JPS55119782A - Pattern automatic inspection method - Google Patents
Pattern automatic inspection methodInfo
- Publication number
- JPS55119782A JPS55119782A JP2729879A JP2729879A JPS55119782A JP S55119782 A JPS55119782 A JP S55119782A JP 2729879 A JP2729879 A JP 2729879A JP 2729879 A JP2729879 A JP 2729879A JP S55119782 A JPS55119782 A JP S55119782A
- Authority
- JP
- Japan
- Prior art keywords
- inspected
- picture
- area
- inspection
- frame
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Character Input (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Abstract
PURPOSE: To make accurately the inspection for specific part, by determining the center coordinate of the area to be inspected by taking the ridge of transversal and longitudinal direction for the entire pattern included in picture as reference and setting the inspection frame around the center coordinate and taking the inside of the frame as inspection area.
CONSTITUTION: The image obtained by scanning the reference objective and inspected objective 3 with the camera 6 providing primary dimension image sensor 7 respectively is binarized, and the reference picture and inspected picture consisting of white or black video elements are obtained, and the reference pattern and inspected pattern 8 contained in the reference and inspected picture respectively are compared to judge the propriety of the inspected object 3. The ridge U in longitudinal direction of the entire pattern included in the reference and inspected picture and the ridge r in transversal direction of the pattern included in the picture, are detected to obtain the coordinates x45, y85 of the center position α of the area to be inspected by taking the ridges u, r detected as reference, and a given size of the inspection frame β is set around the center position α, and the patterns of the reference and inspected pictures of the area in the frame β can be compared.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2729879A JPS55119782A (en) | 1979-03-09 | 1979-03-09 | Pattern automatic inspection method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2729879A JPS55119782A (en) | 1979-03-09 | 1979-03-09 | Pattern automatic inspection method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55119782A true JPS55119782A (en) | 1980-09-13 |
JPS627588B2 JPS627588B2 (en) | 1987-02-18 |
Family
ID=12217174
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2729879A Granted JPS55119782A (en) | 1979-03-09 | 1979-03-09 | Pattern automatic inspection method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55119782A (en) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57111781A (en) * | 1980-12-29 | 1982-07-12 | Fujitsu Ltd | Pattern location detecting method |
JPS57146378A (en) * | 1980-11-17 | 1982-09-09 | Insupekushiyon Tekunorojii Inc | Operator programmable inspector and object checking apparatus |
JPS5827278A (en) * | 1981-08-10 | 1983-02-17 | Toshiba Corp | Line searching system |
JPS5827275A (en) * | 1981-08-10 | 1983-02-17 | Toshiba Corp | Address controlling system for pattern memory |
JPS60147881A (en) * | 1984-01-11 | 1985-08-03 | Fuji Xerox Co Ltd | Method and device for accumulating picture information |
JPS63282576A (en) * | 1987-05-14 | 1988-11-18 | Toppan Printing Co Ltd | Pattern inspection device |
JPH0321811A (en) * | 1989-05-31 | 1991-01-30 | American Teleph & Telegr Co <Att> | Method of determining text azimuth |
JP2005145055A (en) * | 2003-10-20 | 2005-06-09 | Omron Corp | Inspection methods of printing state as well as character and inspection device using these methods |
JP2008506531A (en) * | 2004-06-09 | 2008-03-06 | スミスクライン・ビーチャム・コーポレイション | Apparatus and method for manufacturing or processing products or samples |
-
1979
- 1979-03-09 JP JP2729879A patent/JPS55119782A/en active Granted
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57146378A (en) * | 1980-11-17 | 1982-09-09 | Insupekushiyon Tekunorojii Inc | Operator programmable inspector and object checking apparatus |
JPS57111781A (en) * | 1980-12-29 | 1982-07-12 | Fujitsu Ltd | Pattern location detecting method |
JPH0115910B2 (en) * | 1980-12-29 | 1989-03-22 | Fujitsu Ltd | |
JPS5827278A (en) * | 1981-08-10 | 1983-02-17 | Toshiba Corp | Line searching system |
JPS5827275A (en) * | 1981-08-10 | 1983-02-17 | Toshiba Corp | Address controlling system for pattern memory |
JPS60147881A (en) * | 1984-01-11 | 1985-08-03 | Fuji Xerox Co Ltd | Method and device for accumulating picture information |
JPS63282576A (en) * | 1987-05-14 | 1988-11-18 | Toppan Printing Co Ltd | Pattern inspection device |
JPH0321811A (en) * | 1989-05-31 | 1991-01-30 | American Teleph & Telegr Co <Att> | Method of determining text azimuth |
JPH0726836B2 (en) * | 1989-05-31 | 1995-03-29 | アメリカン テレフォン アンド テレグラフ カムパニー | Text orientation determination method |
JP2005145055A (en) * | 2003-10-20 | 2005-06-09 | Omron Corp | Inspection methods of printing state as well as character and inspection device using these methods |
JP4631384B2 (en) * | 2003-10-20 | 2011-02-16 | オムロン株式会社 | Printing state inspection method, character inspection method, and inspection apparatus using these methods |
JP2008506531A (en) * | 2004-06-09 | 2008-03-06 | スミスクライン・ビーチャム・コーポレイション | Apparatus and method for manufacturing or processing products or samples |
Also Published As
Publication number | Publication date |
---|---|
JPS627588B2 (en) | 1987-02-18 |
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