TW200720673A - Inspecting stage of apparatus for inspecting of liquid crystal display panel - Google Patents

Inspecting stage of apparatus for inspecting of liquid crystal display panel

Info

Publication number
TW200720673A
TW200720673A TW095141123A TW95141123A TW200720673A TW 200720673 A TW200720673 A TW 200720673A TW 095141123 A TW095141123 A TW 095141123A TW 95141123 A TW95141123 A TW 95141123A TW 200720673 A TW200720673 A TW 200720673A
Authority
TW
Taiwan
Prior art keywords
inspecting
optical plate
liquid crystal
crystal display
display panel
Prior art date
Application number
TW095141123A
Other languages
Chinese (zh)
Inventor
Jae-Hoon Park
Original Assignee
Phicom Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Phicom Corp filed Critical Phicom Corp
Publication of TW200720673A publication Critical patent/TW200720673A/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G02F1/133524—Light-guides, e.g. fibre-optic bundles, louvered or jalousie light-guides
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68785—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2203/00—Function characteristic
    • G02F2203/69—Arrangements or methods for testing or calibrating a device

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Optics & Photonics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mathematical Physics (AREA)
  • Liquid Crystal (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

This present invention relates to an inspecting stage, on which a liquid crystal display panel used in an ignited-lamp inspection is placed. The inspecting stage of an inspecting apparatus for a liquid crystal display panel of this invention includes a worktable, on which a liquid crystal display panel for inspection is carried; a back-light unit, which is arranged at the bottom of the worktable; a first optical plate, which is mounted on the work-table; a second optical plate, which is placed on the first optical plate; a second optical plate, which is on the upper part of the said first optical plate; and a high/low adjusting member, which is used for adjusting the height of the first optical plate. An inspecting stage with such a construction on it can prevent the adsorption phenomenon between the first optical plate and the second optical plate caused by electrostatic charges.
TW095141123A 2005-11-18 2006-11-07 Inspecting stage of apparatus for inspecting of liquid crystal display panel TW200720673A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050110859A KR100700287B1 (en) 2005-11-18 2005-11-18 Inspecting stage of apparatus for inspecting of liquid crystal display panel

Publications (1)

Publication Number Publication Date
TW200720673A true TW200720673A (en) 2007-06-01

Family

ID=38076172

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095141123A TW200720673A (en) 2005-11-18 2006-11-07 Inspecting stage of apparatus for inspecting of liquid crystal display panel

Country Status (4)

Country Link
JP (1) JP2007140506A (en)
KR (1) KR100700287B1 (en)
CN (1) CN100434977C (en)
TW (1) TW200720673A (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101017626B1 (en) * 2009-08-27 2011-02-28 (주)유비프리시젼 Alignment stage for lcd tester
CN101922997B (en) * 2010-04-30 2012-07-04 苏州京东方茶谷电子有限公司 Backlight lighting test jig and application method thereof
CN102636891A (en) * 2012-05-07 2012-08-15 华映视讯（吴江）有限公司 Light-on test method of liquid crystal panel
KR101914231B1 (en) * 2012-05-30 2018-11-02 삼성디스플레이 주식회사 Inspection system using scanning electron microscope
CN102998823B (en) 2012-12-06 2015-04-08 京东方科技集团股份有限公司 Polarizer supporting part for lighting check equipment and lighting check equipment
KR101352125B1 (en) 2012-12-28 2014-01-15 양 전자시스템 주식회사 Adjustment apparatus for flatness of stage in lcd inspection equipment
CN107728345A (en) * 2017-10-12 2018-02-23 京东方科技集团股份有限公司 Lighting servicing unit
CN108214416B (en) * 2018-01-03 2021-01-26 京东方科技集团股份有限公司 Workbench for detecting display panel
CN113885234B (en) * 2021-10-09 2022-06-21 京东方科技集团股份有限公司 Repair system of liquid crystal display panel

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN87216692U (en) * 1987-12-19 1988-08-31 郝世同 Medical soft bed able to turn into hard bed
JPH1114956A (en) * 1997-06-23 1999-01-22 Micronics Japan Co Ltd Inspection stage for liquid crystal panel
JP2002251149A (en) * 2001-02-26 2002-09-06 Horiba Ltd Defect inspection device for planar display panel
JP4312990B2 (en) * 2002-02-20 2009-08-12 株式会社日本マイクロニクス LCD table inspection table
KR20030077070A (en) * 2002-03-25 2003-10-01 엘지.필립스 엘시디 주식회사 A Cassette for Measuring Gravitation Badness
JP2005201646A (en) * 2004-01-13 2005-07-28 Sharp Corp Inspection device

Also Published As

Publication number Publication date
KR100700287B1 (en) 2007-03-29
JP2007140506A (en) 2007-06-07
CN100434977C (en) 2008-11-19
CN1967319A (en) 2007-05-23

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