JPS649735B2 - - Google Patents

Info

Publication number
JPS649735B2
JPS649735B2 JP57167921A JP16792182A JPS649735B2 JP S649735 B2 JPS649735 B2 JP S649735B2 JP 57167921 A JP57167921 A JP 57167921A JP 16792182 A JP16792182 A JP 16792182A JP S649735 B2 JPS649735 B2 JP S649735B2
Authority
JP
Japan
Prior art keywords
socket
air
lcc
lid
hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57167921A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5957463A (ja
Inventor
Yasuro Matsuzaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP57167921A priority Critical patent/JPS5957463A/ja
Publication of JPS5957463A publication Critical patent/JPS5957463A/ja
Publication of JPS649735B2 publication Critical patent/JPS649735B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Connecting Device With Holders (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP57167921A 1982-09-27 1982-09-27 集積回路用ソケツト Granted JPS5957463A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57167921A JPS5957463A (ja) 1982-09-27 1982-09-27 集積回路用ソケツト

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57167921A JPS5957463A (ja) 1982-09-27 1982-09-27 集積回路用ソケツト

Publications (2)

Publication Number Publication Date
JPS5957463A JPS5957463A (ja) 1984-04-03
JPS649735B2 true JPS649735B2 (cg-RX-API-DMAC7.html) 1989-02-20

Family

ID=15858521

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57167921A Granted JPS5957463A (ja) 1982-09-27 1982-09-27 集積回路用ソケツト

Country Status (1)

Country Link
JP (1) JPS5957463A (cg-RX-API-DMAC7.html)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100471357B1 (ko) 2002-07-24 2005-03-10 미래산업 주식회사 반도체 소자 테스트 핸들러용 캐리어 모듈
KR100561951B1 (ko) 2004-02-17 2006-03-21 삼성전자주식회사 강제 열 배출 방식의 ｂｇａ 패키지용 번인 테스트 장치

Also Published As

Publication number Publication date
JPS5957463A (ja) 1984-04-03

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