JPWO2021214932A1 - - Google Patents

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Publication number
JPWO2021214932A1
JPWO2021214932A1 JP2022516570A JP2022516570A JPWO2021214932A1 JP WO2021214932 A1 JPWO2021214932 A1 JP WO2021214932A1 JP 2022516570 A JP2022516570 A JP 2022516570A JP 2022516570 A JP2022516570 A JP 2022516570A JP WO2021214932 A1 JPWO2021214932 A1 JP WO2021214932A1
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2022516570A
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Japanese (ja)
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JP7298779B2 (ja
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Publication of JPWO2021214932A1 publication Critical patent/JPWO2021214932A1/ja
Application granted granted Critical
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Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/01Manufacture or treatment
    • H10D30/015Manufacture or treatment of FETs having heterojunction interface channels or heterojunction gate electrodes, e.g. HEMT
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D10/00Bipolar junction transistors [BJT]
    • H10D10/80Heterojunction BJTs
    • H10D10/821Vertical heterojunction BJTs
    • H10D10/841Vertical heterojunction BJTs having a two-dimensional base, e.g. modulation-doped base, inversion layer base or delta-doped base
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D10/00Bipolar junction transistors [BJT]
    • H10D10/01Manufacture or treatment
    • H10D10/021Manufacture or treatment of heterojunction BJTs [HBT]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/40FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels
    • H10D30/47FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels having two-dimensional [2D] charge carrier gas channels, e.g. nanoribbon FETs or high electron mobility transistors [HEMT]
    • H10D30/471High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT]
    • H10D30/475High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT] having wider bandgap layer formed on top of lower bandgap active layer, e.g. undoped barrier HEMTs such as i-AlGaN/GaN HEMTs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • H10D62/85Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group III-V materials, e.g. GaAs
    • H10D62/8503Nitride Group III-V materials, e.g. AlN or GaN

Landscapes

  • Bipolar Transistors (AREA)
  • Electrodes Of Semiconductors (AREA)
JP2022516570A 2020-04-23 2020-04-23 半導体装置およびその製造方法 Active JP7298779B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/017453 WO2021214932A1 (ja) 2020-04-23 2020-04-23 半導体装置およびその製造方法

Publications (2)

Publication Number Publication Date
JPWO2021214932A1 true JPWO2021214932A1 (https=) 2021-10-28
JP7298779B2 JP7298779B2 (ja) 2023-06-27

Family

ID=78270510

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022516570A Active JP7298779B2 (ja) 2020-04-23 2020-04-23 半導体装置およびその製造方法

Country Status (3)

Country Link
US (1) US20230207661A1 (https=)
JP (1) JP7298779B2 (https=)
WO (1) WO2021214932A1 (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102944587B1 (ko) * 2021-06-25 2026-03-25 삼성전자주식회사 고전자이동도 트랜지스터 및 그 제조 방법
JP7740373B2 (ja) * 2021-12-16 2025-09-17 Ntt株式会社 ヘテロ接合バイポーラトランジスタ
TR2022006355A2 (tr) * 2022-04-20 2022-06-21 Antalya Bilim Ueniversitesi İki̇ boyutlu deşi̇k gazi i̇çeren ve g-modunda çalişabi̇len transi̇stör aygit yapisi
JP7765368B2 (ja) * 2022-09-16 2025-11-06 株式会社東芝 半導体装置
JPWO2024116263A1 (https=) * 2022-11-29 2024-06-06
FR3160267A1 (fr) * 2024-03-15 2025-09-19 Soitec Procédé de fabrication d’une structure verticale de nitrure de gallium et d’un dispositif basé sur cette structure

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007142365A (ja) * 2005-11-22 2007-06-07 National Central Univ p型ひずみInGaNベース層を有するGaNヘテロ接合バイポーラトランジスタとその製造方法
JP2008016615A (ja) * 2006-07-05 2008-01-24 Matsushita Electric Ind Co Ltd バイポーラトランジスタ
US20140264380A1 (en) * 2013-03-15 2014-09-18 The Government Of The United States Of America, As Represented By The Secretary Of The Navy Complementary Field Effect Transistors Using Gallium Polar and Nitrogen Polar III-Nitride Material
JP2017139338A (ja) * 2016-02-04 2017-08-10 株式会社パウデック ヘテロ接合バイポーラトランジスタおよび電気機器
JP2018046168A (ja) * 2016-09-15 2018-03-22 株式会社東芝 半導体装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8174048B2 (en) * 2004-01-23 2012-05-08 International Rectifier Corporation III-nitride current control device and method of manufacture
JP2008004779A (ja) * 2006-06-23 2008-01-10 Matsushita Electric Ind Co Ltd 窒化物半導体バイポーラトランジスタ及び窒化物半導体バイポーラトランジスタの製造方法
JP2011204717A (ja) * 2010-03-24 2011-10-13 Sanken Electric Co Ltd 化合物半導体装置
JP6242678B2 (ja) * 2013-12-25 2017-12-06 住友化学株式会社 窒化物半導体素子及びその製造方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007142365A (ja) * 2005-11-22 2007-06-07 National Central Univ p型ひずみInGaNベース層を有するGaNヘテロ接合バイポーラトランジスタとその製造方法
JP2008016615A (ja) * 2006-07-05 2008-01-24 Matsushita Electric Ind Co Ltd バイポーラトランジスタ
US20140264380A1 (en) * 2013-03-15 2014-09-18 The Government Of The United States Of America, As Represented By The Secretary Of The Navy Complementary Field Effect Transistors Using Gallium Polar and Nitrogen Polar III-Nitride Material
JP2017139338A (ja) * 2016-02-04 2017-08-10 株式会社パウデック ヘテロ接合バイポーラトランジスタおよび電気機器
JP2018046168A (ja) * 2016-09-15 2018-03-22 株式会社東芝 半導体装置

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
HO, JIN-KUO ET AL.: "Low-resistance ohmic contacts to p-type GaN achieved by the oxidation of Ni/Au film", JOURNAL OF APPLIED PHYSICS, vol. 86, no. 8, JPN7023001708, 15 October 1999 (1999-10-15), US, pages 4491 - 4497, XP012048827, ISSN: 0005059708, DOI: 10.1063/1.371392 *
安藤 悠人 他: "2次元正孔ガスを用いたコレクタトップ縦型GaN-HBTの作製", 第64回応用物理学会春季学術講演会 講演予稿集, JPN6023017864, 5 September 2017 (2017-09-05), JP, pages 315 - 7, ISSN: 0005059709 *

Also Published As

Publication number Publication date
JP7298779B2 (ja) 2023-06-27
US20230207661A1 (en) 2023-06-29
WO2021214932A1 (ja) 2021-10-28

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