KR101322016B1 - 전자기 방출 이벤트 검출 및 측정 장치 - Google Patents

전자기 방출 이벤트 검출 및 측정 장치 Download PDF

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KR101322016B1
KR101322016B1 KR1020087005110A KR20087005110A KR101322016B1 KR 101322016 B1 KR101322016 B1 KR 101322016B1 KR 1020087005110 A KR1020087005110 A KR 1020087005110A KR 20087005110 A KR20087005110 A KR 20087005110A KR 101322016 B1 KR101322016 B1 KR 101322016B1
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South Korea
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signal
esd
event
input signal
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KR20080059152A (ko
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블라디미르 크라즈
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쓰리엠 이노베이티브 프로퍼티즈 컴파니
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/12—Measuring electrostatic fields or voltage-potential
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Testing Relating To Insulation (AREA)
  • Amplifiers (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Radar Systems Or Details Thereof (AREA)
KR1020087005110A 2005-09-06 2006-09-05 전자기 방출 이벤트 검출 및 측정 장치 Expired - Fee Related KR101322016B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/220,934 US7525316B2 (en) 2005-09-06 2005-09-06 Electrostatic discharge event and transient signal detection and measurement device and method
US11/220,934 2005-09-06
PCT/US2006/034609 WO2007030479A1 (en) 2005-09-06 2006-09-05 Electromagnetic emission event detection and measurement device

Publications (2)

Publication Number Publication Date
KR20080059152A KR20080059152A (ko) 2008-06-26
KR101322016B1 true KR101322016B1 (ko) 2013-10-25

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KR1020087005110A Expired - Fee Related KR101322016B1 (ko) 2005-09-06 2006-09-05 전자기 방출 이벤트 검출 및 측정 장치

Country Status (7)

Country Link
US (2) US7525316B2 (enExample)
EP (1) EP1922553A1 (enExample)
JP (2) JP5595659B2 (enExample)
KR (1) KR101322016B1 (enExample)
CN (2) CN101278202B (enExample)
SG (1) SG157373A1 (enExample)
WO (1) WO2007030479A1 (enExample)

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US8390970B2 (en) * 2010-10-27 2013-03-05 Infineon Technologies Ag Method and system for electrostatic discharge protection
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US8866629B2 (en) 2011-05-04 2014-10-21 International Business Machines Corporation Built-in automated electrostatic discharge monitor for computing units
KR101103673B1 (ko) * 2011-10-10 2012-01-11 박재은 정전기력 측정 장치
US8963552B2 (en) 2012-04-26 2015-02-24 3M Innovative Properties Company Electrostatic discharge event detector
US8963553B2 (en) 2012-10-26 2015-02-24 The Aerospace Corporation Systems and methods for use in determining hazardous charging conditions
TWI459011B (zh) * 2012-11-22 2014-11-01 Inst Information Industry 機台狀態判斷方法、系統及電腦可讀取記錄媒體
US9671448B2 (en) * 2012-12-28 2017-06-06 Illinois Tool Works Inc. In-tool ESD events monitoring method and apparatus
US11307235B2 (en) 2012-12-28 2022-04-19 Illinois Tool Works Inc. In-tool ESD events selective monitoring method and apparatus
CN103091583B (zh) * 2013-01-15 2015-02-04 中联重科股份有限公司 一种工程机械电磁兼容分析装置、系统、方法和工程机械
CN103267903A (zh) * 2013-04-24 2013-08-28 兰州空间技术物理研究所 一种卫星材料表面静电放电脉冲特性的测量装置和方法
CN103698666A (zh) * 2013-11-28 2014-04-02 兰州空间技术物理研究所 一种航天器静电放电脉冲在轨监测装置
US9562938B2 (en) * 2014-05-09 2017-02-07 Raytheon Company Method and system to detect and characterize electromagnetic pulses for the protection of critical infrastructure components
CN105158586A (zh) * 2015-09-11 2015-12-16 兰州空间技术物理研究所 主动式空间电场探测传感器内置电路
GB2546520B (en) * 2016-01-21 2022-04-06 Qinetiq Ltd Method for identifying an adverse EMI environment
TWI752076B (zh) * 2016-09-16 2022-01-11 美商伊利諾工具工程公司 工具內esd事件的選擇性監控方法及裝置
CN107239286A (zh) * 2017-06-05 2017-10-10 深圳联合净界科技有限公司 一种基于ESD‑IoT的安全管理系统
WO2019116470A1 (ja) * 2017-12-13 2019-06-20 三菱電機株式会社 ノイズ検出回路
CN108020698A (zh) * 2017-12-29 2018-05-11 江苏林洋能源股份有限公司 一种用于电能表防窃电的esd高压检测电路和方法
CN108474817B (zh) * 2018-02-22 2021-06-01 廖淑辉 微小信号检测装置及其检测方法
KR102801557B1 (ko) * 2018-03-20 2025-04-25 위스커 랩스 인코포레이티드 전기 배선에서 화재들에 선행하는 전기 방전들의 검출
US10641820B1 (en) * 2018-10-19 2020-05-05 Teradyne, Inc. Automated test equipment with relay hot-switch detection
WO2020141291A1 (en) * 2019-01-04 2020-07-09 The Secretary Of State For Defence Electromagnetic pulse detector and method of use
JP7279582B2 (ja) 2019-08-30 2023-05-23 セイコーエプソン株式会社 媒体搬送装置、画像読取装置および静電気検出回路
CN111650501B (zh) * 2020-03-04 2022-08-16 苏州热工研究院有限公司 一种无损在线评估继电器老化状态的试验装置
CN111537781B (zh) * 2020-05-07 2022-03-25 江永雄 一种检电器控制电路
CN111929517B (zh) * 2020-07-27 2024-07-30 常州明阳软件科技有限公司 消毒器工作时消毒因子实时检测方法及装置
JP7610835B2 (ja) 2021-03-29 2025-01-09 国立大学法人九州工業大学 検出装置及び放電検出システム
CN113985163B (zh) * 2021-10-15 2024-04-30 深圳市爱协生科技股份有限公司 Esd检测电路、集成电路及电子设备
EP4431951A1 (en) * 2023-03-15 2024-09-18 Honeywell International Inc. High voltage/frequency tamper detection circuit in utility meters
CN116298648B (zh) * 2023-05-12 2023-09-19 合肥联宝信息技术有限公司 一种静电路径的检测方法、装置及电子设备
US20250314685A1 (en) * 2024-04-05 2025-10-09 Honeywell International Inc. Detector and method for non-intrusively detecting electromagnetic interference

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US5903220A (en) * 1997-04-17 1999-05-11 Lucent Technologies Inc. Electrostatic discharge event detector
US6144341A (en) * 1997-08-18 2000-11-07 Credence Technologies, Inc. Electromagnetic emission location and measurement apparatus and method
US6563319B1 (en) * 1999-04-19 2003-05-13 Credence Technologies, Inc. Electrostatic discharges and transient signals monitoring system and method

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JPH05107339A (ja) * 1991-10-15 1993-04-27 Nec Corp 電波探知装置の信号処理方式
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US5903220A (en) * 1997-04-17 1999-05-11 Lucent Technologies Inc. Electrostatic discharge event detector
US6144341A (en) * 1997-08-18 2000-11-07 Credence Technologies, Inc. Electromagnetic emission location and measurement apparatus and method
US6563319B1 (en) * 1999-04-19 2003-05-13 Credence Technologies, Inc. Electrostatic discharges and transient signals monitoring system and method

Also Published As

Publication number Publication date
KR20080059152A (ko) 2008-06-26
JP2009507245A (ja) 2009-02-19
JP5595659B2 (ja) 2014-09-24
CN101278202B (zh) 2012-07-04
US20070052425A1 (en) 2007-03-08
US7525316B2 (en) 2009-04-28
US7795875B2 (en) 2010-09-14
CN102012469A (zh) 2011-04-13
SG157373A1 (en) 2009-12-29
EP1922553A1 (en) 2008-05-21
US20090167313A1 (en) 2009-07-02
CN101278202A (zh) 2008-10-01
WO2007030479A1 (en) 2007-03-15
JP2013152245A (ja) 2013-08-08

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