JPS56132509A - Inspection lighting device with reflex mirror - Google Patents

Inspection lighting device with reflex mirror

Info

Publication number
JPS56132509A
JPS56132509A JP3538580A JP3538580A JPS56132509A JP S56132509 A JPS56132509 A JP S56132509A JP 3538580 A JP3538580 A JP 3538580A JP 3538580 A JP3538580 A JP 3538580A JP S56132509 A JPS56132509 A JP S56132509A
Authority
JP
Japan
Prior art keywords
lighting device
inspection lighting
reflex mirror
inspected
detected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3538580A
Other languages
Japanese (ja)
Other versions
JPH0247683B2 (en
Inventor
Katsuto Ida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Motors Corp
Original Assignee
Mitsubishi Motors Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Motors Corp filed Critical Mitsubishi Motors Corp
Priority to JP3538580A priority Critical patent/JPH0247683B2/en
Publication of JPS56132509A publication Critical patent/JPS56132509A/en
Publication of JPH0247683B2 publication Critical patent/JPH0247683B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Arrangement Of Elements, Cooling, Sealing, Or The Like Of Lighting Devices (AREA)

Abstract

PURPOSE:To enable the reduction in the number of lighting sources in an inspection lighting device, by a method wherein a state of a surface to be inspected is detected by means of a direct projection image and an indirect projection image reflected through a reflex mirror. CONSTITUTION:An irregular state of a surface 2 to be inspected, such as an upper surface of a car roof, is detected by direct projection images 6 projected by means of fluorescent lights 3 mounted at given pitches in the celling 1, and by indirect projection images 5 and 7 reflected through reflex mirrors 4 and 4 mounted symmetrically at an angle 45 deg. to the ceiling 1 at both sides of each fluorescent light 3. Thus, a device forms an inspection lighting device which can be reduced in the number of the fluorescent lights 3 serving as a light source.
JP3538580A 1980-03-20 1980-03-20 HANSHAKYOTSUKITENKENSHOMEISOCHI Expired - Lifetime JPH0247683B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3538580A JPH0247683B2 (en) 1980-03-20 1980-03-20 HANSHAKYOTSUKITENKENSHOMEISOCHI

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3538580A JPH0247683B2 (en) 1980-03-20 1980-03-20 HANSHAKYOTSUKITENKENSHOMEISOCHI

Publications (2)

Publication Number Publication Date
JPS56132509A true JPS56132509A (en) 1981-10-16
JPH0247683B2 JPH0247683B2 (en) 1990-10-22

Family

ID=12440431

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3538580A Expired - Lifetime JPH0247683B2 (en) 1980-03-20 1980-03-20 HANSHAKYOTSUKITENKENSHOMEISOCHI

Country Status (1)

Country Link
JP (1) JPH0247683B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62261038A (en) * 1986-05-06 1987-11-13 Toyota Central Res & Dev Lab Inc Lighting apparatus for inspection
JPH0288947A (en) * 1988-09-27 1990-03-29 Toyota Central Res & Dev Lab Inc Illumination instrument for inspection
WO2020223301A1 (en) * 2019-04-29 2020-11-05 Ovad Custom Stages, Llc Vehicle photographic and inspection booth

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62261038A (en) * 1986-05-06 1987-11-13 Toyota Central Res & Dev Lab Inc Lighting apparatus for inspection
JPH0288947A (en) * 1988-09-27 1990-03-29 Toyota Central Res & Dev Lab Inc Illumination instrument for inspection
WO2020223301A1 (en) * 2019-04-29 2020-11-05 Ovad Custom Stages, Llc Vehicle photographic and inspection booth
US11892757B2 (en) 2019-04-29 2024-02-06 Carvana, LLC Vehicle photographic and inspection booth

Also Published As

Publication number Publication date
JPH0247683B2 (en) 1990-10-22

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