JPWO2023188971A5 - - Google Patents

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Publication number
JPWO2023188971A5
JPWO2023188971A5 JP2024511422A JP2024511422A JPWO2023188971A5 JP WO2023188971 A5 JPWO2023188971 A5 JP WO2023188971A5 JP 2024511422 A JP2024511422 A JP 2024511422A JP 2024511422 A JP2024511422 A JP 2024511422A JP WO2023188971 A5 JPWO2023188971 A5 JP WO2023188971A5
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JP
Japan
Prior art keywords
unit
semiconductor layer
electrode
source
semiconductor device
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Pending
Application number
JP2024511422A
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English (en)
Japanese (ja)
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JPWO2023188971A1 (https=
Publication date
Application filed filed Critical
Priority claimed from PCT/JP2023/005731 external-priority patent/WO2023188971A1/ja
Publication of JPWO2023188971A1 publication Critical patent/JPWO2023188971A1/ja
Publication of JPWO2023188971A5 publication Critical patent/JPWO2023188971A5/ja
Pending legal-status Critical Current

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JP2024511422A 2022-03-28 2023-02-17 Pending JPWO2023188971A1 (https=)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US202263324387P 2022-03-28 2022-03-28
US202263324402P 2022-03-28 2022-03-28
PCT/JP2023/005731 WO2023188971A1 (ja) 2022-03-28 2023-02-17 電力増幅用半導体装置

Publications (2)

Publication Number Publication Date
JPWO2023188971A1 JPWO2023188971A1 (https=) 2023-10-05
JPWO2023188971A5 true JPWO2023188971A5 (https=) 2024-12-10

Family

ID=88200413

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2024511422A Pending JPWO2023188971A1 (https=) 2022-03-28 2023-02-17
JP2024511421A Pending JPWO2023188970A1 (https=) 2022-03-28 2023-02-17

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2024511421A Pending JPWO2023188970A1 (https=) 2022-03-28 2023-02-17

Country Status (3)

Country Link
US (2) US20250015149A1 (https=)
JP (2) JPWO2023188971A1 (https=)
WO (2) WO2023188971A1 (https=)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3135851B2 (ja) * 1996-11-11 2001-02-19 松下電器産業株式会社 電界効果トランジスタ、半導体集積回路装置及び電界効果トランジスタの製造方法
US20130175544A1 (en) * 2010-11-10 2013-07-11 Mitsubishi Electric Corporation Semiconductor device, and method of manufacturing semiconductor device
JP7063186B2 (ja) * 2018-08-16 2022-05-09 富士通株式会社 化合物半導体装置、化合物半導体装置の製造方法及び増幅器
JP2022016950A (ja) * 2020-07-13 2022-01-25 富士通株式会社 半導体装置
US11387169B2 (en) * 2020-08-04 2022-07-12 Nxp Usa, Inc. Transistor with I/O ports in an active area of the transistor

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