JPS6410649A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS6410649A JPS6410649A JP16631587A JP16631587A JPS6410649A JP S6410649 A JPS6410649 A JP S6410649A JP 16631587 A JP16631587 A JP 16631587A JP 16631587 A JP16631587 A JP 16631587A JP S6410649 A JPS6410649 A JP S6410649A
- Authority
- JP
- Japan
- Prior art keywords
- insulating film
- wiring layer
- wall
- contact hole
- insulating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE:To make a contact hole in the manner of self alignment, and realize a fine structure, by forming an aperture part reaching a second specified region of a main surface in the vicinity of a first wiring layer by an etching method with anisotropy, and forming via the aperture part a second wiring layer extending on an insulating layer. CONSTITUTION:An impurity diffusion region 15 and a third insulating film 16 covering the side surfaces of a second insulating film 14 and a first wiring layer 13 are formed. When a contact hole is made in the third insulating film 16, a part of the third insulating film which is so called a side-wall is left on the side-walls of the first wiring layer 13 and the second insulating layer 14. This side-wall is inevitably formed on a vertical side-wall in the case of an etching such as RIE. Therefore, the first wiring layer is always protected by an insulating film (a part of the third insulating film), even if the contact hole is formed under the condition where the margin of mask alignment is zero. A second wiring layer is formed so as to come into electrical contact with the impurity diffusion region 15.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16631587A JPS6410649A (en) | 1987-07-02 | 1987-07-02 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16631587A JPS6410649A (en) | 1987-07-02 | 1987-07-02 | Manufacture of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6410649A true JPS6410649A (en) | 1989-01-13 |
Family
ID=15829070
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16631587A Pending JPS6410649A (en) | 1987-07-02 | 1987-07-02 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6410649A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100265828B1 (en) * | 1997-06-30 | 2000-09-15 | 김영환 | A method for fabricating semiconductor device |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61174742A (en) * | 1985-01-30 | 1986-08-06 | Toshiba Corp | Manufacture of semiconductor device |
JPS6240765A (en) * | 1985-08-15 | 1987-02-21 | Toshiba Corp | Read-only semiconductor memory and manufacture thereof |
-
1987
- 1987-07-02 JP JP16631587A patent/JPS6410649A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61174742A (en) * | 1985-01-30 | 1986-08-06 | Toshiba Corp | Manufacture of semiconductor device |
JPS6240765A (en) * | 1985-08-15 | 1987-02-21 | Toshiba Corp | Read-only semiconductor memory and manufacture thereof |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100265828B1 (en) * | 1997-06-30 | 2000-09-15 | 김영환 | A method for fabricating semiconductor device |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
MY126325A (en) | A method for manufacturing a low dielectric constant inter- level integrated circuit structure. | |
MY113878A (en) | Semiconductor apparatus having wiring groove and contact hole formed in self-alignment manner and method of fabricating the same | |
EP0365107A3 (en) | Manufacturing method for vertically conductive semiconductor devices | |
KR940012647A (en) | Semiconductor integrated circuit device and manufacturing method thereof | |
JPS6410649A (en) | Manufacture of semiconductor device | |
KR910003783A (en) | Semiconductor device and manufacturing method | |
KR870008388A (en) | Semiconductor device and manufacturing method | |
EP0134692A3 (en) | Multilayer semiconductor devices with embedded conductor structure | |
JPS5513904A (en) | Semiconductor device and its manufacturing method | |
JPS5750451A (en) | Semiconductor | |
JPS5612748A (en) | Semiconductor device | |
KR980005591A (en) | Semiconductor device and method for forming contact hole using the same | |
JPS6457671A (en) | Semiconductor device and manufacture thereof | |
JPS6435937A (en) | Semiconductor device | |
JPS54143076A (en) | Semiconductor device and its manufacture | |
JPS57184232A (en) | Manufacture of semiconductor device | |
KR880010473A (en) | Manufacturing Method of Semiconductor Device | |
JPS6464361A (en) | Semiconductor device | |
JPS5289476A (en) | Semiconductor device | |
JPS6424453A (en) | Manufacture of semiconductor device | |
JPS5766670A (en) | Manufacture of semiconductor integrated circuit device | |
JPS5710948A (en) | Semiconductor device | |
KR930014899A (en) | Semiconductor device connection device | |
JPS6477177A (en) | Manufacture of semiconductor device | |
JPS6419764A (en) | Manufacture of semiconductor integrated circuit device |