JPWO2023157452A5 - - Google Patents

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Publication number
JPWO2023157452A5
JPWO2023157452A5 JP2024500984A JP2024500984A JPWO2023157452A5 JP WO2023157452 A5 JPWO2023157452 A5 JP WO2023157452A5 JP 2024500984 A JP2024500984 A JP 2024500984A JP 2024500984 A JP2024500984 A JP 2024500984A JP WO2023157452 A5 JPWO2023157452 A5 JP WO2023157452A5
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JP
Japan
Prior art keywords
electrode
field plate
layer
nitride semiconductor
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2024500984A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2023157452A1 (https=
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/JP2022/046702 external-priority patent/WO2023157452A1/ja
Publication of JPWO2023157452A1 publication Critical patent/JPWO2023157452A1/ja
Publication of JPWO2023157452A5 publication Critical patent/JPWO2023157452A5/ja
Pending legal-status Critical Current

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JP2024500984A 2022-02-17 2022-12-19 Pending JPWO2023157452A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022022919 2022-02-17
PCT/JP2022/046702 WO2023157452A1 (ja) 2022-02-17 2022-12-19 窒化物半導体装置

Publications (2)

Publication Number Publication Date
JPWO2023157452A1 JPWO2023157452A1 (https=) 2023-08-24
JPWO2023157452A5 true JPWO2023157452A5 (https=) 2024-10-23

Family

ID=87578042

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024500984A Pending JPWO2023157452A1 (https=) 2022-02-17 2022-12-19

Country Status (5)

Country Link
US (1) US20240405117A1 (https=)
JP (1) JPWO2023157452A1 (https=)
CN (1) CN118696416A (https=)
DE (1) DE112022006355T5 (https=)
WO (1) WO2023157452A1 (https=)

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6014984B2 (ja) * 2011-09-29 2016-10-26 富士通株式会社 半導体装置及びその製造方法
JP2013157407A (ja) * 2012-01-27 2013-08-15 Fujitsu Semiconductor Ltd 化合物半導体装置及びその製造方法
JP2016139718A (ja) * 2015-01-28 2016-08-04 株式会社東芝 半導体装置
JP7095982B2 (ja) * 2017-12-07 2022-07-05 住友電工デバイス・イノベーション株式会社 半導体装置
US12550356B2 (en) * 2019-04-15 2026-02-10 Rohm Co. Ltd. Nitride semiconductor device and method for manufacturing same
CN110071173B (zh) * 2019-04-30 2023-04-18 英诺赛科(珠海)科技有限公司 半导体装置及其制造方法
US12501644B2 (en) * 2020-07-31 2025-12-16 Taiwan Semiconductor Manufacturing Co., Ltd. Gallium nitride-based device with step-wise field plate and method making the same

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