KR101269660B1 - 패널 검사 장치 및 이를 이용한 패널 검사 방법 - Google Patents

패널 검사 장치 및 이를 이용한 패널 검사 방법 Download PDF

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Publication number
KR101269660B1
KR101269660B1 KR1020060097961A KR20060097961A KR101269660B1 KR 101269660 B1 KR101269660 B1 KR 101269660B1 KR 1020060097961 A KR1020060097961 A KR 1020060097961A KR 20060097961 A KR20060097961 A KR 20060097961A KR 101269660 B1 KR101269660 B1 KR 101269660B1
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KR
South Korea
Prior art keywords
circuit board
panel
contact
delete delete
inspection
Prior art date
Application number
KR1020060097961A
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English (en)
Korean (ko)
Other versions
KR20080032342A (ko
Inventor
백민수
전병태
배진석
이지윤
신수환
Original Assignee
삼성디스플레이 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 삼성디스플레이 주식회사 filed Critical 삼성디스플레이 주식회사
Priority to KR1020060097961A priority Critical patent/KR101269660B1/ko
Priority to TW096124166A priority patent/TWI403739B/zh
Priority to CN2007101358199A priority patent/CN101162298B/zh
Publication of KR20080032342A publication Critical patent/KR20080032342A/ko
Application granted granted Critical
Publication of KR101269660B1 publication Critical patent/KR101269660B1/ko

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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/08—Treatments involving gases
    • H05K2203/081—Blowing of gas, e.g. for cooling or for providing heat during solder reflowing
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/08—Treatments involving gases
    • H05K2203/082—Suction, e.g. for holding solder balls or components

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Liquid Crystal (AREA)
KR1020060097961A 2006-10-09 2006-10-09 패널 검사 장치 및 이를 이용한 패널 검사 방법 KR101269660B1 (ko)

Priority Applications (3)

Application Number Priority Date Filing Date Title
KR1020060097961A KR101269660B1 (ko) 2006-10-09 2006-10-09 패널 검사 장치 및 이를 이용한 패널 검사 방법
TW096124166A TWI403739B (zh) 2006-10-09 2007-07-03 面板檢測裝置及方法
CN2007101358199A CN101162298B (zh) 2006-10-09 2007-07-16 面板检查装置及方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020060097961A KR101269660B1 (ko) 2006-10-09 2006-10-09 패널 검사 장치 및 이를 이용한 패널 검사 방법

Publications (2)

Publication Number Publication Date
KR20080032342A KR20080032342A (ko) 2008-04-15
KR101269660B1 true KR101269660B1 (ko) 2013-05-30

Family

ID=39297247

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020060097961A KR101269660B1 (ko) 2006-10-09 2006-10-09 패널 검사 장치 및 이를 이용한 패널 검사 방법

Country Status (3)

Country Link
KR (1) KR101269660B1 (zh)
CN (1) CN101162298B (zh)
TW (1) TWI403739B (zh)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101121433B1 (ko) * 2009-11-04 2012-03-16 엘아이지에이디피 주식회사 기판검사장치
CN103048608A (zh) * 2012-12-19 2013-04-17 昆山迈致治具科技有限公司 一种pcb板性能检测治具
CN105527464B (zh) * 2014-09-28 2018-10-30 深圳市诚信佳美科技有限公司 一种面板测试点定位方法、装置和测试面板的方法、系统
CN104391387B (zh) * 2014-11-20 2017-04-26 北京兆维电子(集团)有限责任公司 应用于测试治具的连接器导通结构
CN104460064B (zh) * 2014-12-25 2017-11-03 昆山精讯电子技术有限公司 一种液晶模组的自动光学检测机构
KR101654307B1 (ko) * 2015-10-20 2016-09-09 하태성 화질 검사용 디스플레이 패널의 연성인쇄회로기판 자동접촉장치
KR101957199B1 (ko) * 2017-01-23 2019-03-13 (주)다람기술 검사장치
KR102045506B1 (ko) * 2018-06-25 2019-11-18 주식회사에이치티엔씨 미세 피치 회로 검사 장치
CN109283414B (zh) * 2018-11-12 2021-01-26 京东方科技集团股份有限公司 一种显示面板、点灯检测装置及其控制方法
KR101979749B1 (ko) * 2018-12-19 2019-05-17 주식회사 케이엔케이 연성회로기판 검사 장치
KR102140498B1 (ko) * 2019-12-30 2020-08-03 남현우 패널 검사장치
KR20220002101U (ko) 2022-08-11 2022-08-30 최은희 수목지지대안전판

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000097670A (ja) * 1998-09-28 2000-04-07 Olympus Optical Co Ltd プリント基板の外観検査装置
KR100538796B1 (ko) * 2005-02-04 2005-12-26 주식회사 영우디에스피 액정표시장치의 기판 모듈 검사장치

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1235056C (zh) * 2000-05-19 2006-01-04 Oht株式会社 电路基板导通检查装置、导通检查方法及导通检查用夹具
DE10025751A1 (de) * 2000-05-24 2001-12-06 Atg Test Systems Gmbh Verfahren zum Untersuchen einer leiterplatte an einem vorbestimmten Bereich der Leiterplatte und Vorrichtung zum Durchführen des Verfahrens
CN1184486C (zh) * 2001-12-21 2005-01-12 瀚宇彩晶股份有限公司 电子产品电路讯号定位检测系统及其方法
JP2003308051A (ja) * 2002-04-16 2003-10-31 Seiko Epson Corp 画像信号供給回路および電気光学パネル
WO2004049429A1 (en) * 2002-11-22 2004-06-10 Phicom Corporation Probe for testing flat panel display and manufacturing method thereof
KR100610803B1 (ko) * 2005-01-05 2006-08-08 주식회사인테크전자 반도체 소자 검침용 프로브 카드와 그 제조 방법

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000097670A (ja) * 1998-09-28 2000-04-07 Olympus Optical Co Ltd プリント基板の外観検査装置
KR100538796B1 (ko) * 2005-02-04 2005-12-26 주식회사 영우디에스피 액정표시장치의 기판 모듈 검사장치

Also Published As

Publication number Publication date
TWI403739B (zh) 2013-08-01
KR20080032342A (ko) 2008-04-15
TW200817699A (en) 2008-04-16
CN101162298A (zh) 2008-04-16
CN101162298B (zh) 2012-06-20

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