KR100745428B1 - 음향 공진 장치 및 그 제조 방법과 격리 방법 - Google Patents
음향 공진 장치 및 그 제조 방법과 격리 방법 Download PDFInfo
- Publication number
- KR100745428B1 KR100745428B1 KR1020010005225A KR20010005225A KR100745428B1 KR 100745428 B1 KR100745428 B1 KR 100745428B1 KR 1020010005225 A KR1020010005225 A KR 1020010005225A KR 20010005225 A KR20010005225 A KR 20010005225A KR 100745428 B1 KR100745428 B1 KR 100745428B1
- Authority
- KR
- South Korea
- Prior art keywords
- piezoelectric material
- piezoelectric
- substrate
- acoustic
- acoustic resonator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/02007—Details of bulk acoustic wave devices
- H03H9/02086—Means for compensation or elimination of undesirable effects
- H03H9/02118—Means for compensation or elimination of undesirable effects of lateral leakage between adjacent resonators
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/15—Constructional features of resonators consisting of piezoelectric or electrostrictive material
- H03H9/17—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator
- H03H9/171—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator implemented with thin-film techniques, i.e. of the film bulk acoustic resonator [FBAR] type
- H03H9/172—Means for mounting on a substrate, i.e. means constituting the material interface confining the waves to a volume
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/42—Piezoelectric device making
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49005—Acoustic transducer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49155—Manufacturing circuit on or in base
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/497,993 | 2000-02-04 | ||
| US09/497,993 US7296329B1 (en) | 2000-02-04 | 2000-02-04 | Method of isolation for acoustic resonator device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20010078314A KR20010078314A (ko) | 2001-08-20 |
| KR100745428B1 true KR100745428B1 (ko) | 2007-08-02 |
Family
ID=23979175
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020010005225A Expired - Fee Related KR100745428B1 (ko) | 2000-02-04 | 2001-02-03 | 음향 공진 장치 및 그 제조 방법과 격리 방법 |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US7296329B1 (enExample) |
| EP (1) | EP1126601A3 (enExample) |
| JP (2) | JP2001223410A (enExample) |
| KR (1) | KR100745428B1 (enExample) |
| CN (1) | CN1203464C (enExample) |
| AU (1) | AU1673901A (enExample) |
| BR (1) | BR0100192A (enExample) |
| CA (2) | CA2330019C (enExample) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20030032401A (ko) * | 2001-10-18 | 2003-04-26 | 한국쌍신전기주식회사 | 압전박막형 공진기 및 그 제조방법 |
| US7038559B2 (en) * | 2004-02-23 | 2006-05-02 | Ruby Richard C | Vertically separated acoustic filters and resonators |
| JP4535841B2 (ja) | 2004-10-28 | 2010-09-01 | 富士通メディアデバイス株式会社 | 圧電薄膜共振子及びこれを用いたフィルタ |
| FI118829B (fi) * | 2005-07-08 | 2008-03-31 | Valtion Teknillinen | Mikromekaaninen sensori, sensoriryhmä ja menetelmä sekä pitkittäisten akustisten aaltojen uusi käyttö |
| US8291559B2 (en) * | 2009-02-24 | 2012-10-23 | Epcos Ag | Process for adapting resonance frequency of a BAW resonator |
| US8513863B2 (en) | 2009-06-11 | 2013-08-20 | Qualcomm Mems Technologies, Inc. | Piezoelectric resonator with two layers |
| KR102717842B1 (ko) * | 2015-08-18 | 2024-10-14 | 후지필름 소노사이트, 인크. | 고주파 초음파용 막 수중청음기 및 제조 방법 |
| US10135415B2 (en) * | 2015-12-18 | 2018-11-20 | Texas Instruments Incorporated | Method to reduce frequency distribution of bulk acoustic wave resonators during manufacturing |
| US11579011B2 (en) | 2016-02-19 | 2023-02-14 | Fujifilm Sonosite, Inc. | Membrane hydrophone for high frequency ultrasound and method of manufacture |
| US10178459B2 (en) | 2016-03-09 | 2019-01-08 | Mrspeakers, Llc | Loudspeaker with acoustic impedance system |
| US10931262B2 (en) | 2017-12-07 | 2021-02-23 | Infineon Technologies Ag | Tunable resonator element, filter circuit and method |
| CN108231995B (zh) * | 2018-02-05 | 2024-04-19 | 武汉衍熙微器件有限公司 | 一种压电器件及其制备方法 |
| CN110120793B (zh) * | 2018-02-05 | 2024-11-12 | 武汉衍熙微器件有限公司 | 具有非c轴优选压电层的薄膜体声波谐振器 |
| US11594668B2 (en) * | 2018-12-28 | 2023-02-28 | Tdk Corporation | Thin film laminate, thin film device and multilayer substrate |
| US11563418B2 (en) | 2019-03-25 | 2023-01-24 | Skyworks Solutions, Inc. | Methods of manufacturing acoustic wave resonators with isolation |
| US12501642B2 (en) | 2020-10-07 | 2025-12-16 | Hrl Laboratories, Llc | Semiconductor materials and devices including iii-nitride layers integrated with scandium aluminum nitride |
| CN113054941B (zh) * | 2021-02-09 | 2023-11-24 | 偲百创(深圳)科技有限公司 | 声波谐振器制作方法及声波谐振器 |
| US20230246630A1 (en) * | 2022-01-31 | 2023-08-03 | Texas Instruments Incorporated | Substrate top side roughening |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07162054A (ja) * | 1993-12-06 | 1995-06-23 | Murata Mfg Co Ltd | 圧電薄膜の形成方法 |
| US5698928A (en) * | 1995-08-17 | 1997-12-16 | Motorola, Inc. | Thin film piezoelectric arrays with enhanced coupling and fabrication methods |
Family Cites Families (71)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3956718A (en) * | 1975-01-10 | 1976-05-11 | Westinghouse Electric Corporation | Crystals having zero temperature coefficients of delay |
| US4675123A (en) * | 1979-01-17 | 1987-06-23 | Ngk Spark Plug Co., Ltd. | Piezoelectric composite material |
| US4320365A (en) | 1980-11-03 | 1982-03-16 | United Technologies Corporation | Fundamental, longitudinal, thickness mode bulk wave resonator |
| JPS5831608A (ja) * | 1981-08-19 | 1983-02-24 | Toshiba Corp | 弾性表面波素子の製造方法 |
| US4502932A (en) | 1983-10-13 | 1985-03-05 | The United States Of America As Represented By The United States Department Of Energy | Acoustic resonator and method of making same |
| US4556812A (en) | 1983-10-13 | 1985-12-03 | The United States Of America As Represented By The United States Department Of Energy | Acoustic resonator with Al electrodes on an AlN layer and using a GaAs substrate |
| US4719383A (en) | 1985-05-20 | 1988-01-12 | The United States Of America As Represented By The United States Department Of Energy | Piezoelectric shear wave resonator and method of making same |
| JPS61269410A (ja) * | 1985-05-23 | 1986-11-28 | Toshiba Corp | 薄膜弾性表面波装置 |
| US5022130A (en) * | 1987-10-02 | 1991-06-11 | Quartztronics, Inc. | Method of manufacturing crystal resonators having low acceleration sensitivity |
| JPH0618314B2 (ja) | 1987-10-09 | 1994-03-09 | 株式会社村田製作所 | 集積型共振子の製造方法 |
| US4906840A (en) * | 1988-01-27 | 1990-03-06 | The Board Of Trustees Of Leland Stanford Jr., University | Integrated scanning tunneling microscope |
| JP2644855B2 (ja) * | 1988-10-24 | 1997-08-25 | 株式会社日立製作所 | 弾性波フィルタ、及びそれを用いたアンテナ分波器 |
| US4988957A (en) | 1989-05-26 | 1991-01-29 | Iowa State University Research Foundation, Inc. | Electronically-tuned thin-film resonator/filter controlled oscillator |
| JPH03204211A (ja) * | 1990-01-03 | 1991-09-05 | Kazuhiko Yamanouchi | 作製膜研磨法を用いた弾性表面波基板 |
| US5369862A (en) * | 1990-02-26 | 1994-12-06 | Murata Manufacturing Co., Ltd. | Method of producing a piezoelectric device |
| US5075641A (en) | 1990-12-04 | 1991-12-24 | Iowa State University Research Foundation, Inc. | High frequency oscillator comprising cointegrated thin film resonator and active device |
| US5231327A (en) | 1990-12-14 | 1993-07-27 | Tfr Technologies, Inc. | Optimized piezoelectric resonator-based networks |
| DE69206165T2 (de) | 1991-02-04 | 1996-06-05 | Motorola Inc | Hermetische Verpackung für frequenzselektive Mikroelektronikteile. |
| US5263259A (en) | 1991-05-14 | 1993-11-23 | Fausto Cimador | Design apparatus |
| US5185589A (en) | 1991-05-17 | 1993-02-09 | Westinghouse Electric Corp. | Microwave film bulk acoustic resonator and manifolded filter bank |
| EP0546696A1 (en) | 1991-12-13 | 1993-06-16 | Hewlett-Packard Company | Process for lithography on piezoelectric films |
| US5232571A (en) | 1991-12-23 | 1993-08-03 | Iowa State University Research Foundation, Inc. | Aluminum nitride deposition using an AlN/Al sputter cycle technique |
| US5348617A (en) | 1991-12-23 | 1994-09-20 | Iowa State University Research Foundation, Inc. | Selective etching process |
| US5294898A (en) | 1992-01-29 | 1994-03-15 | Motorola, Inc. | Wide bandwidth bandpass filter comprising parallel connected piezoelectric resonators |
| US5166646A (en) | 1992-02-07 | 1992-11-24 | Motorola, Inc. | Integrated tunable resonators for use in oscillators and filters |
| US5283458A (en) | 1992-03-30 | 1994-02-01 | Trw Inc. | Temperature stable semiconductor bulk acoustic resonator |
| US5367308A (en) | 1992-05-29 | 1994-11-22 | Iowa State University Research Foundation, Inc. | Thin film resonating device |
| JP3140223B2 (ja) * | 1992-11-11 | 2001-03-05 | キヤノン株式会社 | マイクロアクチュエータおよびその作製方法 |
| US5382930A (en) * | 1992-12-21 | 1995-01-17 | Trw Inc. | Monolithic multipole filters made of thin film stacked crystal filters |
| US5373268A (en) | 1993-02-01 | 1994-12-13 | Motorola, Inc. | Thin film resonator having stacked acoustic reflecting impedance matching layers and method |
| JPH06232671A (ja) * | 1993-02-04 | 1994-08-19 | Mitsubishi Electric Corp | 弾性表面波素子の製造方法 |
| US5334960A (en) | 1993-02-16 | 1994-08-02 | Motorola, Inc. | Conjugately matched acoustic wave transducers and method |
| US5434827A (en) | 1993-06-15 | 1995-07-18 | Hewlett-Packard Company | Matching layer for front acoustic impedance matching of clinical ultrasonic tranducers |
| US5381385A (en) | 1993-08-04 | 1995-01-10 | Hewlett-Packard Company | Electrical interconnect for multilayer transducer elements of a two-dimensional transducer array |
| US5369662A (en) | 1993-08-11 | 1994-11-29 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Reduction of parasitic lasing |
| US5446306A (en) | 1993-12-13 | 1995-08-29 | Trw Inc. | Thin film voltage-tuned semiconductor bulk acoustic resonator (SBAR) |
| US5587620A (en) | 1993-12-21 | 1996-12-24 | Hewlett-Packard Company | Tunable thin film acoustic resonators and method for making the same |
| US5552655A (en) | 1994-05-04 | 1996-09-03 | Trw Inc. | Low frequency mechanical resonator |
| US5864261A (en) | 1994-05-23 | 1999-01-26 | Iowa State University Research Foundation | Multiple layer acoustical structures for thin-film resonator based circuits and systems |
| JPH08148968A (ja) | 1994-11-24 | 1996-06-07 | Mitsubishi Electric Corp | 薄膜圧電素子 |
| US5630949A (en) | 1995-06-01 | 1997-05-20 | Tfr Technologies, Inc. | Method and apparatus for fabricating a piezoelectric resonator to a resonant frequency |
| JPH08340136A (ja) * | 1995-06-09 | 1996-12-24 | Toshiba Corp | 酸化物薄膜素子の製造方法、超電導素子の製造方法および超電導素子 |
| US5617065A (en) | 1995-06-29 | 1997-04-01 | Motorola, Inc. | Filter using enhanced quality factor resonator and method |
| US5596239A (en) | 1995-06-29 | 1997-01-21 | Motorola, Inc. | Enhanced quality factor resonator |
| US5692279A (en) * | 1995-08-17 | 1997-12-02 | Motorola | Method of making a monolithic thin film resonator lattice filter |
| KR100229608B1 (ko) * | 1995-10-06 | 1999-11-15 | 모리시타 요이찌 | 유전체소자의 제조방법 |
| US5702775A (en) | 1995-12-26 | 1997-12-30 | Motorola, Inc. | Microelectronic device package and method |
| US5821833A (en) | 1995-12-26 | 1998-10-13 | Tfr Technologies, Inc. | Stacked crystal filter device and method of making |
| US5646583A (en) | 1996-01-04 | 1997-07-08 | Rockwell International Corporation | Acoustic isolator having a high impedance layer of hafnium oxide |
| US5760663A (en) | 1996-08-23 | 1998-06-02 | Motorola, Inc. | Elliptic baw resonator filter and method of making the same |
| US5714917A (en) | 1996-10-02 | 1998-02-03 | Nokia Mobile Phones Limited | Device incorporating a tunable thin film bulk acoustic resonator for performing amplitude and phase modulation |
| US6051907A (en) | 1996-10-10 | 2000-04-18 | Nokia Mobile Phones Limited | Method for performing on-wafer tuning of thin film bulk acoustic wave resonators (FBARS) |
| EP1012888B1 (en) * | 1996-10-17 | 2009-03-04 | Avago Technologies Wireless IP (Singapore) Pte. Ltd. | Method for fabricating fbars on glass substrates |
| US5873154A (en) | 1996-10-17 | 1999-02-23 | Nokia Mobile Phones Limited | Method for fabricating a resonator having an acoustic mirror |
| US5780713A (en) | 1996-11-19 | 1998-07-14 | Hewlett-Packard Company | Post-fabrication tuning of acoustic resonators |
| US5963856A (en) | 1997-01-03 | 1999-10-05 | Lucent Technologies Inc | Wireless receiver including tunable RF bandpass filter |
| US6087198A (en) | 1998-02-12 | 2000-07-11 | Texas Instruments Incorporated | Low cost packaging for thin-film resonators and thin-film resonator-based filters |
| US5872493A (en) | 1997-03-13 | 1999-02-16 | Nokia Mobile Phones, Ltd. | Bulk acoustic wave (BAW) filter having a top portion that includes a protective acoustic mirror |
| US5853601A (en) | 1997-04-03 | 1998-12-29 | Northrop Grumman Corporation | Top-via etch technique for forming dielectric membranes |
| US6127768A (en) | 1997-05-09 | 2000-10-03 | Kobe Steel Usa, Inc. | Surface acoustic wave and bulk acoustic wave devices using a Zn.sub.(1-X) Yx O piezoelectric layer device |
| US5910756A (en) | 1997-05-21 | 1999-06-08 | Nokia Mobile Phones Limited | Filters and duplexers utilizing thin film stacked crystal filter structures and thin film bulk acoustic wave resonators |
| US5894647A (en) | 1997-06-30 | 1999-04-20 | Tfr Technologies, Inc. | Method for fabricating piezoelectric resonators and product |
| US5883575A (en) | 1997-08-12 | 1999-03-16 | Hewlett-Packard Company | RF-tags utilizing thin film bulk wave acoustic resonators |
| US6081171A (en) | 1998-04-08 | 2000-06-27 | Nokia Mobile Phones Limited | Monolithic filters utilizing thin film bulk acoustic wave devices and minimum passive components for controlling the shape and width of a passband response |
| FI108583B (fi) | 1998-06-02 | 2002-02-15 | Nokia Corp | Resonaattorirakenteita |
| US6060818A (en) | 1998-06-02 | 2000-05-09 | Hewlett-Packard Company | SBAR structures and method of fabrication of SBAR.FBAR film processing techniques for the manufacturing of SBAR/BAR filters |
| US6150703A (en) | 1998-06-29 | 2000-11-21 | Trw Inc. | Lateral mode suppression in semiconductor bulk acoustic resonator (SBAR) devices using tapered electrodes, and electrodes edge damping materials |
| US5942958A (en) | 1998-07-27 | 1999-08-24 | Tfr Technologies, Inc. | Symmetrical piezoelectric resonator filter |
| US6185589B1 (en) | 1998-07-31 | 2001-02-06 | Hewlett-Packard Company | Automatic banner resizing for variable-width web pages using variable width cells of HTML table |
| US6215375B1 (en) | 1999-03-30 | 2001-04-10 | Agilent Technologies, Inc. | Bulk acoustic wave resonator with improved lateral mode suppression |
| JP4327942B2 (ja) | 1999-05-20 | 2009-09-09 | Tdk株式会社 | 薄膜圧電素子 |
-
2000
- 2000-02-04 US US09/497,993 patent/US7296329B1/en not_active Expired - Lifetime
-
2001
- 2001-01-02 CA CA002330019A patent/CA2330019C/en not_active Expired - Fee Related
- 2001-01-02 CA CA2642731A patent/CA2642731C/en not_active Expired - Fee Related
- 2001-01-19 CN CNB011016663A patent/CN1203464C/zh not_active Expired - Fee Related
- 2001-01-22 EP EP01300530A patent/EP1126601A3/en not_active Withdrawn
- 2001-01-29 BR BR0100192-2A patent/BR0100192A/pt not_active Application Discontinuation
- 2001-01-31 AU AU16739/01A patent/AU1673901A/en not_active Abandoned
- 2001-02-02 JP JP2001026212A patent/JP2001223410A/ja active Pending
- 2001-02-03 KR KR1020010005225A patent/KR100745428B1/ko not_active Expired - Fee Related
-
2007
- 2007-10-01 US US11/906,196 patent/US8631547B2/en not_active Expired - Lifetime
-
2013
- 2013-10-18 JP JP2013217576A patent/JP5559411B2/ja not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07162054A (ja) * | 1993-12-06 | 1995-06-23 | Murata Mfg Co Ltd | 圧電薄膜の形成方法 |
| US5698928A (en) * | 1995-08-17 | 1997-12-16 | Motorola, Inc. | Thin film piezoelectric arrays with enhanced coupling and fabrication methods |
Non-Patent Citations (1)
| Title |
|---|
| KIM S_H ET AL: "The Fabrication of Thin-Film Bulk Acoustic Wave Resonators Employing a ZnO/Si...", IEEE Electron Device Letters, vol.20, no.3, pages 113-115 (1999.03.03) |
Also Published As
| Publication number | Publication date |
|---|---|
| CA2642731A1 (en) | 2001-08-04 |
| EP1126601A2 (en) | 2001-08-22 |
| US8631547B2 (en) | 2014-01-21 |
| JP2014017881A (ja) | 2014-01-30 |
| CN1203464C (zh) | 2005-05-25 |
| US7296329B1 (en) | 2007-11-20 |
| JP2001223410A (ja) | 2001-08-17 |
| KR20010078314A (ko) | 2001-08-20 |
| CN1319835A (zh) | 2001-10-31 |
| CA2330019C (en) | 2008-12-30 |
| AU1673901A (en) | 2001-08-09 |
| JP5559411B2 (ja) | 2014-07-23 |
| BR0100192A (pt) | 2001-10-09 |
| US20080028585A1 (en) | 2008-02-07 |
| CA2642731C (en) | 2013-10-15 |
| EP1126601A3 (en) | 2006-03-22 |
| CA2330019A1 (en) | 2001-08-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5559411B2 (ja) | 音響共振デバイス用の分離方法 | |
| US6601276B2 (en) | Method for self alignment of patterned layers in thin film acoustic devices | |
| JP3535474B2 (ja) | FBAR(Film Bulk Acoustic Resonator)素子の製造方法 | |
| US9197185B2 (en) | Resonator device including electrodes with buried temperature compensating layers | |
| US6445265B1 (en) | Device with acoustic waves guided in a fine piezoelectric material film bonded with a molecular bonding on a bearing substrate and method for making same | |
| US5894647A (en) | Method for fabricating piezoelectric resonators and product | |
| US6635519B2 (en) | Structurally supported thin film resonator and method of fabrication | |
| KR101945723B1 (ko) | 박막 벌크 음향 공진기 및 박막 벌크 음향 공진기의 제조방법 | |
| US6675450B1 (en) | Method of manufacturing and mounting electronic devices to limit the effects of parasitics | |
| CN101026368A (zh) | 膜体声谐振器及其制造方法 | |
| US6657517B2 (en) | Multi-frequency thin film resonators | |
| KR100669594B1 (ko) | 필름 벌크 음향 공진기와, 필터링 장치와, 기판에 장치를형성하는 방법 및 필름 벌크 공진기 형성 방법 | |
| CN113630099A (zh) | 体声波谐振器及制造方法、体声波谐振器组件、滤波器及电子设备 | |
| CN117013984A (zh) | 一种键合晶圆及薄膜声表面波器件 | |
| CN1620752B (zh) | 薄膜体声波谐振器结构及其制造方法 | |
| US6437667B1 (en) | Method of tuning thin film resonator filters by removing or adding piezoelectric material | |
| US6306313B1 (en) | Selective etching of thin films | |
| US11611328B2 (en) | Fin bulk acoustic resonator technology for UHF and SHF signal processing | |
| WO2022053161A1 (en) | Solidly mounted bulk acoustic wave resonator with frequency tuning by mass loading in acoustic reflector and method of manufacturing thereof | |
| CN114928348B (zh) | 一种滤波器、通信设备及其制造方法 | |
| CN121239167A (zh) | 单片集成的复合体声波谐振器及其制备方法 | |
| KR100446258B1 (ko) | 압전단결정을 이용한 고주파 체적음향파소자 및 그 제조방법 | |
| CN115250111A (zh) | 体声波谐振器的支撑结构 | |
| KR20030034932A (ko) | 탄성파소자의 패키지 및 그의 패키징 방법 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| A201 | Request for examination | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
|
| PG1601 | Publication of registration |
St.27 status event code: A-4-4-Q10-Q13-nap-PG1601 |
|
| G170 | Re-publication after modification of scope of protection [patent] | ||
| PG1701 | Publication of correction |
St.27 status event code: A-5-5-P10-P19-oth-PG1701 Patent document republication publication date: 20080417 Republication note text: Request for Correction Notice (Document Request) Gazette number: 1007454280000 Gazette reference publication date: 20070802 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 4 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 5 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 6 |
|
| FPAY | Annual fee payment |
Payment date: 20130701 Year of fee payment: 7 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 7 |
|
| FPAY | Annual fee payment |
Payment date: 20140703 Year of fee payment: 8 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 8 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R14-asn-PN2301 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 9 |
|
| FPAY | Annual fee payment |
Payment date: 20160630 Year of fee payment: 10 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 10 |
|
| FPAY | Annual fee payment |
Payment date: 20170710 Year of fee payment: 11 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 11 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| LAPS | Lapse due to unpaid annual fee | ||
| PC1903 | Unpaid annual fee |
St.27 status event code: A-4-4-U10-U13-oth-PC1903 Not in force date: 20180728 Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE |
|
| PC1903 | Unpaid annual fee |
St.27 status event code: N-4-6-H10-H13-oth-PC1903 Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE Not in force date: 20180728 |