JP7237373B2 - 単結晶ｘ線構造解析装置および試料ホルダ取り付け装置 - Google Patents

単結晶ｘ線構造解析装置および試料ホルダ取り付け装置 Download PDF

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JP7237373B2
JP7237373B2 JP2020557644A JP2020557644A JP7237373B2 JP 7237373 B2 JP7237373 B2 JP 7237373B2 JP 2020557644 A JP2020557644 A JP 2020557644A JP 2020557644 A JP2020557644 A JP 2020557644A JP 7237373 B2 JP7237373 B2 JP 7237373B2
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sample holder
sample
ray
applicator
crystal
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JPWO2020105720A5 (enExample
JPWO2020105720A1 (ja
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孝 佐藤
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Rigaku Corp
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Rigaku Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20016—Goniometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/309—Accessories, mechanical or electrical features support of sample holder
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

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  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2020557644A 2018-11-22 2019-11-21 単結晶ｘ線構造解析装置および試料ホルダ取り付け装置 Active JP7237373B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2018218756 2018-11-22
JP2018218756 2018-11-22
PCT/JP2019/045689 WO2020105720A1 (ja) 2018-11-22 2019-11-21 単結晶ｘ線構造解析装置および試料ホルダ取り付け装置

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JPWO2020105720A1 JPWO2020105720A1 (ja) 2021-10-07
JPWO2020105720A5 JPWO2020105720A5 (enExample) 2022-01-20
JP7237373B2 true JP7237373B2 (ja) 2023-03-13

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Country Link
US (1) US11835476B2 (enExample)
EP (1) EP3885749B1 (enExample)
JP (1) JP7237373B2 (enExample)
CN (1) CN113287006A (enExample)
WO (1) WO2020105720A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022073621A1 (en) * 2020-10-09 2022-04-14 Merck Patent Gmbh Flexible sample holder for crystalline sponge

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JP2003139726A (ja) 2001-11-02 2003-05-14 Toyota Motor Corp 水素吸蔵合金の結晶構造解析方法
US20050163280A1 (en) 2001-12-12 2005-07-28 The Regents Of The University Of California Integrated crystal mounting and alignment system for high-throughput biological crystallography
JP2010203843A (ja) 2009-03-02 2010-09-16 Rigaku Corp Ｘ線及び熱分析装置
JP2010286431A (ja) 2009-06-15 2010-12-24 Rigaku Corp 凍結結晶の処理装置及び処理方法
US20110211674A1 (en) 2010-03-01 2011-09-01 Cornell University Goniometer base apparatus and method
WO2014038220A1 (ja) 2012-09-07 2014-03-13 独立行政法人 科学技術振興機構 ゲスト化合物内包高分子金属錯体結晶、その製造方法、結晶構造解析用試料の作製方法、及び有機化合物の分子構造決定方法
JP2018155680A (ja) 2017-03-21 2018-10-04 大学共同利用機関法人 高エネルギー加速器研究機構 カセット装填装置

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JP3053502B2 (ja) 1992-12-25 2000-06-19 日機装株式会社 粉末品分析用試料の精秤分取装置
JPH11304999A (ja) * 1998-04-22 1999-11-05 Rigaku Denki Kk Ｘ線結晶構造解析装置のための試料保持用ゴニオメータ
US20030068829A1 (en) 2001-06-25 2003-04-10 Symyx Technologies, Inc. High throughput crystallographic screening of materials
JP3640383B2 (ja) 2001-09-10 2005-04-20 独立行政法人理化学研究所 サンプルの支持機構
JP3697246B2 (ja) * 2003-03-26 2005-09-21 株式会社リガク Ｘ線回折装置
JP4121146B2 (ja) 2005-06-24 2008-07-23 株式会社リガク 双晶解析装置
US7660389B1 (en) * 2007-08-17 2010-02-09 Bruker Axs, Inc. Sample alignment mechanism for X-ray diffraction instrumentation
WO2011115223A1 (ja) 2010-03-18 2011-09-22 独立行政法人理化学研究所 生体高分子の結晶化条件探査方法及びそれに用いる装置
JP2013156218A (ja) 2012-01-31 2013-08-15 Japan Synchrotron Radiation Research Institute 微小試料用キャピラリー
JP6131595B2 (ja) 2012-12-28 2017-05-24 株式会社ニコン 測定方法
WO2015132909A1 (ja) 2014-03-05 2015-09-11 株式会社島津製作所 試料分析システム
US10976267B2 (en) 2014-07-31 2021-04-13 Japan Science And Technology Agency Method of analyzing diffraction data obtained from a single crystal of a porous compound and a compound for which a structure is to be determined
EP3173774A1 (en) * 2015-11-24 2017-05-31 Paul Scherrer Institut A system and a method for resolving a crystal structure of a crystal at atomic resolution by collecting x-ray diffraction images
DE102015224143B3 (de) * 2015-12-03 2017-02-23 Incoatec Gmbh Verfahren zur Justage der Primärseite eines Röntgendiffraktometers und zugehöriges Röntgendiffraktometer
US10794844B2 (en) * 2016-08-10 2020-10-06 Proto Manufacturing, Ltd. Mounting system and sample holder for X-ray diffraction apparatus
JP6606658B2 (ja) * 2016-08-18 2019-11-20 株式会社リガク Ｘ線回折装置
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Publication number Priority date Publication date Assignee Title
JP2003139726A (ja) 2001-11-02 2003-05-14 Toyota Motor Corp 水素吸蔵合金の結晶構造解析方法
US20050163280A1 (en) 2001-12-12 2005-07-28 The Regents Of The University Of California Integrated crystal mounting and alignment system for high-throughput biological crystallography
JP2010203843A (ja) 2009-03-02 2010-09-16 Rigaku Corp Ｘ線及び熱分析装置
JP2010286431A (ja) 2009-06-15 2010-12-24 Rigaku Corp 凍結結晶の処理装置及び処理方法
US20110211674A1 (en) 2010-03-01 2011-09-01 Cornell University Goniometer base apparatus and method
WO2014038220A1 (ja) 2012-09-07 2014-03-13 独立行政法人 科学技術振興機構 ゲスト化合物内包高分子金属錯体結晶、その製造方法、結晶構造解析用試料の作製方法、及び有機化合物の分子構造決定方法
JP2018155680A (ja) 2017-03-21 2018-10-04 大学共同利用機関法人 高エネルギー加速器研究機構 カセット装填装置

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多孔性配位高分子のナノ細孔に吸着した水素分子の直接観測，SPring-8 Information，第１０巻，第１号，2005年01月，第２４－２９頁
放射光ビームラインにおける試料交換システムの開発，第３２回日本ロボット学会学術講演会，2014年09月04日，RSJ2014AC1Q3-01
放射光粉末回折法による先端材料の精密構造物性の研究，応用物理，第７４巻，第９号，2005年09月，第１２０１－１２０４頁
新しいナノサイエンス－酸素分子を一列にならべる－，SPring-8 Information，第８巻，第６号，日本，2003年11月，第４０６－４１２頁
粉末結晶による精密構造物性の研究，SPring-8 Information，第１１巻，第４号，日本，2006年07月，第２０２－２１９頁

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Publication number Publication date
CN113287006A (zh) 2021-08-20
US20220128491A1 (en) 2022-04-28
EP3885749A1 (en) 2021-09-29
WO2020105720A1 (ja) 2020-05-28
US11835476B2 (en) 2023-12-05
JPWO2020105720A1 (ja) 2021-10-07
EP3885749A4 (en) 2022-10-12
EP3885749B1 (en) 2025-02-19

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