JPS6417162A - Packing check device for surface packing substrate - Google Patents

Packing check device for surface packing substrate

Info

Publication number
JPS6417162A
JPS6417162A JP62173068A JP17306887A JPS6417162A JP S6417162 A JPS6417162 A JP S6417162A JP 62173068 A JP62173068 A JP 62173068A JP 17306887 A JP17306887 A JP 17306887A JP S6417162 A JPS6417162 A JP S6417162A
Authority
JP
Japan
Prior art keywords
substrate
parts
cameras
devices
packing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62173068A
Other languages
Japanese (ja)
Inventor
Kazuhiko Saka
Mitsutaka Kato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co filed Critical Omron Tateisi Electronics Co
Priority to JP62173068A priority Critical patent/JPS6417162A/en
Publication of JPS6417162A publication Critical patent/JPS6417162A/en
Pending legal-status Critical Current

Links

Landscapes

  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Supply And Installment Of Electrical Components (AREA)

Abstract

PURPOSE:To ensure a accurate packing check despite of the warp of a substrate by projecting slit light rectangularly onto a substrate containing a parts to be checked over the entire length of the substrate surface. CONSTITUTION:A parts 5 to be checked is packed onto a substrate and this substrate is put on a measurement table which can freely move in the X-Y vertical direction and also can freely turn. While the projecting devices 30 and 31 are set above the measurement table to radiate the slit light of large width through a light source, i.e. a semiconductor laser. Then two cameras 20 and 21 containing image sensors are set so that the line connecting two cameras is set rectangular to the line connecting two devices 30 and 31. A piece of light cutting line P is formed on the upper surface of the parts 5 through the surface of a soldering junction part 10 with irradiation of the slit beams of both devices 30 and 31. The video signals of the line P photographed by cameras 20 and 21 undergo the picture processing for decision of the defects and the position errors of the parts 5 as well as the quality of the part 10.
JP62173068A 1987-07-13 1987-07-13 Packing check device for surface packing substrate Pending JPS6417162A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62173068A JPS6417162A (en) 1987-07-13 1987-07-13 Packing check device for surface packing substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62173068A JPS6417162A (en) 1987-07-13 1987-07-13 Packing check device for surface packing substrate

Publications (1)

Publication Number Publication Date
JPS6417162A true JPS6417162A (en) 1989-01-20

Family

ID=15953614

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62173068A Pending JPS6417162A (en) 1987-07-13 1987-07-13 Packing check device for surface packing substrate

Country Status (1)

Country Link
JP (1) JPS6417162A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002107311A (en) * 2000-09-28 2002-04-10 Mitsubishi Heavy Ind Ltd Printed circuit board inspecting device and method
JP2007315946A (en) * 2006-05-26 2007-12-06 Matsushita Electric Works Ltd Three-dimensional shape measurement method and three-dimensional shape measuring device using this
WO2013128705A1 (en) * 2012-03-02 2013-09-06 Wit株式会社 Visual inspection apparatus and visual inspection method
PL423312A1 (en) * 2017-10-30 2019-05-06 Sorter Spolka Jawna Konrad Grzeszczyk Michal Ziomek Method for counting objects with circular o ellipse cross-section, preferably the cigarette filters and the system for execution of this method

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002107311A (en) * 2000-09-28 2002-04-10 Mitsubishi Heavy Ind Ltd Printed circuit board inspecting device and method
JP2007315946A (en) * 2006-05-26 2007-12-06 Matsushita Electric Works Ltd Three-dimensional shape measurement method and three-dimensional shape measuring device using this
WO2013128705A1 (en) * 2012-03-02 2013-09-06 Wit株式会社 Visual inspection apparatus and visual inspection method
JP2013181905A (en) * 2012-03-02 2013-09-12 Wit Co Ltd Appearance inspection device and appearance inspection method
CN103703357A (en) * 2012-03-02 2014-04-02 Wit株式会社 Visual inspection apparatus and visual inspection method
PL423312A1 (en) * 2017-10-30 2019-05-06 Sorter Spolka Jawna Konrad Grzeszczyk Michal Ziomek Method for counting objects with circular o ellipse cross-section, preferably the cigarette filters and the system for execution of this method

Similar Documents

Publication Publication Date Title
AU6900091A (en) Process and arrangement for optoelectronic measurement of objects
FR2358921A1 (en) MONOCRISTAL DEVICE AND PROCESS FOR ITS MANUFACTURING
ES485536A1 (en) Pattern inspection system
JPS6417162A (en) Packing check device for surface packing substrate
ES440012A1 (en) Optical apparatus in which light can be projected to at least one image plane
JPS55119782A (en) Pattern automatic inspection method
JPS5430026A (en) Objective lens of high reduced scale
JPS5429977A (en) Detection system for position
JPS5310487A (en) Location of ultrasonic probe and device therefor
JPS5548942A (en) Positioning device for very small components
JPS54134992A (en) Semiconductor device
JPS57147245A (en) Positioning method and device for chip bonding
JPS57206037A (en) Device for positioning of flip chip
JPS548523A (en) Exposure controller of cameras
JPS5491183A (en) Production of semiconductor device
JPS6418049A (en) Inspection for mounting of chip part
JPH0534105Y2 (en)
JPS5346278A (en) Inspection method of semiconductor element connecting lead frames
JPS6427289A (en) Semiconductor device
ATA84482A (en) CIRCUIT ARRANGEMENT FOR CORRECTING THE SCAN OF AN ELECTRON BEAM IN AT LEAST ONE RECORDING DEVICE OF A TELEVISION CAMERA
JPS51140477A (en) Method of fabricating semiconductor device
JPS5242379A (en) Method of inspecting pinholes of insulating film formed on semiconduct or surface
JPS5228340A (en) Automatial focus adjustment unit for microscope
JPS5552223A (en) Exposure method in electronic beam exposure device
JPS5626483A (en) Preparation of semiconductor laser with lens