JPS6413759A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS6413759A JPS6413759A JP16864987A JP16864987A JPS6413759A JP S6413759 A JPS6413759 A JP S6413759A JP 16864987 A JP16864987 A JP 16864987A JP 16864987 A JP16864987 A JP 16864987A JP S6413759 A JPS6413759 A JP S6413759A
- Authority
- JP
- Japan
- Prior art keywords
- type
- oxide film
- layer
- substrate
- section
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title 1
- 239000000758 substrate Substances 0.000 abstract 4
- 238000009792 diffusion process Methods 0.000 abstract 3
- 238000002955 isolation Methods 0.000 abstract 3
- 230000015556 catabolic process Effects 0.000 abstract 2
- 238000005530 etching Methods 0.000 abstract 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 abstract 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 abstract 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract 1
- 229910052787 antimony Inorganic materials 0.000 abstract 1
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 abstract 1
- 229910052796 boron Inorganic materials 0.000 abstract 1
- 229910052698 phosphorus Inorganic materials 0.000 abstract 1
- 239000011574 phosphorus Substances 0.000 abstract 1
- 229910052710 silicon Inorganic materials 0.000 abstract 1
- 239000010703 silicon Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
- H01L27/085—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
- H01L27/088—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate
- H01L27/092—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate complementary MIS field-effect transistors
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Abstract
PURPOSE:To increase breakdown strength by changing a p-type epitaxial layer except a recessed section in an n<+> substrate into an n type by connecting the rise-up of a phosphorus buried layer diffused to the n<+> substrate and an antimony-doped n<+> diffusion layer formed to the p-type epitaxial layer. CONSTITUTION:A high-concentration n-type layer 51 is shaped onto an antimony- doped n-type silicon substrate 1 and oxidized, and an oxide film 2 is removed to bore a window. A recessed section is formed through anisotropic etching, using the oxide film 2 as an etching mask. The oxide film is removed, a p-type epitaixal layer 3 is grown in size thicker than the depth of the recessed section, and the surface is flattened. Antimony is deposited onto a power MOS section and a circuit section, employing the oxide film 2 as a mask, and an n<+> buried layer 5 is extended and diffused, thus connecting the power MOS section to the n<+> substrate 1. An n-type epitaxial layer 4 is grown and oxidized, windows are bored to the oxide film 2, and boron is deposited. When deep n-type diffusion layers 53 are shaped, p-type isolation diffusion layers 6 reach the p-type epitaxial layer 3, and island isolations by p-n junctions are formed. Accordingly, the coexistence of high breakdown strength isolation and low ON-resistance power MOSFET can be realized easily on the same chip.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62168649A JP2654383B2 (en) | 1987-07-08 | 1987-07-08 | Method for manufacturing semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62168649A JP2654383B2 (en) | 1987-07-08 | 1987-07-08 | Method for manufacturing semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6413759A true JPS6413759A (en) | 1989-01-18 |
JP2654383B2 JP2654383B2 (en) | 1997-09-17 |
Family
ID=15871943
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62168649A Expired - Fee Related JP2654383B2 (en) | 1987-07-08 | 1987-07-08 | Method for manufacturing semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2654383B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7973405B2 (en) | 2003-02-14 | 2011-07-05 | Hitachi, Ltd. | Integrated circuit for driving semiconductor device and power converter |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61285750A (en) * | 1985-06-12 | 1986-12-16 | Nissan Motor Co Ltd | Semiconductor device |
-
1987
- 1987-07-08 JP JP62168649A patent/JP2654383B2/en not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61285750A (en) * | 1985-06-12 | 1986-12-16 | Nissan Motor Co Ltd | Semiconductor device |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7973405B2 (en) | 2003-02-14 | 2011-07-05 | Hitachi, Ltd. | Integrated circuit for driving semiconductor device and power converter |
Also Published As
Publication number | Publication date |
---|---|
JP2654383B2 (en) | 1997-09-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |