JPS57151845A - Method for recognizing inferior shape of parts - Google Patents

Method for recognizing inferior shape of parts

Info

Publication number
JPS57151845A
JPS57151845A JP56037421A JP3742181A JPS57151845A JP S57151845 A JPS57151845 A JP S57151845A JP 56037421 A JP56037421 A JP 56037421A JP 3742181 A JP3742181 A JP 3742181A JP S57151845 A JPS57151845 A JP S57151845A
Authority
JP
Japan
Prior art keywords
image
lead
photographic
level
projected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56037421A
Other languages
Japanese (ja)
Inventor
Sohei Ikeda
Hideaki Sasaki
Kanji Ishige
Yasuo Nakagawa
Hiroshi Makihira
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP56037421A priority Critical patent/JPS57151845A/en
Publication of JPS57151845A publication Critical patent/JPS57151845A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To make recognizable the presence of parts in a defective shape, excluding those which are liable to be defective and reducing the number of checking and correcting processes by a method wherein the positions of the maximum values of image signals in each scanning are converted into an array of tertiary digit signals. CONSTITUTION:Slit light 12 from a projector 1 of a lead flat portion 3 is projected and a TV camera 6 is used to take a photograph of that portion on which the light has been projected. The output signal from the camera 6 is converted from an analog signal into a digital one to detect the brightest position of the image signal in each scanning. By so doing, after completion of photographing one picture, a photographic sectional image of the part being examined can be obtained. For the photographic section image, a pre-processing circuit 9 is employed to add to the image intermediary value filtering, step state interpolating processes and the like, while a histogram of the position of the brightest point is prepared so as to determine the basic material level, lead level and so on. Based on these levels, a lead detecting threshold level, a floating lead detecting threshold level and the like are determined. Based on these levels further, photographic sectional images with rectified waveforms are reduced to an array of tertiary digit values. Then the position of the lead flat portion 3 is determined by a judgement processor 11.
JP56037421A 1981-03-16 1981-03-16 Method for recognizing inferior shape of parts Pending JPS57151845A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56037421A JPS57151845A (en) 1981-03-16 1981-03-16 Method for recognizing inferior shape of parts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56037421A JPS57151845A (en) 1981-03-16 1981-03-16 Method for recognizing inferior shape of parts

Publications (1)

Publication Number Publication Date
JPS57151845A true JPS57151845A (en) 1982-09-20

Family

ID=12497051

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56037421A Pending JPS57151845A (en) 1981-03-16 1981-03-16 Method for recognizing inferior shape of parts

Country Status (1)

Country Link
JP (1) JPS57151845A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62269047A (en) * 1986-05-19 1987-11-21 Fujitsu Ltd Illumination for lead terminal
JPH01129147A (en) * 1987-11-13 1989-05-22 Matsushita Electron Corp Inspection apparatus of lead of semiconductor device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62269047A (en) * 1986-05-19 1987-11-21 Fujitsu Ltd Illumination for lead terminal
JPH01129147A (en) * 1987-11-13 1989-05-22 Matsushita Electron Corp Inspection apparatus of lead of semiconductor device

Similar Documents

Publication Publication Date Title
US5305391A (en) Method of and apparatus for inspecting bottle or the like
JPS5567607A (en) Pattern discrimination method
CN1200625A (en) Imager registration error and chromatic aberration measurement system for video camera
CA2059220A1 (en) Method of and apparatus for inspecting end of object for defect
CN102006485B (en) Image processing apparatus and image processing method
JPS6484147A (en) Internal quality inspecting method for metal piece
JPS57151845A (en) Method for recognizing inferior shape of parts
US7532814B2 (en) Electronic camera
JPS6435374A (en) Method and apparatus for fully automatic agglutination immune analysis
JPS54922A (en) Correction method of video signal
JPS6418048A (en) Selection of citrus fruits
HK52292A (en) Process for measuring lengths using a photo-sensitive array camera
JPS5215385A (en) Image recognizer
JPS57113244A (en) Inspecting device of wafer surface
JPS5574667A (en) Pattern discrimination method
JPH057141B2 (en)
JPS54122980A (en) Surface inspection unit for semiconductor pellet
JPS58165175A (en) Object detection
JPS608769A (en) Object detector
JPS6437699A (en) Method for discriminating kind of motorbicycle and device for executing said method
JP3063994B2 (en) Image processing device and visual inspection device
JPS57153443A (en) Discriminator for easiness of test
JPS5910075A (en) Binary coding device of analog signal
JP2948268B2 (en) Cellophane adhesive tape inspection device
JPS5725076A (en) Method for binary-coding of video signal