JPS5789155A - Integrated logical operation circuit - Google Patents

Integrated logical operation circuit

Info

Publication number
JPS5789155A
JPS5789155A JP55166076A JP16607680A JPS5789155A JP S5789155 A JPS5789155 A JP S5789155A JP 55166076 A JP55166076 A JP 55166076A JP 16607680 A JP16607680 A JP 16607680A JP S5789155 A JPS5789155 A JP S5789155A
Authority
JP
Japan
Prior art keywords
input
ffs
terminal
designation
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55166076A
Other languages
Japanese (ja)
Other versions
JPS6161428B2 (en
Inventor
Hiroyuki Izumisawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP55166076A priority Critical patent/JPS5789155A/en
Publication of JPS5789155A publication Critical patent/JPS5789155A/en
Publication of JPS6161428B2 publication Critical patent/JPS6161428B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318555—Control logic

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To easily perform testings on a package loaded on the titled circuit by installing a means which forms a shift register which connects plural FF circuits in tandem in response to shift designation inputs, and freely reading or setting input side data and output side data. CONSTITUTION:Normal input terminals 5-1-5-N and normal output terminals 8-1-8-L are installed to the main body of an integrated logical operation circuit 1. Input side FFs 4-1-4-N and output side FFs 7-1-7-L are respectively connected to each terminal 5-1-5-N and 8-1-8-L, and, when a test designation input is given to a test mode control terminal 10, the FFs 4-1-4-N and 7-1-7-L are slowly advanced in synchronizing to the clock of a clock signal input terminal 11. When no designation input is given to the terminal 10, the input signal is passed under the same condition. Moreover, in response to a designation input from a shift mode control terminal 9, FFs 4-1-4-N and 7-1-7-L are connected in tandem, and they operate as a shift register to make the test of an internal circuit 2 easier.
JP55166076A 1980-11-25 1980-11-25 Integrated logical operation circuit Granted JPS5789155A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55166076A JPS5789155A (en) 1980-11-25 1980-11-25 Integrated logical operation circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55166076A JPS5789155A (en) 1980-11-25 1980-11-25 Integrated logical operation circuit

Publications (2)

Publication Number Publication Date
JPS5789155A true JPS5789155A (en) 1982-06-03
JPS6161428B2 JPS6161428B2 (en) 1986-12-25

Family

ID=15824528

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55166076A Granted JPS5789155A (en) 1980-11-25 1980-11-25 Integrated logical operation circuit

Country Status (1)

Country Link
JP (1) JPS5789155A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58207650A (en) * 1982-04-20 1983-12-03 インタ−ナシヨナル　ビジネス　マシ−ンズ　コ−ポレ−シヨン Integrated circuit mounting structure
JPS62126367A (en) * 1985-11-26 1987-06-08 Nec Corp Logical integrated circuit
JPH0317577A (en) * 1989-06-14 1991-01-25 Matsushita Electron Corp Test circuit of semiconductor integrated circuit apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58207650A (en) * 1982-04-20 1983-12-03 インタ−ナシヨナル　ビジネス　マシ−ンズ　コ−ポレ−シヨン Integrated circuit mounting structure
JPS62126367A (en) * 1985-11-26 1987-06-08 Nec Corp Logical integrated circuit
JPH0317577A (en) * 1989-06-14 1991-01-25 Matsushita Electron Corp Test circuit of semiconductor integrated circuit apparatus

Also Published As

Publication number Publication date
JPS6161428B2 (en) 1986-12-25

Similar Documents

Publication Publication Date Title
GB8501143D0 (en) Integrated circuits
DE3382311D1 (en) Online-monitor.
AU5109585A (en) Improvements in or relating to integrated circuits
KR880014475A (en) Semiconductor integrated circuit device
GB1498125A (en) Digital circuit module test system
EP0242255A3 (en) Circuit testing system
JPS63263480A (en) Semiconductor integrated logic circuit
JPS5789154A (en) Logical integrated circuit
JPS5789155A (en) Integrated logical operation circuit
JPS5334243A (en) Device for diagnosing malfunction of elevator control unit
JPS5444480A (en) Package for integrated circuit
JPS56140448A (en) Logical operation circuit
JPS57111714A (en) Integrated circuit
JPS575164A (en) Test input circuit of microcomputer
EP0070458A3 (en) Single chip microcomputer
JPS647636A (en) Semiconductor integrated circuit device with gate array and memory
JPS57189243A (en) Test information transmission system
JPS57166646A (en) Logical circuit
SU1411754A1 (en) Device for checking logical units
JPS57121744A (en) Integrated circuit device
JPS52113259A (en) Testing mechanism for electronic clock
JPS58223827A (en) Varying device of signal delay time
JPS5549758A (en) Information processing unit diagnostic system
JPS57163878A (en) Test signal generating circuit for integrated circuit
JPS57168337A (en) Asynchronous logic circuit