JPS6472036A - Inspection device for lead joint part - Google Patents

Inspection device for lead joint part

Info

Publication number
JPS6472036A
JPS6472036A JP62228633A JP22863387A JPS6472036A JP S6472036 A JPS6472036 A JP S6472036A JP 62228633 A JP62228633 A JP 62228633A JP 22863387 A JP22863387 A JP 22863387A JP S6472036 A JPS6472036 A JP S6472036A
Authority
JP
Japan
Prior art keywords
joint part
image
generated
slit light
lead
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62228633A
Other languages
English (en)
Inventor
Toshimichi Masaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co filed Critical Omron Tateisi Electronics Co
Priority to JP62228633A priority Critical patent/JPS6472036A/ja
Publication of JPS6472036A publication Critical patent/JPS6472036A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements
JP62228633A 1987-09-14 1987-09-14 Inspection device for lead joint part Pending JPS6472036A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62228633A JPS6472036A (en) 1987-09-14 1987-09-14 Inspection device for lead joint part

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62228633A JPS6472036A (en) 1987-09-14 1987-09-14 Inspection device for lead joint part

Publications (1)

Publication Number Publication Date
JPS6472036A true JPS6472036A (en) 1989-03-16

Family

ID=16879397

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62228633A Pending JPS6472036A (en) 1987-09-14 1987-09-14 Inspection device for lead joint part

Country Status (1)

Country Link
JP (1) JPS6472036A (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014095710A (ja) * 2012-11-12 2014-05-22 Koh Young Technology Inc 電子部品のリード検査方法
US10046892B2 (en) 2013-12-26 2018-08-14 Shanghai Hongyan Returnable Transit Packagings Co., Ltd. Tamper-evident device and valve using same
CN108956617A (zh) * 2018-06-04 2018-12-07 温州大学 一种基于微形变智能分类器的电子器件焊点热循环失效的检测方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014095710A (ja) * 2012-11-12 2014-05-22 Koh Young Technology Inc 電子部品のリード検査方法
US10046892B2 (en) 2013-12-26 2018-08-14 Shanghai Hongyan Returnable Transit Packagings Co., Ltd. Tamper-evident device and valve using same
CN108956617A (zh) * 2018-06-04 2018-12-07 温州大学 一种基于微形变智能分类器的电子器件焊点热循环失效的检测方法

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