JPS5957463A - 集積回路用ソケツト - Google Patents

集積回路用ソケツト

Info

Publication number
JPS5957463A
JPS5957463A JP57167921A JP16792182A JPS5957463A JP S5957463 A JPS5957463 A JP S5957463A JP 57167921 A JP57167921 A JP 57167921A JP 16792182 A JP16792182 A JP 16792182A JP S5957463 A JPS5957463 A JP S5957463A
Authority
JP
Japan
Prior art keywords
air
socket
lcc
outlet port
hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57167921A
Other languages
English (en)
Japanese (ja)
Other versions
JPS649735B2 (cg-RX-API-DMAC7.html
Inventor
Yasuro Matsuzaki
康郎 松崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP57167921A priority Critical patent/JPS5957463A/ja
Publication of JPS5957463A publication Critical patent/JPS5957463A/ja
Publication of JPS649735B2 publication Critical patent/JPS649735B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Connecting Device With Holders (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP57167921A 1982-09-27 1982-09-27 集積回路用ソケツト Granted JPS5957463A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57167921A JPS5957463A (ja) 1982-09-27 1982-09-27 集積回路用ソケツト

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57167921A JPS5957463A (ja) 1982-09-27 1982-09-27 集積回路用ソケツト

Publications (2)

Publication Number Publication Date
JPS5957463A true JPS5957463A (ja) 1984-04-03
JPS649735B2 JPS649735B2 (cg-RX-API-DMAC7.html) 1989-02-20

Family

ID=15858521

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57167921A Granted JPS5957463A (ja) 1982-09-27 1982-09-27 集積回路用ソケツト

Country Status (1)

Country Link
JP (1) JPS5957463A (cg-RX-API-DMAC7.html)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7084655B2 (en) 2004-02-17 2006-08-01 Samsung Electronics Co., Ltd. Burn-in test apparatus for BGA packages using forced heat exhaust
US7135703B2 (en) 2002-07-24 2006-11-14 Mirae Corporation Test tray with carrier modules for a semiconductor device handler

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7135703B2 (en) 2002-07-24 2006-11-14 Mirae Corporation Test tray with carrier modules for a semiconductor device handler
US7084655B2 (en) 2004-02-17 2006-08-01 Samsung Electronics Co., Ltd. Burn-in test apparatus for BGA packages using forced heat exhaust

Also Published As

Publication number Publication date
JPS649735B2 (cg-RX-API-DMAC7.html) 1989-02-20

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