KR100454122B1 - CVD 반응 장치용 다공 SiC 가이드 링의 제조방법 - Google Patents
CVD 반응 장치용 다공 SiC 가이드 링의 제조방법 Download PDFInfo
- Publication number
- KR100454122B1 KR100454122B1 KR10-2002-0019313A KR20020019313A KR100454122B1 KR 100454122 B1 KR100454122 B1 KR 100454122B1 KR 20020019313 A KR20020019313 A KR 20020019313A KR 100454122 B1 KR100454122 B1 KR 100454122B1
- Authority
- KR
- South Korea
- Prior art keywords
- guide ring
- porous sic
- porous
- wafer
- sic
- Prior art date
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Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4585—Devices at or outside the perimeter of the substrate support, e.g. clamping rings, shrouds
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
Abstract
Description
Claims (4)
- 삭제
- 삭제
- 다공 SiC 가이드 링(1) 두께를 가공할 웨이퍼(7)의 두께보다 얇고 상면이 평탄하도록 평면 연삭을 하는 단계(S10);상기 다공 SiC 가이드 링(1)의 외곽 치수를 지정된 치수로 가공 하는 단계(S20);상기 다공 SiC 가이드 링(1)의 내경을 경사지게 테이퍼 가공을 하는 단계(S30);상기 다공 SiC 가이드 링(1)을 600 ~ 800 ℃에서 0.5 ~ 2 시간 동안 열처리하여 불순물을 제거하는 단계(S40);상기 다공 SiC 가이드 링(1)의 표면을 산으로 세정하여, 상기 다공 SiC 가이드 링(1)의 표면의 금속 성분을 제거하는 1 차 세정 단계(S60);상기 다공 SiC 가이드 링(1)을 초음파를 통해 5 ~ 15 분 동안 세정을 하는 2 차 세정 단계(S70)를 포함하는 것을 특징으로 하는 다공 SiC 가이드 링의 제조 방법.
- 제 3 항에 있어서, 상기 테이퍼 가공의 구배는 40 ~ 45°인 것을 특징으로 하는 다공 SiC 가이드 링의 제조 방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2002-0019313A KR100454122B1 (ko) | 2002-04-09 | 2002-04-09 | CVD 반응 장치용 다공 SiC 가이드 링의 제조방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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KR10-2002-0019313A KR100454122B1 (ko) | 2002-04-09 | 2002-04-09 | CVD 반응 장치용 다공 SiC 가이드 링의 제조방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20030080600A KR20030080600A (ko) | 2003-10-17 |
KR100454122B1 true KR100454122B1 (ko) | 2004-10-26 |
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Application Number | Title | Priority Date | Filing Date |
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KR10-2002-0019313A KR100454122B1 (ko) | 2002-04-09 | 2002-04-09 | CVD 반응 장치용 다공 SiC 가이드 링의 제조방법 |
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KR (1) | KR100454122B1 (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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DE102006055038B4 (de) * | 2006-11-22 | 2012-12-27 | Siltronic Ag | Epitaxierte Halbleiterscheibe sowie Vorrichtung und Verfahren zur Herstellung einer epitaxierten Halbleiterscheibe |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5584936A (en) * | 1995-12-14 | 1996-12-17 | Cvd, Incorporated | Susceptor for semiconductor wafer processing |
JPH1083968A (ja) * | 1996-09-06 | 1998-03-31 | Toshiba Corp | 半導体製造装置 |
JPH11121435A (ja) * | 1997-10-08 | 1999-04-30 | Fujitsu Ltd | 基板処理装置及び基板処理方法 |
KR20010092914A (ko) * | 2000-03-27 | 2001-10-27 | 윤종용 | 섀도우 링을 구비하는 정전척 |
WO2002003427A2 (en) * | 2000-06-30 | 2002-01-10 | Lam Research Corporation | Semiconductor processing equipment having improved particle performance |
-
2002
- 2002-04-09 KR KR10-2002-0019313A patent/KR100454122B1/ko active IP Right Grant
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5584936A (en) * | 1995-12-14 | 1996-12-17 | Cvd, Incorporated | Susceptor for semiconductor wafer processing |
JPH1083968A (ja) * | 1996-09-06 | 1998-03-31 | Toshiba Corp | 半導体製造装置 |
JPH11121435A (ja) * | 1997-10-08 | 1999-04-30 | Fujitsu Ltd | 基板処理装置及び基板処理方法 |
KR20010092914A (ko) * | 2000-03-27 | 2001-10-27 | 윤종용 | 섀도우 링을 구비하는 정전척 |
WO2002003427A2 (en) * | 2000-06-30 | 2002-01-10 | Lam Research Corporation | Semiconductor processing equipment having improved particle performance |
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KR20030080600A (ko) | 2003-10-17 |
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