JP4773078B2 - 電源電圧測定装置及び方法 - Google Patents

電源電圧測定装置及び方法 Download PDF

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Publication number
JP4773078B2
JP4773078B2 JP2004331036A JP2004331036A JP4773078B2 JP 4773078 B2 JP4773078 B2 JP 4773078B2 JP 2004331036 A JP2004331036 A JP 2004331036A JP 2004331036 A JP2004331036 A JP 2004331036A JP 4773078 B2 JP4773078 B2 JP 4773078B2
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JP
Japan
Prior art keywords
voltage
power supply
nth
supply voltage
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2004331036A
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English (en)
Japanese (ja)
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JP2005148074A5 (https=
JP2005148074A (ja
Inventor
官杓 洪
炯鎔 李
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
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Samsung Electronics Co Ltd
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Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of JP2005148074A publication Critical patent/JP2005148074A/ja
Publication of JP2005148074A5 publication Critical patent/JP2005148074A5/ja
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Publication of JP4773078B2 publication Critical patent/JP4773078B2/ja
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP2004331036A 2003-11-14 2004-11-15 電源電圧測定装置及び方法 Expired - Fee Related JP4773078B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020030080686A KR100568226B1 (ko) 2003-11-14 2003-11-14 전원 전압 측정 장치
KR2003-080686 2003-11-14

Publications (3)

Publication Number Publication Date
JP2005148074A JP2005148074A (ja) 2005-06-09
JP2005148074A5 JP2005148074A5 (https=) 2007-12-27
JP4773078B2 true JP4773078B2 (ja) 2011-09-14

Family

ID=34567745

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004331036A Expired - Fee Related JP4773078B2 (ja) 2003-11-14 2004-11-15 電源電圧測定装置及び方法

Country Status (3)

Country Link
US (1) US7030635B2 (https=)
JP (1) JP4773078B2 (https=)
KR (1) KR100568226B1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100674988B1 (ko) * 2005-08-11 2007-01-29 삼성전자주식회사 패키지 번인 테스트가 가능한 반도체 집적 회로 및 번인테스트 방법
KR100813551B1 (ko) * 2006-12-07 2008-03-17 주식회사 하이닉스반도체 반도체 메모리 장치의 전압 검출회로
US20080302783A1 (en) * 2007-06-08 2008-12-11 Anthony Yeh Chiing Wong Actively controlled embedded burn-in board thermal heaters
US7701238B2 (en) * 2007-06-26 2010-04-20 Intel Corporation Active thermal control using a burn-in socket heating element
KR100934793B1 (ko) * 2007-12-24 2009-12-31 주식회사 동부하이텍 반도체 소자 테스트 방법 및 그 장치, 적정 스트레스 전압검출 방법
US8546904B2 (en) * 2011-07-11 2013-10-01 Transcend Information, Inc. Integrated circuit with temperature increasing element and electronic system having the same
US9715905B2 (en) 2015-08-12 2017-07-25 International Business Machines Corporation Detecting maximum voltage between multiple power supplies for memory testing
US10315696B2 (en) * 2017-04-03 2019-06-11 Robby Gordon Rod-end front suspension

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59128455A (ja) * 1983-01-14 1984-07-24 Rohm Co Ltd レベル表示装置
JP3077209B2 (ja) * 1991-02-15 2000-08-14 松下電工株式会社 電圧検知回路
JPH0653299A (ja) 1992-07-31 1994-02-25 Tokyo Electron Yamanashi Kk バーンイン装置
JP2977415B2 (ja) * 1993-08-17 1999-11-15 菊水電子工業株式会社 バッテリのピーク電圧およびディップ電圧検出装置
JP4358351B2 (ja) * 1999-04-27 2009-11-04 浜松ホトニクス株式会社 光検出装置
JP2001035193A (ja) 1999-07-16 2001-02-09 Mitsubishi Electric Corp 半導体記憶装置
DE10239859B3 (de) * 2002-08-29 2004-04-15 Advanced Micro Devices, Inc., Sunnyvale Vorrichtung und Verfahren zur Spannungsspitzen-Messung mit digitalem Speicher

Also Published As

Publication number Publication date
KR20050046426A (ko) 2005-05-18
US20050104611A1 (en) 2005-05-19
KR100568226B1 (ko) 2006-04-07
JP2005148074A (ja) 2005-06-09
US7030635B2 (en) 2006-04-18

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