ja) | 2014-09-18 |
WO2011132779A1 (ja) | 2011-10-27 |
TWI499070B (zh) | 2015-09-01 |
JP5626339B2 (ja) | 2014-11-19 |
KR20140129375A (ko) | 2014-11-06 |
CN102844841A (zh) | 2012-12-26 |
TW201508821A (zh) | 2015-03-01 |
JP5958485B2 (ja) | 2016-08-02 |
CN102844841B (zh) | 2016-06-15 |
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