JPWO2021161684A1 - - Google Patents
Info
- Publication number
- JPWO2021161684A1 JPWO2021161684A1 JP2022500259A JP2022500259A JPWO2021161684A1 JP WO2021161684 A1 JPWO2021161684 A1 JP WO2021161684A1 JP 2022500259 A JP2022500259 A JP 2022500259A JP 2022500259 A JP2022500259 A JP 2022500259A JP WO2021161684 A1 JPWO2021161684 A1 JP WO2021161684A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
- G01B11/0633—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection using one or more discrete wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0608—Height gauges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/027—Control of working procedures of a spectrometer; Failure detection; Bandwidth calculation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
- G01J3/36—Investigating two or more bands of a spectrum by separate detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/10—Beam splitting or combining systems
- G02B27/14—Beam splitting or combining systems operating by reflection only
- G02B27/141—Beam splitting or combining systems operating by reflection only using dichroic mirrors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/9501—Semiconductor wafers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Mathematical Physics (AREA)
- Optics & Photonics (AREA)
- Electromagnetism (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Spectrometry And Color Measurement (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2023135422A JP2023169165A (ja) | 2020-02-13 | 2023-08-23 | コンピュータ、プログラム、及び方法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2020022724 | 2020-02-13 | ||
PCT/JP2021/000041 WO2021161684A1 (ja) | 2020-02-13 | 2021-01-04 | 撮像ユニット及び測定装置 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2023135422A Division JP2023169165A (ja) | 2020-02-13 | 2023-08-23 | コンピュータ、プログラム、及び方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPWO2021161684A1 true JPWO2021161684A1 (ja) | 2021-08-19 |
Family
ID=77291527
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2022500259A Pending JPWO2021161684A1 (ja) | 2020-02-13 | 2021-01-04 | |
JP2022500339A Pending JPWO2021161854A1 (ja) | 2020-02-13 | 2021-02-02 | |
JP2023135422A Pending JP2023169165A (ja) | 2020-02-13 | 2023-08-23 | コンピュータ、プログラム、及び方法 |
Family Applications After (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2022500339A Pending JPWO2021161854A1 (ja) | 2020-02-13 | 2021-02-02 | |
JP2023135422A Pending JP2023169165A (ja) | 2020-02-13 | 2023-08-23 | コンピュータ、プログラム、及び方法 |
Country Status (7)
Country | Link |
---|---|
US (3) | US20230061667A1 (ja) |
EP (3) | EP4086597A4 (ja) |
JP (3) | JPWO2021161684A1 (ja) |
KR (3) | KR20220137629A (ja) |
CN (3) | CN115087849A (ja) |
TW (3) | TW202200972A (ja) |
WO (3) | WO2021161684A1 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2023088595A (ja) * | 2021-12-15 | 2023-06-27 | 浜松ホトニクス株式会社 | 計測装置及び計測方法 |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3400493B2 (ja) | 1993-07-14 | 2003-04-28 | 協立電機株式会社 | プリント基板上の物体の高さ検査装置 |
JPH1047926A (ja) * | 1996-08-07 | 1998-02-20 | Dainippon Screen Mfg Co Ltd | 膜厚測定装置および膜厚測定方法 |
JP3668466B2 (ja) * | 2002-05-10 | 2005-07-06 | 松下電器産業株式会社 | 実時間レンジファインダ |
JP2004069651A (ja) * | 2002-08-09 | 2004-03-04 | Omron Corp | 膜厚測定装置 |
JP2006276840A (ja) * | 2005-03-03 | 2006-10-12 | Olympus Corp | 顕微鏡装置、その制御装置、及びプログラム |
JP2007101399A (ja) | 2005-10-05 | 2007-04-19 | Nikon Corp | 高さ測定装置および方法 |
JP5332192B2 (ja) | 2007-12-17 | 2013-11-06 | 株式会社ニコン | 3次元形状測定装置 |
US8040513B2 (en) * | 2008-06-18 | 2011-10-18 | Till I.D. Gmbh | Dual emission microscope |
DE102008044375A1 (de) * | 2008-12-05 | 2010-06-10 | Robert Bosch Gmbh | Optisches Messgerät |
US20110071784A1 (en) * | 2009-09-21 | 2011-03-24 | Nikon Corporation | Goos-Hanchen compensation in autofocus systems |
JP2012137394A (ja) * | 2010-12-27 | 2012-07-19 | Honda Motor Co Ltd | 三次元形状測定装置 |
JP6285112B2 (ja) | 2013-06-03 | 2018-02-28 | 浜松ホトニクス株式会社 | 光分割装置 |
JP6261883B2 (ja) * | 2013-06-03 | 2018-01-17 | 浜松ホトニクス株式会社 | 光観察装置、それに用いる撮像装置、及び光観察方法 |
JP2015211727A (ja) * | 2014-05-01 | 2015-11-26 | オリンパス株式会社 | 内視鏡装置 |
JP6391345B2 (ja) * | 2014-07-29 | 2018-09-19 | オリンパス株式会社 | 顕微鏡システム |
JP6394514B2 (ja) * | 2015-06-25 | 2018-09-26 | Jfeスチール株式会社 | 表面欠陥検出方法、表面欠陥検出装置、及び鋼材の製造方法 |
DE102015218720A1 (de) * | 2015-09-29 | 2016-09-15 | Carl Zeiss Meditec Ag | Beleuchtungsvorrichtung für ein Operationsmikroskop |
CN106052871A (zh) * | 2016-06-03 | 2016-10-26 | 哈尔滨工业大学深圳研究生院 | 针对led全光谱检测的快速多通道光谱仪 |
JP2018116032A (ja) * | 2017-01-20 | 2018-07-26 | キヤノン株式会社 | 被計測物の形状を計測する計測装置 |
JP6285597B1 (ja) | 2017-06-05 | 2018-02-28 | 大塚電子株式会社 | 光学測定装置および光学測定方法 |
JP2019144217A (ja) * | 2018-02-20 | 2019-08-29 | 国立大学法人千葉大学 | 膜厚測定装置、これを用いた蒸着装置及び膜特性評価装置 |
-
2021
- 2021-01-04 JP JP2022500259A patent/JPWO2021161684A1/ja active Pending
- 2021-01-04 KR KR1020227024143A patent/KR20220137629A/ko unknown
- 2021-01-04 US US17/797,206 patent/US20230061667A1/en active Pending
- 2021-01-04 CN CN202180013797.7A patent/CN115087849A/zh active Pending
- 2021-01-04 WO PCT/JP2021/000041 patent/WO2021161684A1/ja unknown
- 2021-01-04 EP EP21754639.9A patent/EP4086597A4/en active Pending
- 2021-01-26 TW TW110102791A patent/TW202200972A/zh unknown
- 2021-02-02 CN CN202180013788.8A patent/CN115104002A/zh active Pending
- 2021-02-02 JP JP2022500339A patent/JPWO2021161854A1/ja active Pending
- 2021-02-02 EP EP21753865.1A patent/EP4067842A4/en active Pending
- 2021-02-02 KR KR1020227018393A patent/KR20220137616A/ko unknown
- 2021-02-02 US US17/797,179 patent/US20230066638A1/en active Pending
- 2021-02-02 WO PCT/JP2021/003768 patent/WO2021161854A1/ja unknown
- 2021-02-08 TW TW110104642A patent/TW202140992A/zh unknown
- 2021-02-09 WO PCT/JP2021/004743 patent/WO2021161986A1/ja unknown
- 2021-02-09 TW TW110105149A patent/TW202140993A/zh unknown
- 2021-02-09 EP EP21754650.6A patent/EP4067843A4/en active Pending
- 2021-02-09 KR KR1020227018154A patent/KR20220137615A/ko active Search and Examination
- 2021-02-09 US US17/797,193 patent/US20230058064A1/en active Pending
- 2021-02-09 CN CN202180013891.2A patent/CN115104000A/zh active Pending
-
2023
- 2023-08-23 JP JP2023135422A patent/JP2023169165A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
CN115087849A (zh) | 2022-09-20 |
KR20220137629A (ko) | 2022-10-12 |
WO2021161986A1 (ja) | 2021-08-19 |
US20230058064A1 (en) | 2023-02-23 |
EP4067843A4 (en) | 2023-12-20 |
CN115104002A (zh) | 2022-09-23 |
EP4086597A4 (en) | 2024-01-10 |
US20230066638A1 (en) | 2023-03-02 |
TW202140992A (zh) | 2021-11-01 |
TW202200972A (zh) | 2022-01-01 |
JP2023169165A (ja) | 2023-11-29 |
JPWO2021161986A1 (ja) | 2021-08-19 |
KR20220137615A (ko) | 2022-10-12 |
CN115104000A (zh) | 2022-09-23 |
EP4067842A1 (en) | 2022-10-05 |
US20230061667A1 (en) | 2023-03-02 |
WO2021161684A1 (ja) | 2021-08-19 |
EP4067843A1 (en) | 2022-10-05 |
WO2021161854A1 (ja) | 2021-08-19 |
EP4067842A4 (en) | 2023-12-06 |
JPWO2021161854A1 (ja) | 2021-08-19 |
TW202140993A (zh) | 2021-11-01 |
EP4086597A1 (en) | 2022-11-09 |
KR20220137616A (ko) | 2022-10-12 |
Similar Documents
Legal Events
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