JPWO2022249872A5 - - Google Patents

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JPWO2022249872A5
JPWO2022249872A5 JP2023523394A JP2023523394A JPWO2022249872A5 JP WO2022249872 A5 JPWO2022249872 A5 JP WO2022249872A5 JP 2023523394 A JP2023523394 A JP 2023523394A JP 2023523394 A JP2023523394 A JP 2023523394A JP WO2022249872 A5 JPWO2022249872 A5 JP WO2022249872A5
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Japan
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electrode
semiconductor device
layer
semiconductor
manufacturing
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JP2023523394A
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English (en)
Japanese (ja)
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JP7632606B2 (ja
JPWO2022249872A1 (https=
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Priority claimed from PCT/JP2022/019691 external-priority patent/WO2022249872A1/ja
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JP2023523394A 2021-05-26 2022-05-09 半導体装置、電子デバイス、pHセンサ、バイオセンサ、半導体装置の製造方法、及び電子デバイスの製造方法 Active JP7632606B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021088679 2021-05-26
JP2021088679 2021-05-26
PCT/JP2022/019691 WO2022249872A1 (ja) 2021-05-26 2022-05-09 半導体装置、電子デバイス、pHセンサ、バイオセンサ、半導体装置の製造方法、及び電子デバイスの製造方法

Publications (3)

Publication Number Publication Date
JPWO2022249872A1 JPWO2022249872A1 (https=) 2022-12-01
JPWO2022249872A5 true JPWO2022249872A5 (https=) 2024-02-26
JP7632606B2 JP7632606B2 (ja) 2025-02-19

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JP2023523394A Active JP7632606B2 (ja) 2021-05-26 2022-05-09 半導体装置、電子デバイス、pHセンサ、バイオセンサ、半導体装置の製造方法、及び電子デバイスの製造方法

Country Status (5)

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US (1) US20240201125A1 (https=)
JP (1) JP7632606B2 (https=)
KR (1) KR102813570B1 (https=)
CN (1) CN117716515A (https=)
WO (1) WO2022249872A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20250234597A1 (en) * 2023-04-28 2025-07-17 Hefei Xinsheng Optoelectronics Technology Co., Ltd. Thin film transistor and method for manufacturing same, and method for manufacturing display substrate
JP7457311B1 (ja) 2023-09-11 2024-03-28 株式会社Pxp 太陽電池及び太陽電池の製造方法
WO2025141646A1 (ja) * 2023-12-25 2025-07-03 株式会社ニコン 半導体装置、電子デバイス、pHセンサ、バイオセンサ、及び半導体装置の製造方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5095864B2 (ja) 2009-12-09 2012-12-12 シャープ株式会社 半導体装置およびその製造方法
US9356156B2 (en) * 2013-05-24 2016-05-31 Cbrite Inc. Stable high mobility MOTFT and fabrication at low temperature
US9806200B2 (en) * 2015-03-27 2017-10-31 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JPWO2018025647A1 (ja) * 2016-08-03 2019-06-20 株式会社ニコン 半導体装置、pHセンサ、バイオセンサ、及び半導体装置の製造方法
JP7147953B2 (ja) * 2019-02-25 2022-10-05 株式会社ニコン 半導体装置、pHセンサ及びバイオセンサ並びに半導体装置の製造方法

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