JPWO2022249872A5 - - Google Patents
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- Publication number
- JPWO2022249872A5 JPWO2022249872A5 JP2023523394A JP2023523394A JPWO2022249872A5 JP WO2022249872 A5 JPWO2022249872 A5 JP WO2022249872A5 JP 2023523394 A JP2023523394 A JP 2023523394A JP 2023523394 A JP2023523394 A JP 2023523394A JP WO2022249872 A5 JPWO2022249872 A5 JP WO2022249872A5
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- semiconductor device
- layer
- semiconductor
- manufacturing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 claims 21
- 238000004519 manufacturing process Methods 0.000 claims 5
- 238000000034 method Methods 0.000 claims 4
- 238000005530 etching Methods 0.000 claims 1
- 229910052733 gallium Inorganic materials 0.000 claims 1
- 229910052738 indium Inorganic materials 0.000 claims 1
- 229910052725 zinc Inorganic materials 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021088679 | 2021-05-26 | ||
| JP2021088679 | 2021-05-26 | ||
| PCT/JP2022/019691 WO2022249872A1 (ja) | 2021-05-26 | 2022-05-09 | 半導体装置、電子デバイス、pHセンサ、バイオセンサ、半導体装置の製造方法、及び電子デバイスの製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPWO2022249872A1 JPWO2022249872A1 (https=) | 2022-12-01 |
| JPWO2022249872A5 true JPWO2022249872A5 (https=) | 2024-02-26 |
| JP7632606B2 JP7632606B2 (ja) | 2025-02-19 |
Family
ID=84229946
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023523394A Active JP7632606B2 (ja) | 2021-05-26 | 2022-05-09 | 半導体装置、電子デバイス、pHセンサ、バイオセンサ、半導体装置の製造方法、及び電子デバイスの製造方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20240201125A1 (https=) |
| JP (1) | JP7632606B2 (https=) |
| KR (1) | KR102813570B1 (https=) |
| CN (1) | CN117716515A (https=) |
| WO (1) | WO2022249872A1 (https=) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20250234597A1 (en) * | 2023-04-28 | 2025-07-17 | Hefei Xinsheng Optoelectronics Technology Co., Ltd. | Thin film transistor and method for manufacturing same, and method for manufacturing display substrate |
| JP7457311B1 (ja) | 2023-09-11 | 2024-03-28 | 株式会社Pxp | 太陽電池及び太陽電池の製造方法 |
| WO2025141646A1 (ja) * | 2023-12-25 | 2025-07-03 | 株式会社ニコン | 半導体装置、電子デバイス、pHセンサ、バイオセンサ、及び半導体装置の製造方法 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5095864B2 (ja) | 2009-12-09 | 2012-12-12 | シャープ株式会社 | 半導体装置およびその製造方法 |
| US9356156B2 (en) * | 2013-05-24 | 2016-05-31 | Cbrite Inc. | Stable high mobility MOTFT and fabrication at low temperature |
| US9806200B2 (en) * | 2015-03-27 | 2017-10-31 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| JPWO2018025647A1 (ja) * | 2016-08-03 | 2019-06-20 | 株式会社ニコン | 半導体装置、pHセンサ、バイオセンサ、及び半導体装置の製造方法 |
| JP7147953B2 (ja) * | 2019-02-25 | 2022-10-05 | 株式会社ニコン | 半導体装置、pHセンサ及びバイオセンサ並びに半導体装置の製造方法 |
-
2022
- 2022-05-09 JP JP2023523394A patent/JP7632606B2/ja active Active
- 2022-05-09 KR KR1020237039432A patent/KR102813570B1/ko active Active
- 2022-05-09 CN CN202280046363.1A patent/CN117716515A/zh active Pending
- 2022-05-09 WO PCT/JP2022/019691 patent/WO2022249872A1/ja not_active Ceased
-
2023
- 2023-11-21 US US18/516,083 patent/US20240201125A1/en active Pending
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