KR100941062B1 - 역 공간 광학 설계를 사용한 이미지 형성 시스템 및 방법 - Google Patents

역 공간 광학 설계를 사용한 이미지 형성 시스템 및 방법 Download PDF

Info

Publication number
KR100941062B1
KR100941062B1 KR1020047000181A KR20047000181A KR100941062B1 KR 100941062 B1 KR100941062 B1 KR 100941062B1 KR 1020047000181 A KR1020047000181 A KR 1020047000181A KR 20047000181 A KR20047000181 A KR 20047000181A KR 100941062 B1 KR100941062 B1 KR 100941062B1
Authority
KR
South Korea
Prior art keywords
image
sensor
image forming
size
optical
Prior art date
Application number
KR1020047000181A
Other languages
English (en)
Korean (ko)
Other versions
KR20040031769A (ko
Inventor
앤드류 지. 카트리지
호워드 페인
Original Assignee
팔란티르 리서치, 엘엘씨
앙코르 테크놀러지, 엘엘피
아민, 하이맨슈 에스.
보트닉, 다니엘 비.
투로시, 그레고리
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/900,218 external-priority patent/US6664528B1/en
Priority claimed from US10/166,137 external-priority patent/US6884983B2/en
Priority claimed from US10/189,326 external-priority patent/US7132636B1/en
Application filed by 팔란티르 리서치, 엘엘씨, 앙코르 테크놀러지, 엘엘피, 아민, 하이맨슈 에스., 보트닉, 다니엘 비., 투로시, 그레고리 filed Critical 팔란티르 리서치, 엘엘씨
Priority claimed from PCT/US2002/021392 external-priority patent/WO2003005446A1/en
Publication of KR20040031769A publication Critical patent/KR20040031769A/ko
Application granted granted Critical
Publication of KR100941062B1 publication Critical patent/KR100941062B1/ko

Links

Images

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/40Optical focusing aids
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/58Optics for apodization or superresolution; Optical synthetic aperture systems
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • G02B21/08Condensers
    • G02B21/082Condensers for incident illumination only
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • G02B21/08Condensers
    • G02B21/086Condensers for transillumination only
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/36Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361Optical details, e.g. image relay to the camera or image sensor
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0075Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 with means for altering, e.g. increasing, the depth of field or depth of focus

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Studio Devices (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Holo Graphy (AREA)
  • Image Input (AREA)
  • Lenses (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
KR1020047000181A 2001-07-06 2002-07-03 역 공간 광학 설계를 사용한 이미지 형성 시스템 및 방법 KR100941062B1 (ko)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
US09/900,218 2001-07-06
US09/900,218 US6664528B1 (en) 2001-07-06 2001-07-06 Imaging system and methodology employing reciprocal space optical design
US10/000,000 2002-01-07
US10/166,137 2002-06-10
US10/166,137 US6884983B2 (en) 2002-06-10 2002-06-10 Imaging system for examining biological material
US10/189,326 US7132636B1 (en) 2001-07-06 2002-07-02 Imaging system and methodology employing reciprocal space optical design
PCT/US2002/021392 WO2003005446A1 (en) 2001-07-06 2002-07-03 Imaging system and methodology employing reciprocal space optical design

Publications (2)

Publication Number Publication Date
KR20040031769A KR20040031769A (ko) 2004-04-13
KR100941062B1 true KR100941062B1 (ko) 2010-02-05

Family

ID=31998992

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020047000181A KR100941062B1 (ko) 2001-07-06 2002-07-03 역 공간 광학 설계를 사용한 이미지 형성 시스템 및 방법

Country Status (10)

Country Link
EP (1) EP1405346A4 (xx)
JP (2) JP2005534946A (xx)
KR (1) KR100941062B1 (xx)
CN (1) CN100477734C (xx)
AU (1) AU2002322410B8 (xx)
BR (1) BR0210852A (xx)
CA (1) CA2453049C (xx)
IL (2) IL159700A0 (xx)
MX (1) MXPA04000167A (xx)
NZ (1) NZ530988A (xx)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101887523B1 (ko) * 2017-04-05 2018-08-10 경북대학교 산학협력단 현미경을 이용한 국소 면적의 스펙트럼 측정 시스템
KR101887527B1 (ko) * 2017-04-05 2018-08-10 경북대학교 산학협력단 풀컬러 홀로그램의 스펙트럼 측정 장치 및 그 방법

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58102538A (ja) * 1981-12-14 1983-06-18 Fujitsu Ltd 半導体装置の製造方法
JP4907816B2 (ja) 1999-11-05 2012-04-04 ライシオ ベネコール オサケユイチア 食用脂配合物
US7630065B2 (en) 2005-02-21 2009-12-08 Olympus Corporation Low-light specimen image pickup unit and low-light specimen image pickup apparatus
JP2009043139A (ja) 2007-08-10 2009-02-26 Mitsubishi Electric Corp 位置検出装置
US7782452B2 (en) * 2007-08-31 2010-08-24 Kla-Tencor Technologies Corp. Systems and method for simultaneously inspecting a specimen with two distinct channels
JP5693228B2 (ja) * 2007-11-14 2015-04-01 バイオセンサーズ インターナショナル グループ、リミテッド 自動被覆装置および方法
JP2010117705A (ja) * 2008-10-14 2010-05-27 Olympus Corp バーチャルスライド作成システム用顕微鏡
ES2623375T3 (es) * 2009-10-20 2017-07-11 The Regents Of The University Of California Holografía y microscopia celular incoherente sin lente en un chip
CN102053051A (zh) * 2009-10-30 2011-05-11 西门子公司 一种体液分析系统和用于体液分析的图像处理设备、方法
KR101832526B1 (ko) * 2010-08-05 2018-04-13 오르보테크 엘티디. 조명 시스템
JP5784393B2 (ja) * 2011-07-11 2015-09-24 オリンパス株式会社 標本観察装置
DE102011055945A1 (de) * 2011-12-01 2013-06-06 Leica Microsystems Cms Gmbh Verfahren und Vorrichtung zum Untersuchen einer Probe
CN102661715A (zh) * 2012-06-08 2012-09-12 苏州富鑫林光电科技有限公司 Ccd式的间隙测量系统及方法
EP3523054A4 (en) 2016-10-04 2020-06-03 The Regents of The University of California MULTI-FREQUENCY HARMONIC ACOUSTOGRAPHY FOR TARGET IDENTIFICATION AND BOUNDARY DETECTION
EP3320829A1 (en) * 2016-11-10 2018-05-16 E-Health Technical Solutions, S.L. System for integrally measuring clinical parameters of visual function
EP3603477A4 (en) 2017-03-28 2020-02-05 FUJIFILM Corporation MEASUREMENT SUPPORT DEVICE, ENDOSCOPIC SYSTEM AND PROCESSOR
EP3603478A4 (en) 2017-03-28 2020-02-05 FUJIFILM Corporation MEASURING ASSISTANCE DEVICE, ENDOSCOPE SYSTEM AND PROCESSOR
DE112018003311T5 (de) * 2017-06-29 2020-03-26 Sony Corporation System, verfahren und computerprogramm für medizinische bildgebung
US11380438B2 (en) 2017-09-27 2022-07-05 Honeywell International Inc. Respiration-vocalization data collection system for air quality determination
WO2019089998A1 (en) * 2017-11-01 2019-05-09 The Regents Of The University Of California Imaging method and system for intraoperative surgical margin assessment
CN108197560B (zh) * 2017-12-28 2022-06-07 努比亚技术有限公司 人脸图像识别方法、移动终端及计算机可读存储介质
US20190200906A1 (en) * 2017-12-28 2019-07-04 Ethicon Llc Dual cmos array imaging
CN111198192B (zh) * 2018-11-20 2022-02-15 深圳中科飞测科技股份有限公司 检测装置及检测方法
CN111988499B (zh) * 2019-05-22 2022-03-15 印象认知(北京)科技有限公司 成像层、成像装置、电子设备、波带片结构及感光像元
US10876949B2 (en) 2019-04-26 2020-12-29 Honeywell International Inc. Flow device and associated method and system
FR3098930B1 (fr) * 2019-07-18 2023-04-28 Univ Versailles Saint Quentin En Yvelines Dispositif d’observation d’une cellule ou d’un ensemble de cellules vivantes
CN110440853B (zh) * 2019-07-24 2024-05-17 沈阳工程学院 一种监控除尘系统
CN112782175A (zh) * 2019-11-11 2021-05-11 深圳中科飞测科技股份有限公司 一种检测设备及检测方法
US11391613B2 (en) 2020-02-14 2022-07-19 Honeywell International Inc. Fluid composition sensor device and method of using the same
US11835432B2 (en) 2020-10-26 2023-12-05 Honeywell International Inc. Fluid composition sensor device and method of using the same
CN113155755B (zh) * 2021-03-31 2022-05-24 中国科学院长春光学精密机械与物理研究所 微透镜阵列型成像光谱仪在线标定方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050198653A1 (en) * 2004-03-03 2005-09-08 Asustek Computer Inc. Optical disk drive with anti-tilt tray mechanism

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4410804A (en) * 1981-07-13 1983-10-18 Honeywell Inc. Two dimensional image panel with range measurement capability
US4806774A (en) * 1987-06-08 1989-02-21 Insystems, Inc. Inspection system for array of microcircuit dies having redundant circuit patterns
JPH01154016A (ja) * 1987-12-10 1989-06-16 Nikon Corp 顕微鏡
JP3245882B2 (ja) * 1990-10-24 2002-01-15 株式会社日立製作所 パターン形成方法、および投影露光装置
JPH0695001A (ja) * 1992-09-11 1994-04-08 Nikon Corp 顕微鏡装置
JPH0772377A (ja) * 1993-06-14 1995-03-17 Nikon Corp 顕微鏡自動焦点装置
JPH08160303A (ja) * 1994-12-02 1996-06-21 Olympus Optical Co Ltd 物体観察装置
JP3123457B2 (ja) * 1996-05-13 2001-01-09 株式会社ニコン 顕微鏡
US6016210A (en) * 1997-12-15 2000-01-18 Northrop Grumman Corporation Scatter noise reduction in holographic storage systems by speckle averaging
EP1203256A1 (en) * 1999-07-09 2002-05-08 Cellavision AB Microscope filter for automatic contrast enhancement
EP1096295A1 (en) * 1999-10-28 2001-05-02 Itt Manufacturing Enterprises, Inc. Apparatus and method for providing optical sensors with improved resolution

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050198653A1 (en) * 2004-03-03 2005-09-08 Asustek Computer Inc. Optical disk drive with anti-tilt tray mechanism

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101887523B1 (ko) * 2017-04-05 2018-08-10 경북대학교 산학협력단 현미경을 이용한 국소 면적의 스펙트럼 측정 시스템
KR101887527B1 (ko) * 2017-04-05 2018-08-10 경북대학교 산학협력단 풀컬러 홀로그램의 스펙트럼 측정 장치 및 그 방법

Also Published As

Publication number Publication date
JP2005534946A (ja) 2005-11-17
AU2002322410B8 (en) 2008-05-01
CA2453049C (en) 2011-10-25
CN1550039A (zh) 2004-11-24
AU2002322410B2 (en) 2008-02-07
IL159700A0 (en) 2004-06-20
KR20040031769A (ko) 2004-04-13
NZ530988A (en) 2006-09-29
IL159700A (en) 2010-12-30
MXPA04000167A (es) 2005-06-06
JP2009258746A (ja) 2009-11-05
BR0210852A (pt) 2004-08-24
CN100477734C (zh) 2009-04-08
CA2453049A1 (en) 2003-01-16
EP1405346A1 (en) 2004-04-07
EP1405346A4 (en) 2008-11-05

Similar Documents

Publication Publication Date Title
KR100941062B1 (ko) 역 공간 광학 설계를 사용한 이미지 형성 시스템 및 방법
US7692131B2 (en) Imaging system and methodology with projected pixels mapped to the diffraction limited spot
US7338168B2 (en) Particle analyzing system and methodology
US7863552B2 (en) Digital images and related methodologies
US7248716B2 (en) Imaging system, methodology, and applications employing reciprocal space optical design
AU2002322410A1 (en) Imaging system and methodology employing reciprocal space optical design
ZA200400961B (en) Imaging system and methodology employing reciprocal space optical design.
US7109464B2 (en) Semiconductor imaging system and related methodology
US6998596B2 (en) Imaging system for examining biological material
EP1530073B1 (en) Optical projection tomography apparatus with rotary stage for imaging a specimen
US20110009163A1 (en) High numerical aperture telemicroscopy apparatus
CN102472703A (zh) 体液分析系统以及用于分析体液的图像处理设备和方法
US20210217190A1 (en) Analyzer for three-dimensionally analyzing a medical sample by means of a light field camera
CN111220590A (zh) 病原微生物药敏的快速检测仪器及检测方法
CN111105415A (zh) 一种基于深度学习的白细胞大视场图像检测系统及方法
CN110118758A (zh) 一种散射荧光双模态流式成像系统
US7132636B1 (en) Imaging system and methodology employing reciprocal space optical design
WO2005114291A1 (en) Method and apparatus for detecting microscopic objects
CN108700520A (zh) 用于高吞吐量成像的方法和设备
WO2003005446A1 (en) Imaging system and methodology employing reciprocal space optical design
CN209961688U (zh) 病原微生物药敏的快速检测仪器
US20230070475A1 (en) System and method for parallelized volumetric microscope imaging
Khoubafarin et al. Advances in Lensless Fluorescence Microscopy Design
Kawano et al. Darkfield Adapter for Whole Slide Imaging: Adapting a Darkfield Internal Reflection

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20130201

Year of fee payment: 4

FPAY Annual fee payment

Payment date: 20140204

Year of fee payment: 5

LAPS Lapse due to unpaid annual fee