KR100871476B1 - 기판 세정장치 - Google Patents
기판 세정장치 Download PDFInfo
- Publication number
- KR100871476B1 KR100871476B1 KR1020070023968A KR20070023968A KR100871476B1 KR 100871476 B1 KR100871476 B1 KR 100871476B1 KR 1020070023968 A KR1020070023968 A KR 1020070023968A KR 20070023968 A KR20070023968 A KR 20070023968A KR 100871476 B1 KR100871476 B1 KR 100871476B1
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- cleaning
- cleaning liquid
- coupled
- chuck
- Prior art date
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02082—Cleaning product to be cleaned
- H01L21/0209—Cleaning of wafer backside
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68764—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating caroussel
Abstract
Description
Claims (9)
- 기판의 가장자리와 접촉하여 상기 기판의 하면이 노출되도록 기판을 장착하는 기판 척;상기 기판 척과 결합되며, 중공을 가지는 회전 축;상기 회전 축과 결합하여 상기 회전축 및 기판 척을 회전시키는 회전 구동부;상기 중공을 관통하여 배치되며, 고정된 상태에서 상기 기판 하면에 세정액을 분사하는 세정액 분사부;를 포함하며,상기 세정액 분사부는,상기 중공을 관통하는 세정액 공급관;상기 세정액 공급관의 상단에 결합되며, 세정액을 복수 지점으로 분사하는 분사캡;을 포함하는 것을 특징으로 하는 기판 세정장치.
- 제1항에 있어서,상기 기판 척은,상기 회전 축과 결합되어 회전 축과 함께 회전하며, 다수개의 핀 설치홈을 가지는 회전 플레이트;상기 핀 설치홈에 탈착가능하게 결합되며, 상기 기판을 지지하는 지지 핀;을 포함하는 것을 특징으로 하는 기판 세정장치.
- 제2항에 있어서,상기 지지 핀은,상기 기판의 하면과 측면을 지지하는 단차부를 가지는 것을 특징으로 하는 기판 세정장치.
- 제3항에 있어서,상기 핀 설치홈은 상기 회전 플레이트의 전면에 걸쳐서 형성되는 것을 특징으로 하는 기판 세정장치.
- 삭제
- 제1항에 있어서,상기 분사캡은 원뿔형상을 가지며, 서로 상이한 각도로 세정액을 분사하는 다수개의 분사홀을 가지는 것을 특징으로 하는 기판 세정장치.
- 제6항에 있어서,상기 분사캡은 질소 가스를 분사하는 질소 분사홀을 더 포함하는 것을 특징으로 하는 기판 세정장치.
- 제1항에 있어서,상기 분사캡은 상기 회전 플레이트 상면 보다 돌출되어 배치되는 것을 특징으로 하는 기판 세정장치.
- 제2항에 있어서,상기 기판 척 및 상기 기판의 측부 및 하부를 감싸는 외함을 더 포함하는 것을 특징으로 하는 기판 세정장치.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070023968A KR100871476B1 (ko) | 2007-03-12 | 2007-03-12 | 기판 세정장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070023968A KR100871476B1 (ko) | 2007-03-12 | 2007-03-12 | 기판 세정장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20080083424A KR20080083424A (ko) | 2008-09-18 |
KR100871476B1 true KR100871476B1 (ko) | 2008-12-05 |
Family
ID=40024100
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020070023968A KR100871476B1 (ko) | 2007-03-12 | 2007-03-12 | 기판 세정장치 |
Country Status (1)
Country | Link |
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KR (1) | KR100871476B1 (ko) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101015956B1 (ko) * | 2008-10-28 | 2011-02-23 | 세메스 주식회사 | 스핀 헤드 |
KR102162260B1 (ko) | 2018-10-22 | 2020-10-06 | 세메스 주식회사 | 가이드 핀 및 이를 구비하는 포토 마스크 지지 유닛과 포토 마스크 세정 장치 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR19990023678A (ko) * | 1997-08-18 | 1999-03-25 | 히가시 데쓰로 | 기판의 양면세정장치 |
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2007
- 2007-03-12 KR KR1020070023968A patent/KR100871476B1/ko active IP Right Grant
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR19990023678A (ko) * | 1997-08-18 | 1999-03-25 | 히가시 데쓰로 | 기판의 양면세정장치 |
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Publication number | Publication date |
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KR20080083424A (ko) | 2008-09-18 |
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