KR100701486B1 - 제어장치 및 전자제어 시스템에서의 자기진단방법 - Google Patents

제어장치 및 전자제어 시스템에서의 자기진단방법 Download PDF

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Publication number
KR100701486B1
KR100701486B1 KR1020020072294A KR20020072294A KR100701486B1 KR 100701486 B1 KR100701486 B1 KR 100701486B1 KR 1020020072294 A KR1020020072294 A KR 1020020072294A KR 20020072294 A KR20020072294 A KR 20020072294A KR 100701486 B1 KR100701486 B1 KR 100701486B1
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South Korea
Prior art keywords
power supply
data
self
time
low voltage
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Expired - Fee Related
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KR1020020072294A
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English (en)
Korean (ko)
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KR20030041824A (ko
Inventor
코미야모토키
Original Assignee
후지쓰 텐 가부시키가이샤
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Publication of KR20030041824A publication Critical patent/KR20030041824A/ko
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0286—Modifications to the monitored process, e.g. stopping operation or adapting control
    • G05B23/0291—Switching into safety or degraded mode, e.g. protection and supervision after failure

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Selective Calling Equipment (AREA)
KR1020020072294A 2001-11-21 2002-11-20 제어장치 및 전자제어 시스템에서의 자기진단방법 Expired - Fee Related KR100701486B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2001-00356136 2001-11-21
JP2001356136A JP2003158782A (ja) 2001-11-21 2001-11-21 制御装置および電子制御システムでの自己診断方法

Publications (2)

Publication Number Publication Date
KR20030041824A KR20030041824A (ko) 2003-05-27
KR100701486B1 true KR100701486B1 (ko) 2007-03-29

Family

ID=19167716

Family Applications (1)

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KR1020020072294A Expired - Fee Related KR100701486B1 (ko) 2001-11-21 2002-11-20 제어장치 및 전자제어 시스템에서의 자기진단방법

Country Status (4)

Country Link
US (1) US7093167B2 (enExample)
JP (1) JP2003158782A (enExample)
KR (1) KR100701486B1 (enExample)
CN (1) CN1275113C (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005301476A (ja) * 2004-04-08 2005-10-27 Hitachi Ltd 給電制御システム、及び記憶装置
US8032787B2 (en) * 2004-09-02 2011-10-04 Intel Corporation Volatile storage based power loss recovery mechanism
US7526674B2 (en) * 2005-12-22 2009-04-28 International Business Machines Corporation Methods and apparatuses for supplying power to processors in multiple processor systems
JP5164597B2 (ja) * 2008-02-14 2013-03-21 ローム株式会社 データ制御装置
US8063622B2 (en) 2009-10-02 2011-11-22 Power Integrations, Inc. Method and apparatus for implementing slew rate control using bypass capacitor
US8013669B2 (en) * 2009-10-27 2011-09-06 Apple Inc. Dynamic power noise event counter
JP6015054B2 (ja) 2012-03-27 2016-10-26 株式会社ソシオネクスト エラー応答回路、半導体集積回路及びデータ転送制御方法
CN104199434B (zh) * 2014-08-07 2017-05-10 奇瑞汽车股份有限公司 车内电子控制系统的功能检测装置和方法
JP6267105B2 (ja) * 2014-12-19 2018-01-24 ファナック株式会社 保守診断情報を出力する制御装置及び診断情報記録表示装置
KR101673780B1 (ko) 2015-06-16 2016-11-08 현대자동차주식회사 고장진단 제어방법
CN104865959B (zh) * 2015-06-19 2018-03-02 长春工业大学 一种消防电源控制系统的故障自诊断方法
KR102732156B1 (ko) * 2021-07-01 2024-11-20 (주)아이티공간 외란 검출을 통한 기기의 안전 관리시스템

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR19990005409A (ko) * 1997-06-30 1999-01-25 배순훈 가전기기의 불량 세트 자동 관리장치
KR20010034301A (ko) * 1998-11-25 2001-04-25 이데이 노부유끼 전자기기 및 전자기기의 동작제어방법
KR20010083734A (ko) * 2000-02-21 2001-09-01 구자홍 자동화기기의 장애코드 변환장치 및 변환방법

Family Cites Families (8)

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Publication number Priority date Publication date Assignee Title
US3890494A (en) * 1974-03-28 1975-06-17 Phillips Petroleum Co Apparatus and method for altering process control in response to a power interruption
US5019996A (en) * 1988-08-29 1991-05-28 Advanced Micro Devices, Inc. Programmable power supply level detection and initialization circuitry
US5555269A (en) 1993-10-29 1996-09-10 Carrier Corporation Error detection for HVAC systems
US5606511A (en) * 1995-01-05 1997-02-25 Microchip Technology Incorporated Microcontroller with brownout detection
JPH09282028A (ja) 1996-04-15 1997-10-31 Fuji Xerox Co Ltd 入力装置の自己診断装置
US6735720B1 (en) * 2000-05-31 2004-05-11 Microsoft Corporation Method and system for recovering a failed device on a master-slave bus
JP2002158668A (ja) * 2000-11-17 2002-05-31 Denso Corp 車両用ネットワークシステムの異常検出装置
US6898732B1 (en) * 2001-07-10 2005-05-24 Cisco Technology, Inc. Auto quiesce

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR19990005409A (ko) * 1997-06-30 1999-01-25 배순훈 가전기기의 불량 세트 자동 관리장치
KR20010034301A (ko) * 1998-11-25 2001-04-25 이데이 노부유끼 전자기기 및 전자기기의 동작제어방법
KR20010083734A (ko) * 2000-02-21 2001-09-01 구자홍 자동화기기의 장애코드 변환장치 및 변환방법

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
한국공개특허 제1999-0005409호 *
한국공개특허 제2001-0034301호
한국공개특허 제2001-0083734호 *

Also Published As

Publication number Publication date
CN1275113C (zh) 2006-09-13
US20030105992A1 (en) 2003-06-05
US7093167B2 (en) 2006-08-15
JP2003158782A (ja) 2003-05-30
KR20030041824A (ko) 2003-05-27
CN1420398A (zh) 2003-05-28

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