JPWO2020105720A5 - - Google Patents

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JPWO2020105720A5
JPWO2020105720A5 JP2020557644A JP2020557644A JPWO2020105720A5 JP WO2020105720 A5 JPWO2020105720 A5 JP WO2020105720A5 JP 2020557644 A JP2020557644 A JP 2020557644A JP 2020557644 A JP2020557644 A JP 2020557644A JP WO2020105720 A5 JPWO2020105720 A5 JP WO2020105720A5
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Japan
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sample holder
sample
mounting device
applicator
ray
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JP2020557644A
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Japanese (ja)
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JP7237373B2 (ja
JPWO2020105720A1 (ja
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Priority claimed from PCT/JP2019/045689 external-priority patent/WO2020105720A1/ja
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JP2020557644A 2018-11-22 2019-11-21 単結晶x線構造解析装置および試料ホルダ取り付け装置 Active JP7237373B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2018218756 2018-11-22
JP2018218756 2018-11-22
PCT/JP2019/045689 WO2020105720A1 (ja) 2018-11-22 2019-11-21 単結晶x線構造解析装置および試料ホルダ取り付け装置

Publications (3)

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JPWO2020105720A1 JPWO2020105720A1 (ja) 2021-10-07
JPWO2020105720A5 true JPWO2020105720A5 (enExample) 2022-01-20
JP7237373B2 JP7237373B2 (ja) 2023-03-13

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JP2020557644A Active JP7237373B2 (ja) 2018-11-22 2019-11-21 単結晶x線構造解析装置および試料ホルダ取り付け装置

Country Status (5)

Country Link
US (1) US11835476B2 (enExample)
EP (1) EP3885749B1 (enExample)
JP (1) JP7237373B2 (enExample)
CN (1) CN113287006A (enExample)
WO (1) WO2020105720A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022073621A1 (en) * 2020-10-09 2022-04-14 Merck Patent Gmbh Flexible sample holder for crystalline sponge

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3053502B2 (ja) 1992-12-25 2000-06-19 日機装株式会社 粉末品分析用試料の精秤分取装置
JPH11304999A (ja) * 1998-04-22 1999-11-05 Rigaku Denki Kk X線結晶構造解析装置のための試料保持用ゴニオメータ
US20030068829A1 (en) 2001-06-25 2003-04-10 Symyx Technologies, Inc. High throughput crystallographic screening of materials
JP3640383B2 (ja) 2001-09-10 2005-04-20 独立行政法人理化学研究所 サンプルの支持機構
JP3888577B2 (ja) * 2001-11-02 2007-03-07 トヨタ自動車株式会社 水素吸蔵合金の結晶構造解析方法
EP1463971A2 (en) 2001-12-12 2004-10-06 The Regents of the University of California INTEGRATED CRYSTAL MOUNTING AND ALIGNMENT SYSTEM FOR HIGH−THROUGHPUT BIOLOGICAL CRYSTALLOGRAPHY
JP3697246B2 (ja) * 2003-03-26 2005-09-21 株式会社リガク X線回折装置
JP4121146B2 (ja) 2005-06-24 2008-07-23 株式会社リガク 双晶解析装置
US7660389B1 (en) * 2007-08-17 2010-02-09 Bruker Axs, Inc. Sample alignment mechanism for X-ray diffraction instrumentation
JP5024968B2 (ja) * 2009-03-02 2012-09-12 株式会社リガク X線及び熱分析装置
JP2010286431A (ja) * 2009-06-15 2010-12-24 Rigaku Corp 凍結結晶の処理装置及び処理方法
US8571177B2 (en) * 2010-03-01 2013-10-29 Cornell University Goniometer base apparatus and method
WO2011115223A1 (ja) 2010-03-18 2011-09-22 独立行政法人理化学研究所 生体高分子の結晶化条件探査方法及びそれに用いる装置
JP2013156218A (ja) 2012-01-31 2013-08-15 Japan Synchrotron Radiation Research Institute 微小試料用キャピラリー
EP2894242B1 (en) 2012-09-07 2020-01-15 Japan Science and Technology Agency Guest-compound-enveloping polymer-metal-complex crystal, method for producing same, method for preparing crystal structure analysis sample, and method for determining molecular structure of organic compound
JP6131595B2 (ja) 2012-12-28 2017-05-24 株式会社ニコン 測定方法
WO2015132909A1 (ja) 2014-03-05 2015-09-11 株式会社島津製作所 試料分析システム
US10976267B2 (en) 2014-07-31 2021-04-13 Japan Science And Technology Agency Method of analyzing diffraction data obtained from a single crystal of a porous compound and a compound for which a structure is to be determined
EP3173774A1 (en) * 2015-11-24 2017-05-31 Paul Scherrer Institut A system and a method for resolving a crystal structure of a crystal at atomic resolution by collecting x-ray diffraction images
DE102015224143B3 (de) * 2015-12-03 2017-02-23 Incoatec Gmbh Verfahren zur Justage der Primärseite eines Röntgendiffraktometers und zugehöriges Röntgendiffraktometer
US10794844B2 (en) * 2016-08-10 2020-10-06 Proto Manufacturing, Ltd. Mounting system and sample holder for X-ray diffraction apparatus
JP6606658B2 (ja) * 2016-08-18 2019-11-20 株式会社リガク X線回折装置
JP6931214B2 (ja) * 2017-01-19 2021-09-01 株式会社日立ハイテクサイエンス 荷電粒子ビーム装置
US11815475B2 (en) 2017-03-01 2023-11-14 The University Of Tokyo Method for identifying molecular structure
JP6872700B2 (ja) 2017-03-21 2021-05-19 大学共同利用機関法人 高エネルギー加速器研究機構 カセット装填装置
JP2018169276A (ja) * 2017-03-29 2018-11-01 株式会社島津製作所 X線分析装置
CN106932419A (zh) * 2017-04-19 2017-07-07 南京大学 X射线衍射仪毛细样品管支架及其使用方法

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