JPS5278467A - Method of determining reference points for measurement of configuratio n - Google Patents

Method of determining reference points for measurement of configuratio n

Info

Publication number
JPS5278467A
JPS5278467A JP15399875A JP15399875A JPS5278467A JP S5278467 A JPS5278467 A JP S5278467A JP 15399875 A JP15399875 A JP 15399875A JP 15399875 A JP15399875 A JP 15399875A JP S5278467 A JPS5278467 A JP S5278467A
Authority
JP
Japan
Prior art keywords
reference points
measurement
configuratio
determining reference
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15399875A
Other languages
Japanese (ja)
Inventor
Hiroshi Akahori
Toshio Matsushita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP15399875A priority Critical patent/JPS5278467A/en
Publication of JPS5278467A publication Critical patent/JPS5278467A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE: To provide a method of determining reference points for measurement of configuration, in which optical coordinates pattern is projected on an object to be measured, and geometrically characteristic points, lying on border line of bright regions and dark regions of image obtained by viewing the pattern from two different directions, are selected and determined as reference points, whereby reference points can be defined distinctly.
COPYRIGHT: (C)1977,JPO&Japio
JP15399875A 1975-12-25 1975-12-25 Method of determining reference points for measurement of configuratio n Pending JPS5278467A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15399875A JPS5278467A (en) 1975-12-25 1975-12-25 Method of determining reference points for measurement of configuratio n

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15399875A JPS5278467A (en) 1975-12-25 1975-12-25 Method of determining reference points for measurement of configuratio n

Publications (1)

Publication Number Publication Date
JPS5278467A true JPS5278467A (en) 1977-07-01

Family

ID=15574669

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15399875A Pending JPS5278467A (en) 1975-12-25 1975-12-25 Method of determining reference points for measurement of configuratio n

Country Status (1)

Country Link
JP (1) JPS5278467A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57204141A (en) * 1981-06-10 1982-12-14 Ibm Method of inspecting deflection of semiconductor substrate
JPS606812A (en) * 1983-06-24 1985-01-14 Hisaya:Kk Restoring method of object and forming method of development diagram
JPS622105A (en) * 1985-06-28 1987-01-08 Hitachi Ltd Shape recognizing method
JPH03158709A (en) * 1989-11-15 1991-07-08 Ezel Inc Recognizing device for solid body shape
JP2005227194A (en) * 2004-02-16 2005-08-25 Casio Comput Co Ltd Projector, angle detecting method, and program
KR20180085046A (en) 2016-01-22 2018-07-25 아사히 가세이 가부시키가이샤 Non-aqueous lithium-ion battery device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50134463A (en) * 1974-04-10 1975-10-24

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50134463A (en) * 1974-04-10 1975-10-24

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57204141A (en) * 1981-06-10 1982-12-14 Ibm Method of inspecting deflection of semiconductor substrate
JPS606812A (en) * 1983-06-24 1985-01-14 Hisaya:Kk Restoring method of object and forming method of development diagram
JPH047445B2 (en) * 1983-06-24 1992-02-12 Hisaya Kk
JPS622105A (en) * 1985-06-28 1987-01-08 Hitachi Ltd Shape recognizing method
JPH03158709A (en) * 1989-11-15 1991-07-08 Ezel Inc Recognizing device for solid body shape
JP2005227194A (en) * 2004-02-16 2005-08-25 Casio Comput Co Ltd Projector, angle detecting method, and program
KR20180085046A (en) 2016-01-22 2018-07-25 아사히 가세이 가부시키가이샤 Non-aqueous lithium-ion battery device

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