SG157373A1 - Electromagnetic emission event detection and measurement device - Google Patents
Electromagnetic emission event detection and measurement deviceInfo
- Publication number
- SG157373A1 SG157373A1 SG200907389-1A SG2009073891A SG157373A1 SG 157373 A1 SG157373 A1 SG 157373A1 SG 2009073891 A SG2009073891 A SG 2009073891A SG 157373 A1 SG157373 A1 SG 157373A1
- Authority
- SG
- Singapore
- Prior art keywords
- measurement device
- event detection
- electromagnetic emission
- emission event
- esd
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/12—Measuring electrostatic fields or voltage-potential
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Measurement Of Current Or Voltage (AREA)
- Testing Relating To Insulation (AREA)
- Amplifiers (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Radar Systems Or Details Thereof (AREA)
Abstract
An electrostatic discharge (ESD) event (40) and transient signal detection and measurement device (19) and method are described. The device (19) and method are able to distinguish between an ESD event (40) and other non-ESD events (50).
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/220,934 US7525316B2 (en) | 2005-09-06 | 2005-09-06 | Electrostatic discharge event and transient signal detection and measurement device and method |
Publications (1)
Publication Number | Publication Date |
---|---|
SG157373A1 true SG157373A1 (en) | 2009-12-29 |
Family
ID=37829478
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200907389-1A SG157373A1 (en) | 2005-09-06 | 2006-09-05 | Electromagnetic emission event detection and measurement device |
Country Status (7)
Country | Link |
---|---|
US (2) | US7525316B2 (en) |
EP (1) | EP1922553A1 (en) |
JP (2) | JP5595659B2 (en) |
KR (1) | KR101322016B1 (en) |
CN (2) | CN101278202B (en) |
SG (1) | SG157373A1 (en) |
WO (1) | WO2007030479A1 (en) |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100051502A1 (en) * | 2008-09-04 | 2010-03-04 | 3M Innovative Properties Company | Carrier having integral detection and measurement of environmental parameters |
DE102009048477A1 (en) * | 2009-10-07 | 2011-04-14 | Hella Kgaa Hueck & Co. | Method for detecting and locating electro-static discharges, particularly in electronic component, involves evaluating electro-static discharge as impulse in monitoring area, where impulse is detected in detection area |
US8970239B2 (en) * | 2010-09-27 | 2015-03-03 | International Business Machines Corporation | Methods and systems for detecting ESD events in cabled devices |
US8390970B2 (en) * | 2010-10-27 | 2013-03-05 | Infineon Technologies Ag | Method and system for electrostatic discharge protection |
CN102735910B (en) * | 2011-04-08 | 2014-10-29 | 中山大学 | Maximum peak voltage detection circuit |
US8866629B2 (en) | 2011-05-04 | 2014-10-21 | International Business Machines Corporation | Built-in automated electrostatic discharge monitor for computing units |
KR101103673B1 (en) * | 2011-10-10 | 2012-01-11 | 박재은 | Electrostatic force measuring device |
US8963552B2 (en) | 2012-04-26 | 2015-02-24 | 3M Innovative Properties Company | Electrostatic discharge event detector |
US8963553B2 (en) | 2012-10-26 | 2015-02-24 | The Aerospace Corporation | Systems and methods for use in determining hazardous charging conditions |
TWI459011B (en) * | 2012-11-22 | 2014-11-01 | Inst Information Industry | Method and system for determing status of machine and computer readable storage medium for storing the method |
US11307235B2 (en) | 2012-12-28 | 2022-04-19 | Illinois Tool Works Inc. | In-tool ESD events selective monitoring method and apparatus |
US9671448B2 (en) * | 2012-12-28 | 2017-06-06 | Illinois Tool Works Inc. | In-tool ESD events monitoring method and apparatus |
CN103091583B (en) * | 2013-01-15 | 2015-02-04 | 中联重科股份有限公司 | Engineering machinery electromagnetic compatibility analysis device, system and method and engineering machinery |
CN103267903A (en) * | 2013-04-24 | 2013-08-28 | 兰州空间技术物理研究所 | Device and method for measuring satellite material surface electrostatic discharge pulse characteristics |
CN103698666A (en) * | 2013-11-28 | 2014-04-02 | 兰州空间技术物理研究所 | On-orbit monitoring device for electrostatic discharge pulse of spacecraft |
US9562938B2 (en) * | 2014-05-09 | 2017-02-07 | Raytheon Company | Method and system to detect and characterize electromagnetic pulses for the protection of critical infrastructure components |
CN105158586A (en) * | 2015-09-11 | 2015-12-16 | 兰州空间技术物理研究所 | Active space electric field detection sensor built-in circuit |
GB2546520B (en) * | 2016-01-21 | 2022-04-06 | Qinetiq Ltd | Method for identifying an adverse EMI environment |
TWI752076B (en) * | 2016-09-16 | 2022-01-11 | 美商伊利諾工具工程公司 | In-tool esd events selective monitoring method and apparatus |
CN107239286A (en) * | 2017-06-05 | 2017-10-10 | 深圳联合净界科技有限公司 | A kind of safety management system based on ESD IoT |
JP6690868B2 (en) * | 2017-12-13 | 2020-04-28 | 三菱電機株式会社 | Noise detection circuit |
CN108020698A (en) * | 2017-12-29 | 2018-05-11 | 江苏林洋能源股份有限公司 | A kind of ESD high-voltage detecting circuits and method for electrical energy meter anti-theft electricity |
WO2019161525A1 (en) * | 2018-02-22 | 2019-08-29 | 廖淑辉 | Tiny signal detection device and method |
AU2019240071B2 (en) * | 2018-03-20 | 2024-05-30 | Whisker Labs, Inc. | Detection of electric discharges that precede fires in electrical wiring |
US10641820B1 (en) * | 2018-10-19 | 2020-05-05 | Teradyne, Inc. | Automated test equipment with relay hot-switch detection |
WO2020141291A1 (en) * | 2019-01-04 | 2020-07-09 | The Secretary Of State For Defence | Electromagnetic pulse detector and method of use |
JP7279582B2 (en) | 2019-08-30 | 2023-05-23 | セイコーエプソン株式会社 | Media transport device, image reader and static electricity detection circuit |
CN111650501B (en) * | 2020-03-04 | 2022-08-16 | 苏州热工研究院有限公司 | Testing device for nondestructive online evaluation of aging state of relay |
CN111537781B (en) * | 2020-05-07 | 2022-03-25 | 江永雄 | Control circuit of electric detector |
CN111929517B (en) * | 2020-07-27 | 2024-07-30 | 常州明阳软件科技有限公司 | Method and device for detecting disinfection factors in real time during operation of sterilizer |
CN113985163B (en) * | 2021-10-15 | 2024-04-30 | 深圳市爱协生科技股份有限公司 | ESD detection circuit, integrated circuit, and electronic device |
EP4431951A1 (en) * | 2023-03-15 | 2024-09-18 | Honeywell International Inc. | High voltage/frequency tamper detection circuit in utility meters |
CN116298648B (en) * | 2023-05-12 | 2023-09-19 | 合肥联宝信息技术有限公司 | Detection method and device for electrostatic paths and electronic equipment |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57139873U (en) * | 1981-02-26 | 1982-09-01 | ||
JPS5842977A (en) * | 1981-09-07 | 1983-03-12 | Nippon Univac Kk | High-frequency electromagnetic field detector |
CA2076488A1 (en) * | 1991-09-27 | 1993-03-28 | James A. Quinn | Continuous monitoring electrostatic discharge system |
JPH05107339A (en) * | 1991-10-15 | 1993-04-27 | Nec Corp | Signal processing method for radar |
US5315255A (en) * | 1992-07-16 | 1994-05-24 | Micron Technology, Inc. | Non-contact, electrostatic, discharge detector |
JPH07311233A (en) * | 1994-05-18 | 1995-11-28 | Tokin Corp | Electromagnetic-wave measuring and recording device, and operation diagnostic system for electric equipment using the device |
US5719502A (en) * | 1996-01-17 | 1998-02-17 | Noux Corporation | ESD monitoring circuit and device |
JPH1012691A (en) * | 1996-06-19 | 1998-01-16 | Mitsubishi Electric Corp | Device for detecting discharge and its method |
JPH10122897A (en) * | 1996-10-22 | 1998-05-15 | Rix Corp | Generating method of judgment waveform |
US5903220A (en) * | 1997-04-17 | 1999-05-11 | Lucent Technologies Inc. | Electrostatic discharge event detector |
US5923160A (en) * | 1997-04-19 | 1999-07-13 | Lucent Technologies, Inc. | Electrostatic discharge event locators |
US6144341A (en) * | 1997-08-18 | 2000-11-07 | Credence Technologies, Inc. | Electromagnetic emission location and measurement apparatus and method |
US6563319B1 (en) * | 1999-04-19 | 2003-05-13 | Credence Technologies, Inc. | Electrostatic discharges and transient signals monitoring system and method |
JP2001242212A (en) * | 2000-03-02 | 2001-09-07 | Mitsubishi Electric Corp | Kind determination method and device of partial discharge of gas insulated electrical machinery and apparatus |
JP4089953B2 (en) * | 2002-08-22 | 2008-05-28 | 日置電機株式会社 | Waveform judgment determination device and waveform judgment area setting method |
US7181169B2 (en) * | 2003-02-15 | 2007-02-20 | Lg Electronics Inc. | Controlling apparatus and method of mobile communication terminal using electrostatic detection |
DE10339924B4 (en) * | 2003-08-29 | 2011-05-05 | Infineon Technologies Ag | ESD test arrangement and method |
-
2005
- 2005-09-06 US US11/220,934 patent/US7525316B2/en active Active
-
2006
- 2006-09-05 CN CN2006800325948A patent/CN101278202B/en not_active Expired - Fee Related
- 2006-09-05 KR KR1020087005110A patent/KR101322016B1/en not_active IP Right Cessation
- 2006-09-05 WO PCT/US2006/034609 patent/WO2007030479A1/en active Application Filing
- 2006-09-05 SG SG200907389-1A patent/SG157373A1/en unknown
- 2006-09-05 JP JP2008530146A patent/JP5595659B2/en active Active
- 2006-09-05 EP EP06790174A patent/EP1922553A1/en not_active Withdrawn
- 2006-09-05 CN CN201010254902XA patent/CN102012469A/en active Pending
-
2009
- 2009-03-13 US US12/403,514 patent/US7795875B2/en active Active
-
2013
- 2013-04-04 JP JP2013078950A patent/JP2013152245A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
US20070052425A1 (en) | 2007-03-08 |
CN101278202B (en) | 2012-07-04 |
US7795875B2 (en) | 2010-09-14 |
JP5595659B2 (en) | 2014-09-24 |
CN101278202A (en) | 2008-10-01 |
WO2007030479A1 (en) | 2007-03-15 |
JP2013152245A (en) | 2013-08-08 |
US7525316B2 (en) | 2009-04-28 |
EP1922553A1 (en) | 2008-05-21 |
JP2009507245A (en) | 2009-02-19 |
KR101322016B1 (en) | 2013-10-25 |
US20090167313A1 (en) | 2009-07-02 |
KR20080059152A (en) | 2008-06-26 |
CN102012469A (en) | 2011-04-13 |
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