JPS55119782A - Pattern automatic inspection method - Google Patents

Pattern automatic inspection method

Info

Publication number
JPS55119782A
JPS55119782A JP2729879A JP2729879A JPS55119782A JP S55119782 A JPS55119782 A JP S55119782A JP 2729879 A JP2729879 A JP 2729879A JP 2729879 A JP2729879 A JP 2729879A JP S55119782 A JPS55119782 A JP S55119782A
Authority
JP
Japan
Prior art keywords
inspected
picture
area
inspection
frame
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2729879A
Other languages
Japanese (ja)
Other versions
JPS627588B2 (en
Inventor
Hisao Goto
Yuzaburo Mori
Toshihito Watanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Daihen Corp
Original Assignee
Daihen Corp
Osaka Transformer Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Daihen Corp, Osaka Transformer Co Ltd filed Critical Daihen Corp
Priority to JP2729879A priority Critical patent/JPS55119782A/en
Publication of JPS55119782A publication Critical patent/JPS55119782A/en
Publication of JPS627588B2 publication Critical patent/JPS627588B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Character Input (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)

Abstract

PURPOSE: To make accurately the inspection for specific part, by determining the center coordinate of the area to be inspected by taking the ridge of transversal and longitudinal direction for the entire pattern included in picture as reference and setting the inspection frame around the center coordinate and taking the inside of the frame as inspection area.
CONSTITUTION: The image obtained by scanning the reference objective and inspected objective 3 with the camera 6 providing primary dimension image sensor 7 respectively is binarized, and the reference picture and inspected picture consisting of white or black video elements are obtained, and the reference pattern and inspected pattern 8 contained in the reference and inspected picture respectively are compared to judge the propriety of the inspected object 3. The ridge U in longitudinal direction of the entire pattern included in the reference and inspected picture and the ridge r in transversal direction of the pattern included in the picture, are detected to obtain the coordinates x45, y85 of the center position α of the area to be inspected by taking the ridges u, r detected as reference, and a given size of the inspection frame β is set around the center position α, and the patterns of the reference and inspected pictures of the area in the frame β can be compared.
COPYRIGHT: (C)1980,JPO&Japio
JP2729879A 1979-03-09 1979-03-09 Pattern automatic inspection method Granted JPS55119782A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2729879A JPS55119782A (en) 1979-03-09 1979-03-09 Pattern automatic inspection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2729879A JPS55119782A (en) 1979-03-09 1979-03-09 Pattern automatic inspection method

Publications (2)

Publication Number Publication Date
JPS55119782A true JPS55119782A (en) 1980-09-13
JPS627588B2 JPS627588B2 (en) 1987-02-18

Family

ID=12217174

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2729879A Granted JPS55119782A (en) 1979-03-09 1979-03-09 Pattern automatic inspection method

Country Status (1)

Country Link
JP (1) JPS55119782A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57111781A (en) * 1980-12-29 1982-07-12 Fujitsu Ltd Pattern location detecting method
JPS57146378A (en) * 1980-11-17 1982-09-09 Insupekushiyon Tekunorojii Inc Operator programmable inspector and object checking apparatus
JPS5827278A (en) * 1981-08-10 1983-02-17 Toshiba Corp Line searching system
JPS5827275A (en) * 1981-08-10 1983-02-17 Toshiba Corp Address controlling system for pattern memory
JPS60147881A (en) * 1984-01-11 1985-08-03 Fuji Xerox Co Ltd Method and device for accumulating picture information
JPS63282576A (en) * 1987-05-14 1988-11-18 Toppan Printing Co Ltd Pattern inspection device
JPH0321811A (en) * 1989-05-31 1991-01-30 American Teleph & Telegr Co <Att> Method of determining text azimuth
JP2005145055A (en) * 2003-10-20 2005-06-09 Omron Corp Inspection methods of printing state as well as character and inspection device using these methods
JP2008506531A (en) * 2004-06-09 2008-03-06 スミスクライン・ビーチャム・コーポレイション Apparatus and method for manufacturing or processing products or samples

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57146378A (en) * 1980-11-17 1982-09-09 Insupekushiyon Tekunorojii Inc Operator programmable inspector and object checking apparatus
JPS57111781A (en) * 1980-12-29 1982-07-12 Fujitsu Ltd Pattern location detecting method
JPH0115910B2 (en) * 1980-12-29 1989-03-22 Fujitsu Ltd
JPS5827278A (en) * 1981-08-10 1983-02-17 Toshiba Corp Line searching system
JPS5827275A (en) * 1981-08-10 1983-02-17 Toshiba Corp Address controlling system for pattern memory
JPS60147881A (en) * 1984-01-11 1985-08-03 Fuji Xerox Co Ltd Method and device for accumulating picture information
JPS63282576A (en) * 1987-05-14 1988-11-18 Toppan Printing Co Ltd Pattern inspection device
JPH0321811A (en) * 1989-05-31 1991-01-30 American Teleph & Telegr Co <Att> Method of determining text azimuth
JPH0726836B2 (en) * 1989-05-31 1995-03-29 アメリカン テレフォン アンド テレグラフ カムパニー Text orientation determination method
JP2005145055A (en) * 2003-10-20 2005-06-09 Omron Corp Inspection methods of printing state as well as character and inspection device using these methods
JP4631384B2 (en) * 2003-10-20 2011-02-16 オムロン株式会社 Printing state inspection method, character inspection method, and inspection apparatus using these methods
JP2008506531A (en) * 2004-06-09 2008-03-06 スミスクライン・ビーチャム・コーポレイション Apparatus and method for manufacturing or processing products or samples

Also Published As

Publication number Publication date
JPS627588B2 (en) 1987-02-18

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