EP1405346A4 - PICTURE SYSTEM AND METHODOLOGY WITH A REZIPROK ROOM OPTICS DESIGN - Google Patents

PICTURE SYSTEM AND METHODOLOGY WITH A REZIPROK ROOM OPTICS DESIGN

Info

Publication number
EP1405346A4
EP1405346A4 EP02756399A EP02756399A EP1405346A4 EP 1405346 A4 EP1405346 A4 EP 1405346A4 EP 02756399 A EP02756399 A EP 02756399A EP 02756399 A EP02756399 A EP 02756399A EP 1405346 A4 EP1405346 A4 EP 1405346A4
Authority
EP
European Patent Office
Prior art keywords
imaging system
optical design
space optical
reciprocal space
methodology employing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP02756399A
Other languages
German (de)
English (en)
French (fr)
Other versions
EP1405346A1 (en
Inventor
Andrew G Cartlidge
Howard Fein
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Angkor Tech LLP
Palantyr Res LLC
Original Assignee
Angkor Tech LLP
Palantyr Res LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/900,218 external-priority patent/US6664528B1/en
Priority claimed from US10/166,137 external-priority patent/US6884983B2/en
Priority claimed from US10/189,326 external-priority patent/US7132636B1/en
Application filed by Angkor Tech LLP, Palantyr Res LLC filed Critical Angkor Tech LLP
Priority claimed from PCT/US2002/021392 external-priority patent/WO2003005446A1/en
Publication of EP1405346A1 publication Critical patent/EP1405346A1/en
Publication of EP1405346A4 publication Critical patent/EP1405346A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/58—Optics for apodization or superresolution; Optical synthetic aperture systems
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/40—Optical focusing aids
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/082—Condensers for incident illumination only
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/086—Condensers for transillumination only
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0075—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 with means for altering, e.g. increasing, the depth of field or depth of focus

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Multimedia (AREA)
  • Engineering & Computer Science (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Studio Devices (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Image Input (AREA)
  • Lenses (AREA)
  • Holo Graphy (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
EP02756399A 2001-07-06 2002-07-03 PICTURE SYSTEM AND METHODOLOGY WITH A REZIPROK ROOM OPTICS DESIGN Withdrawn EP1405346A4 (en)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
US09/900,218 US6664528B1 (en) 2001-07-06 2001-07-06 Imaging system and methodology employing reciprocal space optical design
US900218 2001-07-06
US166137 2002-06-10
US10/166,137 US6884983B2 (en) 2002-06-10 2002-06-10 Imaging system for examining biological material
US10/189,326 US7132636B1 (en) 2001-07-06 2002-07-02 Imaging system and methodology employing reciprocal space optical design
US189326 2002-07-02
PCT/US2002/021392 WO2003005446A1 (en) 2001-07-06 2002-07-03 Imaging system and methodology employing reciprocal space optical design

Publications (2)

Publication Number Publication Date
EP1405346A1 EP1405346A1 (en) 2004-04-07
EP1405346A4 true EP1405346A4 (en) 2008-11-05

Family

ID=31998992

Family Applications (1)

Application Number Title Priority Date Filing Date
EP02756399A Withdrawn EP1405346A4 (en) 2001-07-06 2002-07-03 PICTURE SYSTEM AND METHODOLOGY WITH A REZIPROK ROOM OPTICS DESIGN

Country Status (10)

Country Link
EP (1) EP1405346A4 (xx)
JP (2) JP2005534946A (xx)
KR (1) KR100941062B1 (xx)
CN (1) CN100477734C (xx)
AU (1) AU2002322410B8 (xx)
BR (1) BR0210852A (xx)
CA (1) CA2453049C (xx)
IL (2) IL159700A0 (xx)
MX (1) MXPA04000167A (xx)
NZ (1) NZ530988A (xx)

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JPS58102538A (ja) * 1981-12-14 1983-06-18 Fujitsu Ltd 半導体装置の製造方法
ES2213058T3 (es) 1999-11-05 2004-08-16 Raisio Benecol Oy Mezclas de grasas comestibles.
EP2594983A1 (en) 2005-02-21 2013-05-22 Olympus Corporation Low-light specimen image pickup unit and low-light specimen image pickup apparatus
JP2009043139A (ja) * 2007-08-10 2009-02-26 Mitsubishi Electric Corp 位置検出装置
US7782452B2 (en) * 2007-08-31 2010-08-24 Kla-Tencor Technologies Corp. Systems and method for simultaneously inspecting a specimen with two distinct channels
JP5693228B2 (ja) 2007-11-14 2015-04-01 バイオセンサーズ インターナショナル グループ、リミテッド 自動被覆装置および方法
JP2010117705A (ja) * 2008-10-14 2010-05-27 Olympus Corp バーチャルスライド作成システム用顕微鏡
EP2491366B1 (en) * 2009-10-20 2016-12-28 The Regents of The University of California Incoherent lensfree cell holography and microscopy on a chip
CN102053051A (zh) * 2009-10-30 2011-05-11 西门子公司 一种体液分析系统和用于体液分析的图像处理设备、方法
WO2012017431A1 (en) * 2010-08-05 2012-02-09 Orbotech Ltd. Lighting system
JP5784393B2 (ja) * 2011-07-11 2015-09-24 オリンパス株式会社 標本観察装置
DE102011055945A1 (de) * 2011-12-01 2013-06-06 Leica Microsystems Cms Gmbh Verfahren und Vorrichtung zum Untersuchen einer Probe
CN102661715A (zh) * 2012-06-08 2012-09-12 苏州富鑫林光电科技有限公司 Ccd式的间隙测量系统及方法
WO2018067355A1 (en) 2016-10-04 2018-04-12 The Regents Of The University Of California Multi-frequency harmonic acoustography for target identification and border detection
EP3320829A1 (en) * 2016-11-10 2018-05-16 E-Health Technical Solutions, S.L. System for integrally measuring clinical parameters of visual function
CN110418596B (zh) * 2017-03-28 2021-12-24 富士胶片株式会社 测量辅助装置、内窥镜系统及处理器
CN110461204B (zh) 2017-03-28 2021-05-18 富士胶片株式会社 测量辅助装置、内窥镜系统及处理器
KR101887527B1 (ko) * 2017-04-05 2018-08-10 경북대학교 산학협력단 풀컬러 홀로그램의 스펙트럼 측정 장치 및 그 방법
KR101887523B1 (ko) * 2017-04-05 2018-08-10 경북대학교 산학협력단 현미경을 이용한 국소 면적의 스펙트럼 측정 시스템
CN110785110B (zh) * 2017-06-29 2022-07-12 索尼公司 医学成像系统、方法以及计算机程序产品
US11380438B2 (en) 2017-09-27 2022-07-05 Honeywell International Inc. Respiration-vocalization data collection system for air quality determination
JP7221285B2 (ja) * 2017-11-01 2023-02-13 ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア 切除縁を術中に評価するための画像化方法およびシステム
US20190200906A1 (en) * 2017-12-28 2019-07-04 Ethicon Llc Dual cmos array imaging
CN108197560B (zh) * 2017-12-28 2022-06-07 努比亚技术有限公司 人脸图像识别方法、移动终端及计算机可读存储介质
CN111198192B (zh) * 2018-11-20 2022-02-15 深圳中科飞测科技股份有限公司 检测装置及检测方法
CN111988499B (zh) * 2019-05-22 2022-03-15 印象认知（北京）科技有限公司 成像层、成像装置、电子设备、波带片结构及感光像元
FR3098930B1 (fr) * 2019-07-18 2023-04-28 Univ Versailles Saint Quentin En Yvelines Dispositif d’observation d’une cellule ou d’un ensemble de cellules vivantes
CN110440853B (zh) * 2019-07-24 2024-05-17 沈阳工程学院 一种监控除尘系统
CN112782175A (zh) * 2019-11-11 2021-05-11 深圳中科飞测科技股份有限公司 一种检测设备及检测方法
US11391613B2 (en) 2020-02-14 2022-07-19 Honeywell International Inc. Fluid composition sensor device and method of using the same
US11835432B2 (en) 2020-10-26 2023-12-05 Honeywell International Inc. Fluid composition sensor device and method of using the same
CN113155755B (zh) * 2021-03-31 2022-05-24 中国科学院长春光学精密机械与物理研究所 微透镜阵列型成像光谱仪在线标定方法

Citations (5)

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Publication number Priority date Publication date Assignee Title
US4806774A (en) * 1987-06-08 1989-02-21 Insystems, Inc. Inspection system for array of microcircuit dies having redundant circuit patterns
US5316896A (en) * 1990-10-24 1994-05-31 Hitachi, Ltd. Method of forming a pattern
US6016210A (en) * 1997-12-15 2000-01-18 Northrop Grumman Corporation Scatter noise reduction in holographic storage systems by speckle averaging
WO2001004683A1 (en) * 1999-07-09 2001-01-18 Cellavision Ab Microscope filter for automatic contrast enhancement
EP1096295A1 (en) * 1999-10-28 2001-05-02 Itt Manufacturing Enterprises, Inc. Apparatus and method for providing optical sensors with improved resolution

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4410804A (en) * 1981-07-13 1983-10-18 Honeywell Inc. Two dimensional image panel with range measurement capability
JPH01154016A (ja) * 1987-12-10 1989-06-16 Nikon Corp 顕微鏡
JPH0695001A (ja) * 1992-09-11 1994-04-08 Nikon Corp 顕微鏡装置
JPH0772377A (ja) * 1993-06-14 1995-03-17 Nikon Corp 顕微鏡自動焦点装置
JPH08160303A (ja) * 1994-12-02 1996-06-21 Olympus Optical Co Ltd 物体観察装置
JP3123457B2 (ja) * 1996-05-13 2001-01-09 株式会社ニコン 顕微鏡
TWI240249B (en) * 2004-03-03 2005-09-21 Asustek Comp Inc Disc drive with tilt-preventing tray

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4806774A (en) * 1987-06-08 1989-02-21 Insystems, Inc. Inspection system for array of microcircuit dies having redundant circuit patterns
US5316896A (en) * 1990-10-24 1994-05-31 Hitachi, Ltd. Method of forming a pattern
US6016210A (en) * 1997-12-15 2000-01-18 Northrop Grumman Corporation Scatter noise reduction in holographic storage systems by speckle averaging
WO2001004683A1 (en) * 1999-07-09 2001-01-18 Cellavision Ab Microscope filter for automatic contrast enhancement
EP1096295A1 (en) * 1999-10-28 2001-05-02 Itt Manufacturing Enterprises, Inc. Apparatus and method for providing optical sensors with improved resolution

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO03005446A1 *

Also Published As

Publication number Publication date
CN100477734C (zh) 2009-04-08
IL159700A (en) 2010-12-30
AU2002322410B8 (en) 2008-05-01
AU2002322410B2 (en) 2008-02-07
KR100941062B1 (ko) 2010-02-05
MXPA04000167A (es) 2005-06-06
CN1550039A (zh) 2004-11-24
EP1405346A1 (en) 2004-04-07
JP2009258746A (ja) 2009-11-05
KR20040031769A (ko) 2004-04-13
IL159700A0 (en) 2004-06-20
CA2453049A1 (en) 2003-01-16
BR0210852A (pt) 2004-08-24
NZ530988A (en) 2006-09-29
JP2005534946A (ja) 2005-11-17
CA2453049C (en) 2011-10-25

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