JPS6447974A - Automatic generation of test pattern - Google Patents

Automatic generation of test pattern

Info

Publication number
JPS6447974A
JPS6447974A JP62205512A JP20551287A JPS6447974A JP S6447974 A JPS6447974 A JP S6447974A JP 62205512 A JP62205512 A JP 62205512A JP 20551287 A JP20551287 A JP 20551287A JP S6447974 A JPS6447974 A JP S6447974A
Authority
JP
Japan
Prior art keywords
determined
terminal
test pattern
circuit
element section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62205512A
Other languages
Japanese (ja)
Inventor
Kohei Kanbe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP62205512A priority Critical patent/JPS6447974A/en
Publication of JPS6447974A publication Critical patent/JPS6447974A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To facilitate the generation of a test pattern, by making internal condition of a circuit determined by coincidence operation adapt to an LSI circuit made free to set. CONSTITUTION:One representative fault yet to be detected in a circuit is selected to be outputted to an external output terminal 4 through a combination circuit 1. When the output thereof propagates only as far as a memory element section 2, a time development is conducted to make it propagate to the terminal 4. Values for the element section 2, an external input terminal 3 and the terminal 4 are determined in the propagating operation and the initial value of the element section 2 thus determined is set for the element 2 by using setting/ resetting functions of an address decoder 5, an address shift register 6 and a data shift register 7. Then, when an input value and an output value determined are outputted hourly to the terminals 3 and 4, a representative fault can be detected thereby facilitating the generation of a test pattern.
JP62205512A 1987-08-18 1987-08-18 Automatic generation of test pattern Pending JPS6447974A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62205512A JPS6447974A (en) 1987-08-18 1987-08-18 Automatic generation of test pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62205512A JPS6447974A (en) 1987-08-18 1987-08-18 Automatic generation of test pattern

Publications (1)

Publication Number Publication Date
JPS6447974A true JPS6447974A (en) 1989-02-22

Family

ID=16508094

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62205512A Pending JPS6447974A (en) 1987-08-18 1987-08-18 Automatic generation of test pattern

Country Status (1)

Country Link
JP (1) JPS6447974A (en)

Similar Documents

Publication Publication Date Title
KR880014475A (en) Semiconductor integrated circuit device
JPS6447974A (en) Automatic generation of test pattern
JPS5515559A (en) Test input circuit of microcomputer
EP0196152A3 (en) Testing digital integrated circuits
JPS5444480A (en) Package for integrated circuit
JPS575164A (en) Test input circuit of microcomputer
JPS5572261A (en) Logic unit
JPS5479569A (en) Intergrated circuit
JPS53118327A (en) Automatic test data generator
JPS55157039A (en) Test system for logic unit
JPS5537924A (en) Integrated circuit
JPS5746537A (en) Programmable counter
JPS5682922A (en) Information control system
JPS5789155A (en) Integrated logical operation circuit
JPS5714920A (en) Starting system of electronic computer
JPS5657327A (en) Chattering eliminating circuit
JPS5794996A (en) Memory test system
JPS5424555A (en) Function test unit for logic circuit
JPS57103084A (en) Electronic circuit for timepiece
JPS6485453A (en) Elastic memory circuit with scrambler function
JPS5562373A (en) Logic circuit test unit
JPS5739361A (en) Cable disconnection tester
JPS57130300A (en) Testing circuit for read-only memory
JPS5577092A (en) Integrated circuit
JPS5582972A (en) Testing system of highly integrated circuit