KR100893475B1 - 감지 회로 및 감지 증폭기 - Google Patents
감지 회로 및 감지 증폭기 Download PDFInfo
- Publication number
- KR100893475B1 KR100893475B1 KR1020020070981A KR20020070981A KR100893475B1 KR 100893475 B1 KR100893475 B1 KR 100893475B1 KR 1020020070981 A KR1020020070981 A KR 1020020070981A KR 20020070981 A KR20020070981 A KR 20020070981A KR 100893475 B1 KR100893475 B1 KR 100893475B1
- Authority
- KR
- South Korea
- Prior art keywords
- channel transistor
- drain
- output signal
- gate
- sense amplifier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/067—Single-ended amplifiers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/062—Differential amplifiers of non-latching type, e.g. comparators, long-tailed pairs
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/991,571 | 2001-11-16 | ||
| US09/991,571 US6563753B1 (en) | 2001-11-16 | 2001-11-16 | Sense amplifier with independent write-back capability for ferroelectric random-access memories |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20030041082A KR20030041082A (ko) | 2003-05-23 |
| KR100893475B1 true KR100893475B1 (ko) | 2009-04-17 |
Family
ID=25537333
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020020070981A Expired - Fee Related KR100893475B1 (ko) | 2001-11-16 | 2002-11-15 | 감지 회로 및 감지 증폭기 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6563753B1 (enExample) |
| JP (1) | JP2003168289A (enExample) |
| KR (1) | KR100893475B1 (enExample) |
| DE (1) | DE10246738B4 (enExample) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100414210B1 (ko) * | 2001-11-19 | 2004-01-13 | 삼성전자주식회사 | 반도체 메모리 장치 |
| US6704218B2 (en) * | 2002-04-02 | 2004-03-09 | Agilent Technologies, Inc. | FeRAM with a single access/multiple-comparison operation |
| US6724645B1 (en) * | 2003-01-30 | 2004-04-20 | Agilent Technologies, Inc. | Method and apparatus for shortening read operations in destructive read memories |
| TW594736B (en) | 2003-04-17 | 2004-06-21 | Macronix Int Co Ltd | Over-driven read method and device of ferroelectric memory |
| US8421602B2 (en) * | 2006-09-13 | 2013-04-16 | Savant Systems, Llc | Remote control unit for a programmable multimedia controller |
| US7859916B2 (en) * | 2007-12-18 | 2010-12-28 | Micron Technology, Inc. | Symmetrically operating single-ended input buffer devices and methods |
| TW201417102A (zh) | 2012-10-23 | 2014-05-01 | Ind Tech Res Inst | 電阻式記憶體裝置 |
| JP6560508B2 (ja) * | 2014-03-13 | 2019-08-14 | 株式会社半導体エネルギー研究所 | 半導体装置 |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR940005687A (ko) * | 1992-07-29 | 1994-03-22 | 베르너 발데크 | 비닐 방향족 단량체의 중합 억제 조성물 및 방법 |
| KR950004558A (ko) * | 1993-07-16 | 1995-02-18 | 김광호 | 반도체 메모리 구조 및 반도체 제조방법 |
| KR950020718A (ko) * | 1993-12-18 | 1995-07-24 | 김광호 | 반도체 메모리 장치의 비트라인 센스 증폭회로 및 그 방법 |
| KR100206408B1 (ko) * | 1996-06-27 | 1999-07-01 | 김영환 | 반도체 메모리 장치의 데이터 라인 프리차지회로 |
| KR20000020315A (ko) * | 1998-09-19 | 2000-04-15 | 김영환 | 저전압 회로를 위한 감지증폭기 |
| US6054879A (en) * | 1997-12-08 | 2000-04-25 | Cypress Semiconductor Corp. | Current sensing amplifier with feedback |
| KR20000044916A (ko) * | 1998-12-30 | 2000-07-15 | 김영환 | 센스앰프의 출력전압 조정회로 |
| KR100268452B1 (ko) * | 1998-03-25 | 2000-10-16 | 윤종용 | 강유전체 랜덤 액세스 메모리 장치 |
| KR20000066269A (ko) * | 1999-04-15 | 2000-11-15 | 김영환 | 센스 앰프의 출력 피이드백회로를 갖는 dram 장치 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51113545A (en) * | 1975-03-31 | 1976-10-06 | Hitachi Ltd | Memory |
| US5031143A (en) * | 1990-11-21 | 1991-07-09 | National Semiconductor Corporation | Preamplifier for ferroelectric memory device sense amplifier |
| US5289475A (en) * | 1990-11-29 | 1994-02-22 | Sgs-Thomson Microelectronics, Inc. | Semiconductor memory with inverted write-back capability and method of testing a memory using inverted write-back |
-
2001
- 2001-11-16 US US09/991,571 patent/US6563753B1/en not_active Expired - Fee Related
-
2002
- 2002-10-07 DE DE10246738A patent/DE10246738B4/de not_active Expired - Fee Related
- 2002-11-15 KR KR1020020070981A patent/KR100893475B1/ko not_active Expired - Fee Related
- 2002-11-15 JP JP2002332580A patent/JP2003168289A/ja not_active Withdrawn
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR940005687A (ko) * | 1992-07-29 | 1994-03-22 | 베르너 발데크 | 비닐 방향족 단량체의 중합 억제 조성물 및 방법 |
| KR950004558A (ko) * | 1993-07-16 | 1995-02-18 | 김광호 | 반도체 메모리 구조 및 반도체 제조방법 |
| KR950020718A (ko) * | 1993-12-18 | 1995-07-24 | 김광호 | 반도체 메모리 장치의 비트라인 센스 증폭회로 및 그 방법 |
| KR100206408B1 (ko) * | 1996-06-27 | 1999-07-01 | 김영환 | 반도체 메모리 장치의 데이터 라인 프리차지회로 |
| US6054879A (en) * | 1997-12-08 | 2000-04-25 | Cypress Semiconductor Corp. | Current sensing amplifier with feedback |
| KR100268452B1 (ko) * | 1998-03-25 | 2000-10-16 | 윤종용 | 강유전체 랜덤 액세스 메모리 장치 |
| KR20000020315A (ko) * | 1998-09-19 | 2000-04-15 | 김영환 | 저전압 회로를 위한 감지증폭기 |
| KR20000044916A (ko) * | 1998-12-30 | 2000-07-15 | 김영환 | 센스앰프의 출력전압 조정회로 |
| KR20000066269A (ko) * | 1999-04-15 | 2000-11-15 | 김영환 | 센스 앰프의 출력 피이드백회로를 갖는 dram 장치 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20030095456A1 (en) | 2003-05-22 |
| DE10246738B4 (de) | 2004-05-06 |
| US6563753B1 (en) | 2003-05-13 |
| DE10246738A1 (de) | 2003-06-05 |
| KR20030041082A (ko) | 2003-05-23 |
| JP2003168289A (ja) | 2003-06-13 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US10580484B2 (en) | Semiconductor integrated circuit device | |
| US8144537B2 (en) | Balanced sense amplifier for single ended bitline memory architecture | |
| US6538915B2 (en) | Semiconductor integrated circuit device | |
| US10164624B2 (en) | Apparatuses for reducing off state leakage currents | |
| KR100893475B1 (ko) | 감지 회로 및 감지 증폭기 | |
| KR100527539B1 (ko) | 고속 센싱을 위한 불휘발성 강유전체 메모리 장치 | |
| CN100472645C (zh) | 低功率损耗的感测放大器 | |
| US6898107B2 (en) | Nonvolatile FeRAM control device | |
| KR100596896B1 (ko) | 공통 메인 비트라인을 갖는 불휘발성 강유전체 메모리 장치 | |
| US7221578B2 (en) | Ferroelectric random access memory device and method for driving the same | |
| US6661695B2 (en) | Capacitance sensing technique for ferroelectric random access memory arrays | |
| US7304882B2 (en) | Circuits for driving FRAM | |
| JP4079910B2 (ja) | 強誘電体メモリ | |
| US7106615B2 (en) | FeRAM capable of restoring “0” data and “1” data at a time | |
| US7463519B1 (en) | MIS-transistor-based nonvolatile memory device for authentication | |
| US7136317B1 (en) | DRAM with self-resetting data path for reduced power consumption | |
| Miwa et al. | An embedded FeRAM macro cell for a smart card microcontroller | |
| JPH09231775A (ja) | 強誘電体記憶装置 | |
| KR100492782B1 (ko) | 타이밍 레퍼런스 제어 기능을 갖는 불휘발성 강유전체메모리 장치 및 그 제어 방법 | |
| JPH09171696A (ja) | 強誘電体記憶装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| N231 | Notification of change of applicant | ||
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| A201 | Request for examination | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| D13-X000 | Search requested |
St.27 status event code: A-1-2-D10-D13-srh-X000 |
|
| D14-X000 | Search report completed |
St.27 status event code: A-1-2-D10-D14-srh-X000 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
|
| PG1601 | Publication of registration |
St.27 status event code: A-4-4-Q10-Q13-nap-PG1601 |
|
| LAPS | Lapse due to unpaid annual fee | ||
| PC1903 | Unpaid annual fee |
St.27 status event code: A-4-4-U10-U13-oth-PC1903 Not in force date: 20120408 Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE |
|
| PC1903 | Unpaid annual fee |
St.27 status event code: N-4-6-H10-H13-oth-PC1903 Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE Not in force date: 20120408 |