KR100700287B1 - 액정표시패널 검사 장비의 검사 스테이지 - Google Patents
액정표시패널 검사 장비의 검사 스테이지 Download PDFInfo
- Publication number
- KR100700287B1 KR100700287B1 KR1020050110859A KR20050110859A KR100700287B1 KR 100700287 B1 KR100700287 B1 KR 100700287B1 KR 1020050110859 A KR1020050110859 A KR 1020050110859A KR 20050110859 A KR20050110859 A KR 20050110859A KR 100700287 B1 KR100700287 B1 KR 100700287B1
- Authority
- KR
- South Korea
- Prior art keywords
- plate
- work table
- optical plate
- liquid crystal
- crystal display
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
- G02F1/133524—Light-guides, e.g. fibre-optic bundles, louvered or jalousie light-guides
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7604—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
- H10P72/7624—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2203/00—Function characteristic
- G02F2203/69—Arrangements or methods for testing or calibrating a device
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Mathematical Physics (AREA)
- Liquid Crystal (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
Claims (10)
- 액정표시패널 검사 장비의 검사 스테이지 있어서:상면에 검사를 위한 액정표시패널이 탑재되는 워크 테이블;상기 워크 테이블의 저면에 배치되는 백 라이트 유닛;상기 워크 테이블에 적어도 한 개 이상 구비되는 광학판; 및상기 광학판의 높낮이를 조절하기 위한 높낮이 조절부재를 포함하는 것을 특징으로 하는 검사 스테이지.
- 제1항에 있어서,상기 높낮이 조절부재는상기 광학판의 저면에 수평하게 설치되는 캠축; 및상기 광학판의 저면과 면접하도록 상기 캠축에 장착되어 상기 광학판의 높낮이를 가변시키는 캠을 포함하는 것을 특징으로 하는 검사 스테이지.
- 제2항에 있어서,상기 높낮이 조절부재는상기 캠축을 회전시키기 위한 핸들을 더 포함하는 것을 특징으로 하는 검사 스테이지.
- 제2항에 있어서,상기 높낮이 조절부재는상기 캠축을 회전시키기 위한 구동부를 더 포함하는 것을 특징으로 하는 검사 스테이지.
- 제4항에 있어서,상기 구동부는 모터와 상기 모터를 제어하는 제어부를 포함하는 것을 특징으로 하는 검사 스테이지.
- 제2항에 있어서,상기 워크 테이블은상기 광학판 보다 작은 크기의 개구부와, 상기 개구부를 둘러싸는 그리고 상면에는 액정표시패널이 놓여지고, 저면에는 상기 광학판의 가장자리가 위치되는 플랜지부를 갖으며,상기 플랜지부의 저면에는 상기 광학판의 상면 가장자리에 탄력적으로 접촉되는 탄성부재를 포함하는 것을 특징으로 하는 검사 스테이지.
- 제4항에 있어서,상기 높낮이 조절부재의 캠축은 상기 광학판의 저면을 가로질러 배치되는 것을 특징으로 하는 검사 스테이지.
- 제1항에 있어서,상기 광학판은 상기 워크 테이블에 설치되는 도광판과, 상기 도광판 상부면으로부터 소정 간격 이격된 상기 워크 테이블에 설치되는 확산판 또는 편광판을 포함하는 것을 특징으로 하는 검사 스테이지.
- 제1항에 있어서,상기 광학판은 상기 워크 테이블에 설치되는 도광판과, 상기 도광판 상부면에 위치되는 확산판 또는 편광판을 포함하는 것을 특징으로 하는 검사 스테이지.
- 제1항에 있어서,상기 높낮이 조절부재는 상기 광학판의 가장자리 4곳에 설치되어 상기 광학판의 기울기를 조절하는 것을 특징으로 하는 검사 스테이지.
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020050110859A KR100700287B1 (ko) | 2005-11-18 | 2005-11-18 | 액정표시패널 검사 장비의 검사 스테이지 |
| JP2006290974A JP2007140506A (ja) | 2005-11-18 | 2006-10-26 | 液晶表示パネル検査装備の検査ステージ |
| TW095141123A TW200720673A (en) | 2005-11-18 | 2006-11-07 | Inspecting stage of apparatus for inspecting of liquid crystal display panel |
| CNB2006101452020A CN100434977C (zh) | 2005-11-18 | 2006-11-17 | 液晶显示面板检查设备的检查台 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020050110859A KR100700287B1 (ko) | 2005-11-18 | 2005-11-18 | 액정표시패널 검사 장비의 검사 스테이지 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR100700287B1 true KR100700287B1 (ko) | 2007-03-29 |
Family
ID=38076172
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020050110859A Expired - Fee Related KR100700287B1 (ko) | 2005-11-18 | 2005-11-18 | 액정표시패널 검사 장비의 검사 스테이지 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP2007140506A (ko) |
| KR (1) | KR100700287B1 (ko) |
| CN (1) | CN100434977C (ko) |
| TW (1) | TW200720673A (ko) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101352125B1 (ko) | 2012-12-28 | 2014-01-15 | 양 전자시스템 주식회사 | 엘씨디 검사 장비용 스테이지의 평탄도 조절장치 |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101017626B1 (ko) * | 2009-08-27 | 2011-02-28 | (주)유비프리시젼 | Lcd검사 장비용 얼라인먼트 스테이지 |
| CN101922997B (zh) * | 2010-04-30 | 2012-07-04 | 苏州京东方茶谷电子有限公司 | 一种背光源点灯测试治具及其使用方法 |
| CN102636891A (zh) * | 2012-05-07 | 2012-08-15 | 华映视讯(吴江)有限公司 | 一种液晶面板的点灯测试方法 |
| KR101914231B1 (ko) * | 2012-05-30 | 2018-11-02 | 삼성디스플레이 주식회사 | 주사 전자 현미경을 이용한 검사 시스템 |
| CN102998823B (zh) | 2012-12-06 | 2015-04-08 | 京东方科技集团股份有限公司 | 点灯检查设备的偏光片支撑部件及点灯检查设备 |
| CN107728345A (zh) * | 2017-10-12 | 2018-02-23 | 京东方科技集团股份有限公司 | 点灯辅助装置 |
| CN108214416B (zh) * | 2018-01-03 | 2021-01-26 | 京东方科技集团股份有限公司 | 显示面板检测用工作台 |
| CN113885234B (zh) * | 2021-10-09 | 2022-06-21 | 京东方科技集团股份有限公司 | 一种液晶显示面板的修复系统 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003241681A (ja) * | 2002-02-20 | 2003-08-29 | Micronics Japan Co Ltd | 液晶表示パネルの検査テーブル |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN87216692U (zh) * | 1987-12-19 | 1988-08-31 | 郝世同 | 医用软硬变换床 |
| JPH1114956A (ja) * | 1997-06-23 | 1999-01-22 | Micronics Japan Co Ltd | 液晶パネル用検査ステージ |
| JP2002251149A (ja) * | 2001-02-26 | 2002-09-06 | Horiba Ltd | 平面表示パネルの欠陥検査装置 |
| KR20030077070A (ko) * | 2002-03-25 | 2003-10-01 | 엘지.필립스 엘시디 주식회사 | 중력불량측정용 카세트 |
| JP2005201646A (ja) * | 2004-01-13 | 2005-07-28 | Sharp Corp | 検査装置 |
-
2005
- 2005-11-18 KR KR1020050110859A patent/KR100700287B1/ko not_active Expired - Fee Related
-
2006
- 2006-10-26 JP JP2006290974A patent/JP2007140506A/ja active Pending
- 2006-11-07 TW TW095141123A patent/TW200720673A/zh unknown
- 2006-11-17 CN CNB2006101452020A patent/CN100434977C/zh not_active Expired - Fee Related
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003241681A (ja) * | 2002-02-20 | 2003-08-29 | Micronics Japan Co Ltd | 液晶表示パネルの検査テーブル |
Non-Patent Citations (1)
| Title |
|---|
| 15241681 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101352125B1 (ko) | 2012-12-28 | 2014-01-15 | 양 전자시스템 주식회사 | 엘씨디 검사 장비용 스테이지의 평탄도 조절장치 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN100434977C (zh) | 2008-11-19 |
| JP2007140506A (ja) | 2007-06-07 |
| TW200720673A (en) | 2007-06-01 |
| CN1967319A (zh) | 2007-05-23 |
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