JPWO2021075324A1 - - Google Patents

Info

Publication number
JPWO2021075324A1
JPWO2021075324A1 JP2021552345A JP2021552345A JPWO2021075324A1 JP WO2021075324 A1 JPWO2021075324 A1 JP WO2021075324A1 JP 2021552345 A JP2021552345 A JP 2021552345A JP 2021552345 A JP2021552345 A JP 2021552345A JP WO2021075324 A1 JPWO2021075324 A1 JP WO2021075324A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2021552345A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021075324A1 publication Critical patent/JPWO2021075324A1/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1004Cleaning sample transfer devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/0092Scheduling
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1009Characterised by arrangements for controlling the aspiration or dispense of liquids

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP2021552345A 2019-10-18 2020-10-07 Pending JPWO2021075324A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019191362 2019-10-18
PCT/JP2020/037971 WO2021075324A1 (ja) 2019-10-18 2020-10-07 自動分析装置

Publications (1)

Publication Number Publication Date
JPWO2021075324A1 true JPWO2021075324A1 (ja) 2021-04-22

Family

ID=75537449

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021552345A Pending JPWO2021075324A1 (ja) 2019-10-18 2020-10-07

Country Status (5)

Country Link
US (1) US20240012018A1 (ja)
EP (1) EP4047373A4 (ja)
JP (1) JPWO2021075324A1 (ja)
CN (1) CN114556111A (ja)
WO (1) WO2021075324A1 (ja)

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5954851U (ja) * 1982-10-04 1984-04-10 オムロン株式会社 試料の簡易測定装置
JPH0259673A (ja) * 1988-08-26 1990-02-28 Hitachi Ltd サンプリング装置
JPH04335157A (ja) * 1991-05-10 1992-11-24 Toshiba Corp 自動化学分析装置
JP3035393B2 (ja) * 1991-10-15 2000-04-24 オリンパス光学工業株式会社 固体表面の電荷を利用した洗浄方法
JPH06130072A (ja) * 1992-10-14 1994-05-13 Hitachi Ltd 自動分析装置
US5480809A (en) * 1994-07-27 1996-01-02 Mcgill University Method and apparatus for removal of residual interfering nebulized sample
JP3436095B2 (ja) * 1997-09-18 2003-08-11 株式会社日立製作所 自動分析装置
JP3128793U (ja) * 2006-11-06 2007-01-25 株式会社島津製作所 分注装置
JP2009080035A (ja) * 2007-09-26 2009-04-16 Olympus Corp 分析装置
JP2009162622A (ja) * 2008-01-07 2009-07-23 Olympus Corp 分析装置および管理方法
JP2011007524A (ja) * 2009-06-23 2011-01-13 Beckman Coulter Inc 自動分析装置および自動分析装置の精製水管理方法
JP5705579B2 (ja) * 2011-02-18 2015-04-22 株式会社日立ハイテクノロジーズ 分析装置
JP2016121923A (ja) 2014-12-24 2016-07-07 株式会社東芝 自動分析装置
JP2017096763A (ja) * 2015-11-24 2017-06-01 東芝メディカルシステムズ株式会社 自動分析装置
JP6664977B2 (ja) * 2016-01-28 2020-03-13 キヤノンメディカルシステムズ株式会社 自動分析装置
JP2019074311A (ja) * 2016-02-19 2019-05-16 株式会社日立ハイテクノロジーズ 自動分析装置および分注プローブの洗浄方法
WO2018055931A1 (ja) * 2016-09-23 2018-03-29 株式会社日立ハイテクノロジーズ 自動分析装置

Also Published As

Publication number Publication date
EP4047373A1 (en) 2022-08-24
US20240012018A1 (en) 2024-01-11
CN114556111A (zh) 2022-05-27
WO2021075324A1 (ja) 2021-04-22
EP4047373A4 (en) 2023-11-22

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Legal Events

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Effective date: 20230511