BR0100192A - Dispositivo ressoador acústico e método de produção do mesmo - Google Patents
Dispositivo ressoador acústico e método de produção do mesmoInfo
- Publication number
- BR0100192A BR0100192A BR0100192-2A BR0100192A BR0100192A BR 0100192 A BR0100192 A BR 0100192A BR 0100192 A BR0100192 A BR 0100192A BR 0100192 A BR0100192 A BR 0100192A
- Authority
- BR
- Brazil
- Prior art keywords
- piezoelectric
- piezoelectric material
- acoustic
- acoustic resonator
- regions
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title abstract 4
- 239000000463 material Substances 0.000 abstract 4
- 238000000034 method Methods 0.000 abstract 2
- 239000013078 crystal Substances 0.000 abstract 1
- 238000009413 insulation Methods 0.000 abstract 1
- 230000002452 interceptive effect Effects 0.000 abstract 1
- 230000001902 propagating effect Effects 0.000 abstract 1
- 230000008054 signal transmission Effects 0.000 abstract 1
- 230000026683 transduction Effects 0.000 abstract 1
- 238000010361 transduction Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02007—Details of bulk acoustic wave devices
- H03H9/02086—Means for compensation or elimination of undesirable effects
- H03H9/02118—Means for compensation or elimination of undesirable effects of lateral leakage between adjacent resonators
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/15—Constructional features of resonators consisting of piezoelectric or electrostrictive material
- H03H9/17—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator
- H03H9/171—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator implemented with thin-film techniques, i.e. of the film bulk acoustic resonator [FBAR] type
- H03H9/172—Means for mounting on a substrate, i.e. means constituting the material interface confining the waves to a volume
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/42—Piezoelectric device making
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49005—Acoustic transducer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49155—Manufacturing circuit on or in base
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Abstract
<B>DISPOSITIVO RESSOADOR ACúSTICO E MéTODO DE PRODUçãO DO MESMO<D> Um método de isolamento de dispositivos ressoadores acústicos de filme fino piezoelétrico, para impedir que ondas que se propagam lateralmente, geradas pelo dispositivo, deixem o dispositivo e/ou interfiram em dispositivos ou sistemas adjacentes. Especificamente, esta técnica de isolamento envolve a manipulação ou o isolamento da camada de material piezoelétrico entre os dispositivos de ressoador acústico, em um esforço para limitar a quantidade de energia acústica que se propaga em uma direção lateral a partir do dispositivo. Em um aspecto, pelo menos uma porção do material piezoelétrico não envolvida em uma transmissão de sinal, por transdução entre energia de RF e acústica, é removida do dispositivo. Em outro aspecto, o crescimento de um material piezoelétrico é limitado a certas regiões, durante a fabricação do dispositivo. Em outro aspecto, a orientação de cristal do material piezoelétrico é interrompida ou alterada, durante a fabricação do dispositivo, de modo a formar regiões com excelentes propriedades piezoelétricas e regiões que apresentam características de piezoeletricidade ruins.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/497,993 US7296329B1 (en) | 2000-02-04 | 2000-02-04 | Method of isolation for acoustic resonator device |
Publications (1)
Publication Number | Publication Date |
---|---|
BR0100192A true BR0100192A (pt) | 2001-10-09 |
Family
ID=23979175
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BR0100192-2A BR0100192A (pt) | 2000-02-04 | 2001-01-29 | Dispositivo ressoador acústico e método de produção do mesmo |
Country Status (8)
Country | Link |
---|---|
US (2) | US7296329B1 (pt) |
EP (1) | EP1126601A3 (pt) |
JP (2) | JP2001223410A (pt) |
KR (1) | KR100745428B1 (pt) |
CN (1) | CN1203464C (pt) |
AU (1) | AU1673901A (pt) |
BR (1) | BR0100192A (pt) |
CA (2) | CA2642731C (pt) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20030032401A (ko) * | 2001-10-18 | 2003-04-26 | 한국쌍신전기주식회사 | 압전박막형 공진기 및 그 제조방법 |
US7038559B2 (en) * | 2004-02-23 | 2006-05-02 | Ruby Richard C | Vertically separated acoustic filters and resonators |
JP4535841B2 (ja) | 2004-10-28 | 2010-09-01 | 富士通メディアデバイス株式会社 | 圧電薄膜共振子及びこれを用いたフィルタ |
FI118829B (fi) * | 2005-07-08 | 2008-03-31 | Valtion Teknillinen | Mikromekaaninen sensori, sensoriryhmä ja menetelmä sekä pitkittäisten akustisten aaltojen uusi käyttö |
US8291559B2 (en) * | 2009-02-24 | 2012-10-23 | Epcos Ag | Process for adapting resonance frequency of a BAW resonator |
US8513863B2 (en) | 2009-06-11 | 2013-08-20 | Qualcomm Mems Technologies, Inc. | Piezoelectric resonator with two layers |
CN107923788B (zh) * | 2015-08-18 | 2021-10-08 | 富士胶片索诺声公司 | 用于高频超声的膜水下听音器及其制造方法 |
US10135415B2 (en) * | 2015-12-18 | 2018-11-20 | Texas Instruments Incorporated | Method to reduce frequency distribution of bulk acoustic wave resonators during manufacturing |
US11579011B2 (en) | 2016-02-19 | 2023-02-14 | Fujifilm Sonosite, Inc. | Membrane hydrophone for high frequency ultrasound and method of manufacture |
US10178459B2 (en) | 2016-03-09 | 2019-01-08 | Mrspeakers, Llc | Loudspeaker with acoustic impedance system |
EP3506500B1 (en) | 2017-12-07 | 2021-06-09 | Infineon Technologies AG | Notch filters based on coupled acoustic resonators |
CN108231995B (zh) * | 2018-02-05 | 2024-04-19 | 武汉衍熙微器件有限公司 | 一种压电器件及其制备方法 |
CN110120793A (zh) * | 2018-02-05 | 2019-08-13 | 武汉衍熙微器件有限公司 | 具有非c轴优选压电层的薄膜体声波谐振器 |
US11594668B2 (en) * | 2018-12-28 | 2023-02-28 | Tdk Corporation | Thin film laminate, thin film device and multilayer substrate |
US11463069B2 (en) | 2019-03-25 | 2022-10-04 | Skyworks Solutions, Inc. | Acoustic wave filters with isolation |
CN113054941B (zh) * | 2021-02-09 | 2023-11-24 | 偲百创(深圳)科技有限公司 | 声波谐振器制作方法及声波谐振器 |
US20230246630A1 (en) * | 2022-01-31 | 2023-08-03 | Texas Instruments Incorporated | Substrate top side roughening |
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-
2000
- 2000-02-04 US US09/497,993 patent/US7296329B1/en not_active Expired - Lifetime
-
2001
- 2001-01-02 CA CA2642731A patent/CA2642731C/en not_active Expired - Fee Related
- 2001-01-02 CA CA002330019A patent/CA2330019C/en not_active Expired - Fee Related
- 2001-01-19 CN CNB011016663A patent/CN1203464C/zh not_active Expired - Fee Related
- 2001-01-22 EP EP01300530A patent/EP1126601A3/en not_active Withdrawn
- 2001-01-29 BR BR0100192-2A patent/BR0100192A/pt not_active Application Discontinuation
- 2001-01-31 AU AU16739/01A patent/AU1673901A/en not_active Abandoned
- 2001-02-02 JP JP2001026212A patent/JP2001223410A/ja active Pending
- 2001-02-03 KR KR1020010005225A patent/KR100745428B1/ko not_active IP Right Cessation
-
2007
- 2007-10-01 US US11/906,196 patent/US8631547B2/en not_active Expired - Lifetime
-
2013
- 2013-10-18 JP JP2013217576A patent/JP5559411B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN1319835A (zh) | 2001-10-31 |
CA2642731C (en) | 2013-10-15 |
US8631547B2 (en) | 2014-01-21 |
KR100745428B1 (ko) | 2007-08-02 |
CA2330019C (en) | 2008-12-30 |
JP2014017881A (ja) | 2014-01-30 |
US7296329B1 (en) | 2007-11-20 |
CA2330019A1 (en) | 2001-08-04 |
US20080028585A1 (en) | 2008-02-07 |
CA2642731A1 (en) | 2001-08-04 |
CN1203464C (zh) | 2005-05-25 |
KR20010078314A (ko) | 2001-08-20 |
EP1126601A3 (en) | 2006-03-22 |
JP5559411B2 (ja) | 2014-07-23 |
EP1126601A2 (en) | 2001-08-22 |
AU1673901A (en) | 2001-08-09 |
JP2001223410A (ja) | 2001-08-17 |
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Legal Events
Date | Code | Title | Description |
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B11A | Dismissal acc. art.33 of ipl - examination not requested within 36 months of filing | ||
B11Y | Definitive dismissal - extension of time limit for request of examination expired [chapter 11.1.1 patent gazette] |