KR100568226B1 - 전원 전압 측정 장치 - Google Patents

전원 전압 측정 장치 Download PDF

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Publication number
KR100568226B1
KR100568226B1 KR1020030080686A KR20030080686A KR100568226B1 KR 100568226 B1 KR100568226 B1 KR 100568226B1 KR 1020030080686 A KR1020030080686 A KR 1020030080686A KR 20030080686 A KR20030080686 A KR 20030080686A KR 100568226 B1 KR100568226 B1 KR 100568226B1
Authority
KR
South Korea
Prior art keywords
voltage
power supply
supply voltage
resistor
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020030080686A
Other languages
English (en)
Korean (ko)
Other versions
KR20050046426A (ko
Inventor
홍관표
이형용
Original Assignee
삼성전자주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자주식회사 filed Critical 삼성전자주식회사
Priority to KR1020030080686A priority Critical patent/KR100568226B1/ko
Priority to US10/893,341 priority patent/US7030635B2/en
Priority to JP2004331036A priority patent/JP4773078B2/ja
Publication of KR20050046426A publication Critical patent/KR20050046426A/ko
Application granted granted Critical
Publication of KR100568226B1 publication Critical patent/KR100568226B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Semiconductor Integrated Circuits (AREA)
KR1020030080686A 2003-11-14 2003-11-14 전원 전압 측정 장치 Expired - Fee Related KR100568226B1 (ko)

Priority Applications (3)

Application Number Priority Date Filing Date Title
KR1020030080686A KR100568226B1 (ko) 2003-11-14 2003-11-14 전원 전압 측정 장치
US10/893,341 US7030635B2 (en) 2003-11-14 2004-07-19 Device for measuring supply voltage and method thereof
JP2004331036A JP4773078B2 (ja) 2003-11-14 2004-11-15 電源電圧測定装置及び方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020030080686A KR100568226B1 (ko) 2003-11-14 2003-11-14 전원 전압 측정 장치

Publications (2)

Publication Number Publication Date
KR20050046426A KR20050046426A (ko) 2005-05-18
KR100568226B1 true KR100568226B1 (ko) 2006-04-07

Family

ID=34567745

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020030080686A Expired - Fee Related KR100568226B1 (ko) 2003-11-14 2003-11-14 전원 전압 측정 장치

Country Status (3)

Country Link
US (1) US7030635B2 (https=)
JP (1) JP4773078B2 (https=)
KR (1) KR100568226B1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100674988B1 (ko) * 2005-08-11 2007-01-29 삼성전자주식회사 패키지 번인 테스트가 가능한 반도체 집적 회로 및 번인테스트 방법
KR100813551B1 (ko) * 2006-12-07 2008-03-17 주식회사 하이닉스반도체 반도체 메모리 장치의 전압 검출회로
US20080302783A1 (en) * 2007-06-08 2008-12-11 Anthony Yeh Chiing Wong Actively controlled embedded burn-in board thermal heaters
US7701238B2 (en) * 2007-06-26 2010-04-20 Intel Corporation Active thermal control using a burn-in socket heating element
KR100934793B1 (ko) * 2007-12-24 2009-12-31 주식회사 동부하이텍 반도체 소자 테스트 방법 및 그 장치, 적정 스트레스 전압검출 방법
US8546904B2 (en) * 2011-07-11 2013-10-01 Transcend Information, Inc. Integrated circuit with temperature increasing element and electronic system having the same
US9715905B2 (en) 2015-08-12 2017-07-25 International Business Machines Corporation Detecting maximum voltage between multiple power supplies for memory testing
US10315696B2 (en) * 2017-04-03 2019-06-11 Robby Gordon Rod-end front suspension

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59128455A (ja) * 1983-01-14 1984-07-24 Rohm Co Ltd レベル表示装置
JP3077209B2 (ja) * 1991-02-15 2000-08-14 松下電工株式会社 電圧検知回路
JPH0653299A (ja) 1992-07-31 1994-02-25 Tokyo Electron Yamanashi Kk バーンイン装置
JP2977415B2 (ja) * 1993-08-17 1999-11-15 菊水電子工業株式会社 バッテリのピーク電圧およびディップ電圧検出装置
JP4358351B2 (ja) * 1999-04-27 2009-11-04 浜松ホトニクス株式会社 光検出装置
JP2001035193A (ja) 1999-07-16 2001-02-09 Mitsubishi Electric Corp 半導体記憶装置
DE10239859B3 (de) * 2002-08-29 2004-04-15 Advanced Micro Devices, Inc., Sunnyvale Vorrichtung und Verfahren zur Spannungsspitzen-Messung mit digitalem Speicher

Also Published As

Publication number Publication date
KR20050046426A (ko) 2005-05-18
US20050104611A1 (en) 2005-05-19
JP2005148074A (ja) 2005-06-09
JP4773078B2 (ja) 2011-09-14
US7030635B2 (en) 2006-04-18

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