JP2005148074A5 - - Google Patents

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Publication number
JP2005148074A5
JP2005148074A5 JP2004331036A JP2004331036A JP2005148074A5 JP 2005148074 A5 JP2005148074 A5 JP 2005148074A5 JP 2004331036 A JP2004331036 A JP 2004331036A JP 2004331036 A JP2004331036 A JP 2004331036A JP 2005148074 A5 JP2005148074 A5 JP 2005148074A5
Authority
JP
Japan
Prior art keywords
power supply
voltage
supply voltage
unit
voltage measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2004331036A
Other languages
English (en)
Japanese (ja)
Other versions
JP4773078B2 (ja
JP2005148074A (ja
Filing date
Publication date
Priority claimed from KR1020030080686A external-priority patent/KR100568226B1/ko
Application filed filed Critical
Publication of JP2005148074A publication Critical patent/JP2005148074A/ja
Publication of JP2005148074A5 publication Critical patent/JP2005148074A5/ja
Application granted granted Critical
Publication of JP4773078B2 publication Critical patent/JP4773078B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2004331036A 2003-11-14 2004-11-15 電源電圧測定装置及び方法 Expired - Fee Related JP4773078B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR2003-080686 2003-11-14
KR1020030080686A KR100568226B1 (ko) 2003-11-14 2003-11-14 전원 전압 측정 장치

Publications (3)

Publication Number Publication Date
JP2005148074A JP2005148074A (ja) 2005-06-09
JP2005148074A5 true JP2005148074A5 (https=) 2007-12-27
JP4773078B2 JP4773078B2 (ja) 2011-09-14

Family

ID=34567745

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004331036A Expired - Fee Related JP4773078B2 (ja) 2003-11-14 2004-11-15 電源電圧測定装置及び方法

Country Status (3)

Country Link
US (1) US7030635B2 (https=)
JP (1) JP4773078B2 (https=)
KR (1) KR100568226B1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100674988B1 (ko) * 2005-08-11 2007-01-29 삼성전자주식회사 패키지 번인 테스트가 가능한 반도체 집적 회로 및 번인테스트 방법
KR100813551B1 (ko) * 2006-12-07 2008-03-17 주식회사 하이닉스반도체 반도체 메모리 장치의 전압 검출회로
US20080302783A1 (en) * 2007-06-08 2008-12-11 Anthony Yeh Chiing Wong Actively controlled embedded burn-in board thermal heaters
US7701238B2 (en) * 2007-06-26 2010-04-20 Intel Corporation Active thermal control using a burn-in socket heating element
KR100934793B1 (ko) * 2007-12-24 2009-12-31 주식회사 동부하이텍 반도체 소자 테스트 방법 및 그 장치, 적정 스트레스 전압검출 방법
US8546904B2 (en) * 2011-07-11 2013-10-01 Transcend Information, Inc. Integrated circuit with temperature increasing element and electronic system having the same
US9715905B2 (en) 2015-08-12 2017-07-25 International Business Machines Corporation Detecting maximum voltage between multiple power supplies for memory testing
US10633021B2 (en) * 2017-04-03 2020-04-28 Robby Gordon Modular chassis

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59128455A (ja) * 1983-01-14 1984-07-24 Rohm Co Ltd レベル表示装置
JP3077209B2 (ja) * 1991-02-15 2000-08-14 松下電工株式会社 電圧検知回路
JPH0653299A (ja) 1992-07-31 1994-02-25 Tokyo Electron Yamanashi Kk バーンイン装置
JP2977415B2 (ja) * 1993-08-17 1999-11-15 菊水電子工業株式会社 バッテリのピーク電圧およびディップ電圧検出装置
JP4358351B2 (ja) * 1999-04-27 2009-11-04 浜松ホトニクス株式会社 光検出装置
JP2001035193A (ja) 1999-07-16 2001-02-09 Mitsubishi Electric Corp 半導体記憶装置
DE10239859B3 (de) * 2002-08-29 2004-04-15 Advanced Micro Devices, Inc., Sunnyvale Vorrichtung und Verfahren zur Spannungsspitzen-Messung mit digitalem Speicher

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