KR100658847B1 - 산화 처리장치 - Google Patents
산화 처리장치 Download PDFInfo
- Publication number
- KR100658847B1 KR100658847B1 KR1020010034607A KR20010034607A KR100658847B1 KR 100658847 B1 KR100658847 B1 KR 100658847B1 KR 1020010034607 A KR1020010034607 A KR 1020010034607A KR 20010034607 A KR20010034607 A KR 20010034607A KR 100658847 B1 KR100658847 B1 KR 100658847B1
- Authority
- KR
- South Korea
- Prior art keywords
- gas supply
- flange
- support frame
- heat treatment
- circular support
- Prior art date
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4409—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber characterised by sealing means
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45561—Gas plumbing upstream of the reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B33/00—After-treatment of single crystals or homogeneous polycrystalline material with defined structure
- C30B33/005—Oxydation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67109—Apparatus for thermal treatment mainly by convection
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T137/00—Fluid handling
- Y10T137/8593—Systems
- Y10T137/86348—Tank with internally extending flow guide, pipe or conduit
Abstract
Description
Claims (14)
- 피처리체를 수납할 수 있고, 개방부를 구비한 하부 끝단을 갖는 처리용기와,상기 개방부를 개폐할 수 있는 리드와,상기 개방부에 위치하고, 그 높이보다 더 큰 사이즈의 높이와 폭을 가지는 플랜지와,상기 플랜지는 폭 방향으로 연장되는 내부 가스공급구멍을 가지도록 형성되고,상기 플랜지에 위치하여 가스를 상기 처리용기에 공급하는 가스공급장치와,상기 피처리체를 가열하여 상기 처리용기에 수납되도록 하는 가열기구를 포함하는 것을 특징으로 하는 열처리 장치.
- 제 1 항에 있어서, 상기 가스공급장치는 상기 플랜지의 외부 모서리로부터 상기 처리용기의 내측으로 연장하는 가스공급구멍을 갖는 것을 특징으로 하는 열처리 장치.
- 제 2 항에 있어서, 상기 처리용기가 원통형이고, 상기 플랜지가 원형이며, 상기 가스공급구멍이 상기 플랜지의 방사 방향으로 연장하여 있는 것을 특징으로 하는 열처리 장치.
- 제 2 항에 있어서, 가스 공급관이 상기 처리용기 내로 연장하도록 상기 가스 공급구멍을 통해 삽입되는 것을 특징으로 하는 열처리 장치.
- 제 4 항에 있어서, 상기 플랜지가 상기 가스 공급관을 상기 플랜지에 고정할 수 있는 고정 기구를 구비한 것을 특징으로 하는 열처리 장치.
- 제 4 항에 있어서, 상기 가스 공급관이 가스 공급 라인에 기밀하게 접속되는 것을 특징으로 하는 열처리 장치.
- 제 6 항에 있어서, 원형 지지 프레임이 상기 플랜지의 주변 영역에 제공되고, 상기 원형 지지 프레임이 내부 모서리로부터 외부 모서리로 연장하는 관통 구멍을 가지며, 상기 가스 공급관이 상기 관통 구멍을 관통하는 것을 특징으로 하는 열처리 장치.
- 제 7 항에 있어서, 상기 원형 지지 프레임이 금속으로 이루어지는 것을 특징으로 하는 열처리 장치.
- 제 7 항에 있어서, 상기 원형지지 프레임이 상기 가스 공급관을 상기 원형지지 프레임에 고정할 수 있는 고정 기구를 구비한 것을 특징으로 하는 열처리 장치.
- 제 2 항에 있어서, 원형 지지 프레임이 상기 플랜지의 주변 영역에 제공되고, 상기 원형 지지 프레임이 내부 모서리로부터 외부 모서리로 연장하는 관통 구멍을 가지며, 상기 관통 구멍이 상기 가스 공급 구멍과 연통하는 것을 특징으로 하는 열처리 장치.
- 제 10 항에 있어서, 상기 원형 지지 프레임이 금속으로 이루어지는 것을 특징으로 하는 열처리 장치.
- 제 1 항에 있어서, 원형 지지 프레임이 상기 플랜지의 주변 영역에 제공되는 것을 특징으로 하는 열처리 장치.
- 제 12 항에 있어서, 상기 원형 지지 프레임이 금속으로 이루어지는 것을 특징으로 하는 열처리 장치.
- 피처리체를 수납하여 처리할 수 있고, 개방부를 구비한 하부 끝단을 갖는 처리용기와,상기 개방부를 개폐할 수 있는 리드와,가스공급장치와 상기 처리용기를 연결하는 연결수단과,상기 피처리체를 가열하여 상기 처리용기에 수납되도록 하는 가열기구를 포함하는 것을 특징으로 하는 열처리 장치.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP184310 | 2000-06-20 | ||
JP2000184310A JP3644880B2 (ja) | 2000-06-20 | 2000-06-20 | 縦型熱処理装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20020000116A KR20020000116A (ko) | 2002-01-04 |
KR100658847B1 true KR100658847B1 (ko) | 2006-12-15 |
Family
ID=18684770
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020010034607A KR100658847B1 (ko) | 2000-06-20 | 2001-06-19 | 산화 처리장치 |
Country Status (4)
Country | Link |
---|---|
US (1) | US6736636B2 (ko) |
JP (1) | JP3644880B2 (ko) |
KR (1) | KR100658847B1 (ko) |
TW (1) | TW556250B (ko) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4523225B2 (ja) * | 2002-09-24 | 2010-08-11 | 東京エレクトロン株式会社 | 熱処理装置 |
JP3802889B2 (ja) * | 2003-07-01 | 2006-07-26 | 東京エレクトロン株式会社 | 熱処理装置及びその校正方法 |
KR100943588B1 (ko) * | 2003-09-19 | 2010-02-23 | 가부시키가이샤 히다치 고쿠사이 덴키 | 반도체 장치의 제조 방법 및 기판 처리 장치 |
CN100539026C (zh) * | 2004-06-28 | 2009-09-09 | 东京毅力科创株式会社 | 成膜装置 |
JP4595702B2 (ja) * | 2004-07-15 | 2010-12-08 | 東京エレクトロン株式会社 | 成膜方法、成膜装置及び記憶媒体 |
JP4179311B2 (ja) * | 2004-07-28 | 2008-11-12 | 東京エレクトロン株式会社 | 成膜方法、成膜装置及び記憶媒体 |
JP4438850B2 (ja) | 2006-10-19 | 2010-03-24 | 東京エレクトロン株式会社 | 処理装置、このクリーニング方法及び記憶媒体 |
JP4924395B2 (ja) | 2007-12-07 | 2012-04-25 | 東京エレクトロン株式会社 | 処理装置及び処理方法 |
JP4929199B2 (ja) * | 2008-02-01 | 2012-05-09 | 株式会社日立国際電気 | 基板処理装置および半導体装置の製造方法 |
JP5237133B2 (ja) * | 2008-02-20 | 2013-07-17 | 株式会社日立国際電気 | 基板処理装置 |
JP5176771B2 (ja) * | 2008-08-14 | 2013-04-03 | 信越半導体株式会社 | 縦型熱処理装置及び熱処理方法 |
JP2009124161A (ja) * | 2008-12-26 | 2009-06-04 | Tokyo Electron Ltd | 熱処理装置 |
JP6345497B2 (ja) * | 2014-06-16 | 2018-06-20 | 古河機械金属株式会社 | ガス流通管の取付具及び気相成長装置 |
JP2016176584A (ja) * | 2015-03-23 | 2016-10-06 | 東京エレクトロン株式会社 | ガス導入配管接続構造及びこれを用いた基板処理装置 |
CH711296B1 (de) * | 2015-07-07 | 2019-03-15 | Besi Switzerland Ag | Durchlaufofen und Die-Bonder mit einem Durchlaufofen. |
JP6706901B2 (ja) | 2015-11-13 | 2020-06-10 | 東京エレクトロン株式会社 | 処理装置 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2464430A1 (fr) * | 1979-09-03 | 1981-03-06 | Liotard Freres Ste Metallurg | Reservoir a fluide sous pression |
JPS635626A (ja) | 1986-06-25 | 1988-01-11 | Matsushita Electric Works Ltd | 無線通信装置 |
JPH01241819A (ja) | 1988-03-23 | 1989-09-26 | Dainippon Screen Mfg Co Ltd | 基板の熱処理装置 |
JP3007432B2 (ja) * | 1991-02-19 | 2000-02-07 | 東京エレクトロン株式会社 | 熱処理装置 |
JPH05217929A (ja) * | 1992-01-31 | 1993-08-27 | Tokyo Electron Tohoku Kk | 酸化拡散処理装置 |
JP3450033B2 (ja) | 1993-09-22 | 2003-09-22 | 株式会社日立国際電気 | 熱処理装置 |
US5588827A (en) * | 1993-12-17 | 1996-12-31 | Brooks Automation Inc. | Passive gas substrate thermal conditioning apparatus and method |
JP3982844B2 (ja) * | 1995-01-12 | 2007-09-26 | 株式会社日立国際電気 | 半導体製造装置及び半導体の製造方法 |
US5662470A (en) * | 1995-03-31 | 1997-09-02 | Asm International N.V. | Vertical furnace |
JP3471144B2 (ja) * | 1995-09-06 | 2003-11-25 | 東京エレクトロン株式会社 | 縦型熱処理装置及びその断熱構造体並びに遮熱板 |
JP3579278B2 (ja) * | 1999-01-26 | 2004-10-20 | 東京エレクトロン株式会社 | 縦型熱処理装置及びシール装置 |
JP3479020B2 (ja) * | 2000-01-28 | 2003-12-15 | 東京エレクトロン株式会社 | 熱処理装置 |
-
2000
- 2000-06-20 JP JP2000184310A patent/JP3644880B2/ja not_active Expired - Fee Related
-
2001
- 2001-06-14 TW TW90114470A patent/TW556250B/zh not_active IP Right Cessation
- 2001-06-18 US US09/882,255 patent/US6736636B2/en not_active Expired - Lifetime
- 2001-06-19 KR KR1020010034607A patent/KR100658847B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
JP3644880B2 (ja) | 2005-05-11 |
KR20020000116A (ko) | 2002-01-04 |
JP2002009009A (ja) | 2002-01-11 |
US20010054386A1 (en) | 2001-12-27 |
TW556250B (en) | 2003-10-01 |
US6736636B2 (en) | 2004-05-18 |
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