KR101063774B1 - 멀티 프로브 유니트 - Google Patents

멀티 프로브 유니트 Download PDF

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Publication number
KR101063774B1
KR101063774B1 KR1020090079667A KR20090079667A KR101063774B1 KR 101063774 B1 KR101063774 B1 KR 101063774B1 KR 1020090079667 A KR1020090079667 A KR 1020090079667A KR 20090079667 A KR20090079667 A KR 20090079667A KR 101063774 B1 KR101063774 B1 KR 101063774B1
Authority
KR
South Korea
Prior art keywords
bracket
moving
base plate
lcd
probe
Prior art date
Application number
KR1020090079667A
Other languages
English (en)
Korean (ko)
Other versions
KR20110022202A (ko
Inventor
이상용
박현상
Original Assignee
(주)유비프리시젼
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by (주)유비프리시젼 filed Critical (주)유비프리시젼
Priority to KR1020090079667A priority Critical patent/KR101063774B1/ko
Priority to CN2009101784299A priority patent/CN101995679B/zh
Publication of KR20110022202A publication Critical patent/KR20110022202A/ko
Application granted granted Critical
Publication of KR101063774B1 publication Critical patent/KR101063774B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
KR1020090079667A 2009-08-27 2009-08-27 멀티 프로브 유니트 KR101063774B1 (ko)

Priority Applications (2)

Application Number Priority Date Filing Date Title
KR1020090079667A KR101063774B1 (ko) 2009-08-27 2009-08-27 멀티 프로브 유니트
CN2009101784299A CN101995679B (zh) 2009-08-27 2009-09-24 多探头单元

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020090079667A KR101063774B1 (ko) 2009-08-27 2009-08-27 멀티 프로브 유니트

Publications (2)

Publication Number Publication Date
KR20110022202A KR20110022202A (ko) 2011-03-07
KR101063774B1 true KR101063774B1 (ko) 2011-09-08

Family

ID=43786039

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020090079667A KR101063774B1 (ko) 2009-08-27 2009-08-27 멀티 프로브 유니트

Country Status (2)

Country Link
KR (1) KR101063774B1 (zh)
CN (1) CN101995679B (zh)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101332160B1 (ko) * 2012-07-25 2013-11-21 한국항공우주연구원 이엠씨 측정용 프로브 거치대
US8970245B2 (en) 2012-09-26 2015-03-03 Shenzhen China Star Optoelectronics Technology Co., Ltd. Probing device for TFT-LCD substrate
CN102929005B (zh) * 2012-09-26 2016-03-30 深圳市华星光电技术有限公司 Tft-lcd基板的探测装置
CN104614878A (zh) * 2013-11-04 2015-05-13 北京兆维电子(集团)有限责任公司 一种液晶屏检测系统
CN104715705B (zh) * 2015-03-30 2017-04-19 深圳市华星光电技术有限公司 一种用于液晶显示面板的检测装置
JP2017003484A (ja) * 2015-06-12 2017-01-05 株式会社ジャパンディスプレイ 表示装置の検査装置、表示装置用マザー基板の検査方法、及び、表示装置
CN110153748B (zh) * 2019-06-18 2020-10-20 河南理工大学 一种机械加工用辅助定位装置
KR102157311B1 (ko) * 2020-03-03 2020-10-23 주식회사 프로이천 캠승강식 오토 프로브장치
CN111710749B (zh) * 2020-04-23 2022-09-09 中国科学院上海技术物理研究所 基于多基板二次拼接的长线列探测器拼接结构及实现方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100870152B1 (ko) * 2008-04-07 2008-11-24 (주)유비프리시젼 Ｌｃｄ 검사 장비용 프로브 유니트의 자동 변경 장치

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100673795B1 (ko) * 2004-12-17 2007-01-24 주식회사 디이엔티 평판 표시패널 검사장치
CN100547633C (zh) * 2007-08-29 2009-10-07 浙江大学 用于检测显示屏光色性能的龙门式四维自动测量台
CN201130281Y (zh) * 2007-11-27 2008-10-08 均豪精密工业股份有限公司 平面显示器面板坏点定位检测机构

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100870152B1 (ko) * 2008-04-07 2008-11-24 (주)유비프리시젼 Ｌｃｄ 검사 장비용 프로브 유니트의 자동 변경 장치

Also Published As

Publication number Publication date
CN101995679B (zh) 2013-01-09
KR20110022202A (ko) 2011-03-07
CN101995679A (zh) 2011-03-30

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